Microelectronic assemblies with inductors in direct bonding regions
US-2024355768-A1 · Oct 24, 2024 · US
US9859356B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9859356-B2 |
| Application number | US-201615044121-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 16, 2016 |
| Priority date | May 27, 2015 |
| Publication date | Jan 2, 2018 |
| Grant date | Jan 2, 2018 |
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A semiconductor integrated circuit includes an inductor and a plurality of high permeability patterns. The inductor includes one conductive loop. The high permeability patterns are disposed adjacent to the conductive loop.
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What is claimed is: 1. A semiconductor integrated circuit, comprising: an inductor including one conductive loop; and a plurality of high permeability patterns disposed adjacent to the conductive loop, wherein the high permeability patterns are composed of nickel, fiber, cobalt, an alloy of the above-mentioned materials, or a combination of the above-mentioned materials and the alloy, wherein the high permeability patterns is further disposed in a region surrounding the conductive loop. 2. The semiconductor integrated circuit according to claim 1 , wherein the inductor further includes a dielectric region adjacent to the conductive loop, and the high permeability patterns at least disposed within the dielectric region. 3. The semiconductor integrated circuit according to claim 2 , wherein the dielectric region is enclosed by the conductive loop. 4. The semiconductor integrated circuit according to claim 1 , wherein each of the high permeability patterns is electrically floating with respect to circuit ground. 5. The semiconductor integrated circuit according to claim 1 , wherein the high permeability patterns are pattern ground shielded and electrically connected to circuit ground. 6. The semiconductor integrated circuit according to claim 1 , wherein the high permeability patterns are arranged as an array. 7. The semiconductor integrated circuit according to claim 1 , wherein a size of the high permeability patterns is equal to a spacing between two of the high permeability patterns adjacent to each other. 8. The semiconductor integrated circuit according to claim 1 , wherein a diameter of the inductor is equal to or more than fifty times of a size of the high permeability patterns. 9. The semiconductor integrated circuit according to claim 1 , wherein a diameter of the inductor is equal to or more than hundredfold of a size of the high permeability patterns. 10. The semiconductor integrated circuit according to claim 1 , wherein a size of the high permeability patterns is about 3 micrometers to about 10 micrometers. 11. The semiconductor integrated circuit according to claim 1 , wherein a thickness of the high permeability patterns is about 2 micrometers. 12. The semiconductor integrated circuit according to claim 1 , wherein the high permeability patterns have geometric shapes. 13. The semiconductor integrated circuit according to claim 12 , wherein the high permeability patterns have square shapes or cross shapes. 14. The semiconductor integrated circuit according to claim 1 , wherein the inductor is an integrated passive device. 15. A semiconductor integrated circuit comprising: an inductor including one conductive loop; and a plurality of high permeability patterns disposed adjacent to the conductive loop, wherein the high permeability patterns are composed of nickel, fiber, cobalt, an alloy of the above-mentioned materials, or a combination of the above-mentioned materials and the alloy, and wherein the conductive loop is composed of at least one conductive layer disposed on a substrate, and the high permeability patterns are composed of a high permeability layer disposed on the substrate. 16. The semiconductor integrated circuit according to claim 15 , wherein the high permeability layer is disposed in a vertical direction between the conductive layer and the substrate. 17. The semiconductor integrated circuit according to claim 15 , wherein the conductive layer is disposed in a vertical direction between the high permeability layer and the substrate. 18. The semiconductor integrated circuit according to claim 15 , wherein the conductive loop is composed of at least two conductive layers disposed on the substrate, and the high permeability layer is disposed between the two conductive layers in a projection direction perpendicular to a surface of the substrate.
Inductive arrangements or effects of, or between, wiring layers · CPC title
Electricity · mapped topic
Electricity · mapped topic
Inductors · CPC title
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