Test fixture for electrical function test of product to be tested

Patent metadata

Field	Value
Publication number	US-9880407-B2
Application number	US-201514767956-A
Country	US
Kind code	B2
Filing date	Mar 25, 2015
Priority date	Nov 21, 2014
Publication date	Jan 30, 2018
Grant date	Jan 30, 2018

Abstract

A testing fixture includes a base, a signal source, a workstation and a crimping mechanism. The base is provided with a sloping surface carrying the workstation and the crimping mechanism. The signal source is located on the base. The crimping mechanism applies testing signals transmitted by the signal source to the product to be tested. Additionally, the workstation performs an electrical function test on the product to be tested. The testing fixture can effectively perform an electrical function test on the product to be tested and has an integrated design of the base, the signal source, the workstation and the crimping mechanism, which facilitates management and maintenance. The base is also provided with a sloping surface carrying the workstation and the crimping mechanism to provide the testing fixture with an optimal testing angle, thereby facilitating operation and production.

First claim

The invention claimed is:

1. A testing fixture, comprising: a base, a signal source, a workstation and a crimping mechanism, wherein the base is provided with a sloping surface carrying the workstation and the crimping mechanism, the signal source is located on the base, the crimping mechanism applies testing signals transmitted by the signal source to a product to be tested, and the workstation performs an electrical function test on the product to be tested, wherein a turnover unit is arranged above the workstation with one side of the turnover unit rotatably connected with the workstation.

2. The testing fixture according to claim 1 , wherein a backlight module installation plate is arranged below the workstation and is detachably connected with the workstation; the product to be tested is arranged on the workstation and between the turnover unit and the backlight module installation plate; and a first polarizer is fastened to the turnover unit; and a backlight source is fastened to the backlight module installation plate, and a second polarizer is fastened to the backlight source.

3. The testing fixture according to claim 2 , wherein the turnover unit includes a turning frame, a hinge and a stationary plate, one side of the turning frame is installed onto the workstation by a hinge, and the stationary plate firmly clamps the first polarizer onto the turning frame by a dual-layered glass plate.

4. The testing fixture according to claim 2 , wherein the backlight module installation plate is provided with a first positioning post, and the workstation is provided with an installation hole in which the first positioning post is located.

5. The testing fixture according to claim 2 , wherein the workstation and the backlight module installation plate are connected by a magnetic component.

6. The testing fixture according to claim 2 , wherein the workstation is provided with a fourth positioning post for limiting a position of the product to be tested.

7. The testing fixture according to claim 2 , wherein a horizontal adjustment plate, a longitudinal adjustment plate and a bottom plate are sequentially arranged from top to bottom under the backlight module installation plate; the horizontal adjustment plate is provided with an installation slot of a circuit board for driving the backlight source; the bottom plate is fastened to the sloping surface, the longitudinal adjustment plate moves in Y direction, and the horizontal adjustment plate moves in X direction.

8. The testing fixture according to claim 7 , wherein the horizontal adjustment plate is provided with a horizontal slot, and the longitudinal adjustment plate is provided with a second positioning post located in the horizontal slot; and the longitudinal adjustment plate is provided with a longitudinal slot, and the bottom plate is provided with a third positioning post located in the longitudinal slot.

9. The testing fixture according to claim 1 , wherein the crimping mechanism comprises a driving unit and an indenter; the driving unit drives the indenter in motion in Z direction; the indenter is provided at one end with a protrusion, through which a plurality of probes is provided; and the probe is electrically connected at one end with the signal source, and is contact-connected at the other end with a testing points of the product to be tested.

10. The testing fixture according to claim 9 , wherein the driving unit comprises a frame, a rotary handle, an eccentric block, a supporting plate and an elastic component, the frame is located on the sloping surface, and a guiding shaft is provided in the frame; the elastic component and the supporting plate are sleeved onto the guiding shaft, and the elastic component is located under the supporting plate; the indenter is firmly connected to one side of the supporting plate, the eccentric block is located above the supporting plate, the rotary handle drives the eccentric block to be crimped onto the supporting plate, and the supporting plate moves along an axial direction of the guiding shaft under the action of the eccentric block.

11. The testing fixture according to claim 1 , wherein the signal source is connected with a control key for switching testing signals transmitted by the signal source.

12. The testing fixture according to claim 11 , wherein the signal source is fastened within the base by a signal source installation plate, and the control key is located on the side plate of the base.

13. The testing fixture according to claim 1 , wherein the sloping surface has an angle ranging from 40° to 50° with respect to the horizontal surface.

Assignees

• Boe Technology Group Co Ltd
• Boe (Hebei) Mobile Display Tech Co Ltd

Inventors

• Xue Liwei
• Li Jian
• Wang Dechao

Classifications

• G01R1/0408

  Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets (G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808) · CPC title

• G02F1/1309 Primary

  Repairing; Testing · CPC title

• G01R31/2808 Primary

  Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards (probe, multiprobe, probe manipulator or probe fixture G01R1/067) · CPC title