High resistivity soft magnetic material for miniaturized power converter
US-9437668-B1 · Sep 6, 2016 · US
US9865673B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9865673-B2 |
| Application number | US-201514666624-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 24, 2015 |
| Priority date | Mar 24, 2015 |
| Publication date | Jan 9, 2018 |
| Grant date | Jan 9, 2018 |
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An on-chip magnetic structure includes a magnetic material comprising cobalt in a range from about 80 to about 90 atomic % (at. %) based on the total number of atoms of the magnetic material, tungsten in a range from about 4 to about 9 at. % based on the total number of atoms of the magnetic material, phosphorous in a range from about 7 to about 15 at. % based on the total number of atoms of the magnetic material, and palladium substantially dispersed throughout the magnetic material.
Opening claim text (preview).
What is claimed is: 1. An on-chip magnetic structure, comprising: an activated metallic seed layer comprising NiFe arranged directly on a silicon substrate, the activated metallic seed layer having a dissolved portion comprising palladium nanoparticles that has a thickness of about 10 to about 20 nanometers (nm), and the activated seed layer having an overall thickness of about 10 to about 200 nm; a magnetic material disposed onto the layer of nanoparticles, the magnetic material consisting essentially of palladium, cobalt, tungsten, and phosphorus, with cobalt in a range from about 80 to about 90 atomic % (at. %) based on the total number of atoms of the magnetic material, tungsten in a range from about 4 to about 9 at. % based on the total number of atoms of the magnetic material, phosphorous in a range from about 7 to about 15 at. % based on the total number of atoms of the magnetic material, and palladium substantially dispersed throughout the magnetic material; wherein the magnetic material has a thickness in a range from about 1 to about 2 microns. 2. The on-chip magnetic structure of claim 1 , wherein the magnetic material is substantially amorphous. 3. The on-chip magnetic structure of claim 1 , wherein the resistivity of the magnetic material is at least 100 micro-ohm·centimeters (μΩ·cm). 4. The on-chip magnetic structure of claim 1 , wherein the activated metallic seed layer further comprises cobalt, palladium, copper, titanium, or any combination thereof. 5. The on-chip magnetic structure of claim 1 , wherein the phosphorous is in a range from about 9 to about 11 at. %. 6. The on-chip magnetic structure of claim 1 , wherein the on-chip magnetic structure is a yoke or a coil.
Electrolytic deposition, i.e. electroplating; Electroless plating · CPC title
using a liquid · CPC title
Inductive arrangements or effects of, or between, wiring layers · CPC title
by reduction or substitution, e.g. electroless plating (C23C18/54 takes precedence) · CPC title
Electricity · mapped topic
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