X-ray fluoroscopic imaging system

US9857317B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9857317-B2
Application numberUS-201414582069-A
CountryUS
Kind codeB2
Filing dateDec 23, 2014
Priority dateDec 30, 2013
Publication dateJan 2, 2018
Grant dateJan 2, 2018

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  5. First independent claim

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Abstract

Official abstract text for this publication.

The X-ray fluoroscopic imaging system of the present invention comprises: an inspection passage; an electron accelerator; a shielding collimator apparatus comprising a shielding structure, and a first collimator for extracting a low energy planar sector X-ray beam and a second collimator for extracting a high energy planar sector X-ray beam which are disposed within the shielding structure; a low energy detector array for receiving the X-ray beam from the first collimator; and a high energy detector array for receiving the X-ray beam from the second collimator. The first collimator, the low energy detector array and the target point bombarded by the electron beam are located in a first plane; and the second collimator, the high energy detector array and the target point bombarded by the electron beam are located in a second plane.

First claim

Opening claim text (preview).

What is claimed is: 1. An X-ray fluoroscopic imaging system, comprising: an inspection passage ( 3 ) through which an inspected object ( 8 ) is passed; an electron accelerator ( 1 ) comprising an electron accelerating unit ( 102 ), an electron emitting unit ( 101 ) and a target ( 103 ), an electron beam (E) coming from the electron emitting unit and accelerated by the electron accelerating unit bombarding the target to generate an X-ray, wherein the X-ray has different energy distributions at different azimuth angles relative to the target ( 103 ); a shielding collimator apparatus ( 2 ) comprising a shielding structure ( 201 ), and a first collimator ( 202 a ) for extracting a low energy planar sector X-ray beam and a second collimator ( 202 b ) for extracting a high energy planar sector X-ray beam which are disposed within the shielding structure; a low energy detector array ( 4 ) for receiving the X-ray beam from the first collimator; a high energy detector array ( 5 ) for receiving the X-ray beam from the second collimator; wherein the shielding structure surrounds the target; wherein the first collimator, the low energy detector array and a target point (O) bombarded by the electron beam are located in a first plane; and wherein the second collimator, the high energy detector array and the target point bombarded by the electron beam are located in a second plane. 2. The X-ray fluoroscopic imaging system according to claim 1 , wherein the angles between the directions in which the first and/or second collimators are disposed and the electron beam bombarding the target are 30° to 150°. 3. The X-ray fluoroscopic imaging system according to claim 1 , wherein the angle between the axis of the electron accelerator and the inspection passage is less than 60°. 4. The X-ray fluoroscopic imaging system according to claim 1 , wherein the first and second collimators are located on the same side of the axis (L) of the electron beam. 5. The X-ray fluoroscopic imaging system according to claim 1 , wherein the axis of the electron accelerator is parallel to the inspection passage. 6. The X-ray fluoroscopic imaging system according to claim 1 , wherein the angle between the central symmetric line of the first and second collimators and the inspection passage is larger than 45°. 7. The X-ray fluoroscopic imaging system according to claim 1 , wherein the central symmetric line of the first and second collimators is perpendicular to the inspection passage. 8. The X-ray fluoroscopic imaging system according to claim 1 , wherein the low and high energy detector arrays are in a linear type arrangement, a segmented linear arrangement, a standard L type arrangement or a C type arrangement, and are constituted by a plurality of low and high energy detectors respectively. 9. The X-ray fluoroscopic imaging system according to claim 1 , wherein the low and high energy detector arrays are a plurality of detectors arranged in one row or a plurality of rows respectively. 10. The X-ray fluoroscopic imaging system according to claim 1 , further comprising: a signal analyzing and image processing subsystem ( 7 ) for receiving signals from the low and high energy detector arrays and generating a fluoroscopic image finally by computation and analysis; and a power supply and control subsystem ( 6 ) for providing power and control to the operation of the X-ray fluoroscopic imaging system. 11. The X-ray fluoroscopic imaging system according to claim 1 , further comprising: a detector arm support ( 9 ) for the mounting and fixation of detectors, the detector arm support being formed into an arrangement structure of linear type, segmented linear type, standard L type or C type. 12. The X-ray fluoroscopic imaging system according to claim 11 , further comprising: an adjustable fixing apparatus ( 11 ) for fixing the detector arm support on the ground independently. 13. The X-ray fluoroscopic imaging system according to claim 1 , further comprising any combination of the followings: a conveying apparatus ( 10 ) for dragging the inspected object to pass through the inspection passage at a given speed; a scatter shielding structure ( 12 ) disposed on one side or both sides of the inspection passage; an equipment room ( 13 ) for the mounting and fixation of apparatuses such as the electron accelerator and the like; a control room ( 14 ) for providing an equipment operation and working place to the working staffs of the system; and a ramp ( 24 ) for increasing the height of the inspected object. 14. The X-ray fluoroscopic imaging system according to claim 1 , comprising a plurality of collimators and a plurality of corresponding detector arrays. 15. The X-ray fluoroscopic imaging system according to claim 1 , wherein the electron accelerator is a single energy accelerator, a double energy accelerator or a multiple energy accelerator, and the detector arrays are single energy detector arrays, double energy detector arrays or multiple energy detector arrays correspondingly. 16. A combined and fixed type X-ray fluoroscopic imaging system, comprising: the X-ray fluoroscopic imaging system according to claim 1 ; an equipment room ( 13 ) fixed to the ground on one side of the inspection passage and having the electron accelerator and the shielding collimator apparatus mounted therein, the first and second collimators facing the inspection passage at different angles; a conveying apparatus ( 10 ) mounted in the inspection passage; a first and second detector arm supports ( 9 ) disposed on the other side of the inspection passage, fixed to the ground by an adjustable fixing apparatus, and having the low and high energy detector arrays mounted therein respectively; a scatter shielding structure ( 12 ) disposed between the equipment room and the inspection passage; and a control room ( 14 ) fixed to the ground, having the signal analyzing and image processing subsystem as well as the power supply and control subsystem mounted therein, and controlling the combined and fixed type X-ray fluoroscopic imaging system. 17. A track moving type X-ray fluoroscopic imaging system, comprising: the X-ray fluoroscopic imaging system according to claim 1 ; a plurality of tracks ( 20 ) disposed in parallel, the inspection passage being disposed between two adjacent tracks; a moving apparatus ( 21 ) disposed on the tracks; an equipment room ( 13 ) disposed on the tracks on one side of the inspection passage via the moving apparatus and having the electron accelerator and the shielding collimator apparatus mounted therein, the first and second collimators facing the inspection passage at different angles; two L type detector arm supports ( 9 ), a vertical segment bottoms thereof being disposed on the tracks on the other side of the inspection passage via the moving apparatus, the other ends being connected and fixed to the top of the equipment room, and the low and high energy detector arrays being mounted therein respectively; and a control room ( 14 ) fixed to the ground, having the signal analyzing and image processing subsystem as well as the power supply and control subsystem mounted therein, and controlling the track moving type X-ray fluoroscopic imaging system. 18. A vehicle-mounted moving type X-ray fluoroscopic imaging system, comprising: the X-ray fluoroscopic imaging system according to claim 1 ; and a chassis vehicle ( 30 ), and an X-ray source cabin ( 32 ), an equipment cabin ( 33 ), a working cabin ( 34 ), a low energy detector arm support system and a high energy detec

Assignees

Inventors

Classifications

  • Means for conveying samples received · CPC title

  • G01N23/043Primary

    using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images · CPC title

  • using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation · CPC title

  • Physics · mapped topic

  • Physics · mapped topic

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What does patent US9857317B2 cover?
The X-ray fluoroscopic imaging system of the present invention comprises: an inspection passage; an electron accelerator; a shielding collimator apparatus comprising a shielding structure, and a first collimator for extracting a low energy planar sector X-ray beam and a second collimator for extracting a high energy planar sector X-ray beam which are disposed within the shielding structure; a l…
Who is the assignee on this patent?
Nuctech Co Ltd, Univ Tsinghua
What technology area does this patent fall under?
Primary CPC classification G01N23/043. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 02 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).