Scanning ion beam deposition and etch
US-12176178-B2 · Dec 24, 2024 · US
US9865425B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9865425-B2 |
| Application number | US-201615193922-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 27, 2016 |
| Priority date | Sep 1, 2015 |
| Publication date | Jan 9, 2018 |
| Grant date | Jan 9, 2018 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Disclosed herein is a sample holder which holds a sample such that a surface is exposed and can be mounted in each of multiple measurement devices that perform measurement based on different measurement principles so that properties of the sample can be measured by each of the measurement devices. The sample holder includes: a main body that surrounds the sample; alignment marks that are arranged at each of two or more different positions in a surface of the main body and can be detected by the measurement devices; and a sample-retaining portion that is disposed within the main body and retains the sample such that a height difference between a mark surface of the alignment mark and the surface of the sample is set to a predetermined value.
Opening claim text (preview).
What is claimed is: 1. A sample holder which holds a sample such that a surface of the sample is exposed and, can be mounted in each of multiple measurement devices that perform measurement based on different measurement principles respectively so that properties of the sample can be measured by each of the measurement devices, the sample holder comprising: a main body that surrounds the sample; alignment marks that are arranged at each of two or more different positions on a surface of the main body and can be detected by the measurement devices; and a sample-retaining portion that is disposed within the main body and retains the sample such that a height difference between a mark surface of the alignment mark and the surface of the sample is set to a predetermined value, wherein the height difference between the mark surface of the alignment mark and the surface of the sample is set within a range of a focal depth of the each of the measurement devices. 2. A sample holder set comprising: a first sample holder which holds a sample such that a surface of the sample is exposed and, is mounted in a first measurement device of multiple measurement devices that perform measurement based on different measurement principles respectively so that properties of the sample can be measured; and a second sample holder that holds the first sample holder holding the sample, wherein the first sample holder includes a first main body that surrounds the sample, alignment marks that are disposed at each of two or more different positions in a surface of the first main body and can be detected by the first measurement device, and a first sample-retaining portion that is disposed within the first main body and retains the sample such that a height difference between a mark surface of the alignment mark and the surface of the sample is set to a predetermined value, wherein the second sample holder includes a second main body that surrounds the first sample holder and a holder-retaining portion that is disposed within the second main body and holds the first sample holder, and wherein among the multiple measurement devices, the sample holder set is mounted in a second measurement device that has a larger measurement field of view than the first measurement device and the alignment marks are detected, thereby enabling measurement of the sample. 3. A sample holder set comprising: a first sample holder which holds a sample such that a surface of the sample is exposed and, is mounted in a first measurement device of multiple measurement devices that perform measurement based on different measurement principles respectively so that properties of the sample can be measured; and a second sample holder that holds the first sample holder holding the sample, wherein the first sample holder includes a first main body that surrounds the sample, first alignment marks that are disposed at each of two or more different positions in a surface of the first main body and can be detected by the first measurement device, and a first sample-retaining portion that is disposed within the first main body and retains the sample such that a height difference between a mark surface of the first alignment mark and the surface of the sample is set to a predetermined value, wherein the second sample holder includes a second main body surrounding the first sample holder, second alignment marks that are disposed at each of two or more different positions in a surface of the second main body, and a holder-retaining portion that is disposed within the second main body and retains the first sample holder, and wherein among the multiple measurement devices, the sample holder set is mounted in a second measurement device that has a larger measurement field of view than the first measurement device and the second measurement marks are detected, thereby enabling measurement of the sample.
Sample handling devices or methods · CPC title
Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support · CPC title
Rigid containers without fluid transport within · CPC title
Holders integrated in container to position an object · CPC title
Microscope slides, e.g. mounting specimens on microscope slides · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.