Sample holder and sample holder set

US9865425B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9865425-B2
Application numberUS-201615193922-A
CountryUS
Kind codeB2
Filing dateJun 27, 2016
Priority dateSep 1, 2015
Publication dateJan 9, 2018
Grant dateJan 9, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Disclosed herein is a sample holder which holds a sample such that a surface is exposed and can be mounted in each of multiple measurement devices that perform measurement based on different measurement principles so that properties of the sample can be measured by each of the measurement devices. The sample holder includes: a main body that surrounds the sample; alignment marks that are arranged at each of two or more different positions in a surface of the main body and can be detected by the measurement devices; and a sample-retaining portion that is disposed within the main body and retains the sample such that a height difference between a mark surface of the alignment mark and the surface of the sample is set to a predetermined value.

First claim

Opening claim text (preview).

What is claimed is: 1. A sample holder which holds a sample such that a surface of the sample is exposed and, can be mounted in each of multiple measurement devices that perform measurement based on different measurement principles respectively so that properties of the sample can be measured by each of the measurement devices, the sample holder comprising: a main body that surrounds the sample; alignment marks that are arranged at each of two or more different positions on a surface of the main body and can be detected by the measurement devices; and a sample-retaining portion that is disposed within the main body and retains the sample such that a height difference between a mark surface of the alignment mark and the surface of the sample is set to a predetermined value, wherein the height difference between the mark surface of the alignment mark and the surface of the sample is set within a range of a focal depth of the each of the measurement devices. 2. A sample holder set comprising: a first sample holder which holds a sample such that a surface of the sample is exposed and, is mounted in a first measurement device of multiple measurement devices that perform measurement based on different measurement principles respectively so that properties of the sample can be measured; and a second sample holder that holds the first sample holder holding the sample, wherein the first sample holder includes a first main body that surrounds the sample, alignment marks that are disposed at each of two or more different positions in a surface of the first main body and can be detected by the first measurement device, and a first sample-retaining portion that is disposed within the first main body and retains the sample such that a height difference between a mark surface of the alignment mark and the surface of the sample is set to a predetermined value, wherein the second sample holder includes a second main body that surrounds the first sample holder and a holder-retaining portion that is disposed within the second main body and holds the first sample holder, and wherein among the multiple measurement devices, the sample holder set is mounted in a second measurement device that has a larger measurement field of view than the first measurement device and the alignment marks are detected, thereby enabling measurement of the sample. 3. A sample holder set comprising: a first sample holder which holds a sample such that a surface of the sample is exposed and, is mounted in a first measurement device of multiple measurement devices that perform measurement based on different measurement principles respectively so that properties of the sample can be measured; and a second sample holder that holds the first sample holder holding the sample, wherein the first sample holder includes a first main body that surrounds the sample, first alignment marks that are disposed at each of two or more different positions in a surface of the first main body and can be detected by the first measurement device, and a first sample-retaining portion that is disposed within the first main body and retains the sample such that a height difference between a mark surface of the first alignment mark and the surface of the sample is set to a predetermined value, wherein the second sample holder includes a second main body surrounding the first sample holder, second alignment marks that are disposed at each of two or more different positions in a surface of the second main body, and a holder-retaining portion that is disposed within the second main body and retains the first sample holder, and wherein among the multiple measurement devices, the sample holder set is mounted in a second measurement device that has a larger measurement field of view than the first measurement device and the second measurement marks are detected, thereby enabling measurement of the sample.

Assignees

Inventors

Classifications

  • Sample handling devices or methods · CPC title

  • H01J37/20Primary

    Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support · CPC title

  • Rigid containers without fluid transport within · CPC title

  • Holders integrated in container to position an object · CPC title

  • Microscope slides, e.g. mounting specimens on microscope slides · CPC title

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Frequently asked questions

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What does patent US9865425B2 cover?
Disclosed herein is a sample holder which holds a sample such that a surface is exposed and can be mounted in each of multiple measurement devices that perform measurement based on different measurement principles so that properties of the sample can be measured by each of the measurement devices. The sample holder includes: a main body that surrounds the sample; alignment marks that are arrang…
Who is the assignee on this patent?
Hitachi High-Tech Science Corp
What technology area does this patent fall under?
Primary CPC classification H01J37/20. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jan 09 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).