Method for the correction of spherical aberration in microscopic applications

US9891423B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9891423-B2
Application numberUS-201514617094-A
CountryUS
Kind codeB2
Filing dateFeb 9, 2015
Priority dateMar 4, 2014
Publication dateFeb 13, 2018
Grant dateFeb 13, 2018

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Abstract

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A procedure for the correction of spherical aberration in microscopic applications, wherein various recordings of a specimen to be observed are taken and evaluated for the purpose of changing the setting values of the optical system. The correction values are stored in a correction matrix as a function of the recording position, the recording time, the wavelength, and the temperature, wherein the determination and storage of the correction values are carried out in each recording position in the x, y, and z coordinates, and/or the correction values are determined after a selection of grid points by interpolation, so that the correction values of the interpolated correction matrix are the starting values for the subsequent exact determination by measurement.

First claim

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What is claimed is: 1. A method for correcting spherical aberration in a microscope, wherein recordings of a specimen to be observed are taken at each of a plurality of recording positions, wherein spherical aberration correction values are determined for each recording position, the spherical aberration correction values being stored in a correction matrix as a function of recording position, recording time, wavelength, and temperature, wherein the determination and storage of the correction values are carried out in each recording position in x, y, and z coordinates, or the correction values are determined after a selection of grid points by interpolation, so that the correction values of the interpolated correction matrix are the starting values for the subsequent exact determination by measurement. 2. The method for correction of spherical aberration of claim 1 , wherein the change in the setting values (experimental parameters and correction values) is controlled via motor drives, an electronic circuit, or optical actuators. 3. The method for correction of spherical aberration of claim 1 , wherein spherical aberration is individually measured and corrected at each recording position. 4. The method for correction of spherical aberration of claim 1 , wherein an individual average value is determined at each grid point for all wavelengths used. 5. The method for correction of spherical aberration of claim 1 , including the following steps: approaching a first position; determining first spherical aberration correction values for the first position; storing the first spherical aberration correction values in combination with the x, y, and z coordinates of the first position; approaching at least a second position; determining second spherical aberration correction values for the second position; and storing the second spherical aberration and the correction values in combination with the x, y, and z coordinates of the second position; starting an experiment by: approaching the first position; retrieving the stored first spherical aberration correction values; adjusting the microscope to correct spherical aberration at the first position; recording a first image; approaching the second position; retrieving the stored second spherical aberration correction values; adjusting the microscope to correct spherical aberration at the second position; and recording a second image. 6. The method for correction of spherical aberration of claim 1 , including the following steps: carrying out at least two correction passes by: defining a plurality of grid points; approaching a first one of the grid points defining a first position; determining the spherical aberration correction for the first position; storing first spherical aberration correction values together with x, y, and z coordinates of the first position in the correction matrix; approaching a second one of the grid points defining a second position; determining the spherical aberration correction for the second position; storing the second spherical aberration correction values together with x, y, and z coordinates of the second position in the correction matrix; interpolating an overall correction matrix from the first spherical aberration correction values and the second sperhical aberration correction values for a plurality of other grid points; starting an experiment involving least two positions by: approaching the first position; retrieving the first spherical aberration correction values from the correction matrix; adjusting the microscope to correct spherical aberration based on the first spherical aberration correction values; recording a first image at the first position; approaching the second position; retrieving the second spherical aberration correction values from the correction matrix; adjusting the microscope to correct spherical aberration based on the second spherical aberration correction values; and recording a second image at the second position. 7. The method for correction of spherical aberration of claim 6 , wherein correction factors from the interpolated correction matrix are used as starting values for the correction passes. 8. The method for correction of spherical aberration of claim 7 , wherein determined values from the at least two exact correction passes are used as new values for the grid points of the correction matrix. 9. The method for correction of spherical aberration of claim 1 , wherein in the event of spherical aberration in a z-stack which varies in an axial direction, the correction matrix at an identical lateral position is retrieved and used for image recording, wherein, depending on an experiment, test recordings are made at different times in order to determine changes in spherical aberration over time.

Assignees

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Classifications

  • for optical correction, e.g. distorsion, aberration · CPC title

  • G02B21/367Primary

    providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison · CPC title

  • Optical details, e.g. image relay to the camera or image sensor (G02B21/364 takes precedence; illumination details G02B21/06 and subgroups) · CPC title

  • by influencing optical camera components · CPC title

  • Electricity · mapped topic

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What does patent US9891423B2 cover?
A procedure for the correction of spherical aberration in microscopic applications, wherein various recordings of a specimen to be observed are taken and evaluated for the purpose of changing the setting values of the optical system. The correction values are stored in a correction matrix as a function of the recording position, the recording time, the wavelength, and the temperature, wherein t…
Who is the assignee on this patent?
Zeiss Carl Microscopy Gmbh
What technology area does this patent fall under?
Primary CPC classification G02B21/367. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 13 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).