Single photomask high precision thin film resistor

Patent metadata

Field	Value
Publication number	US-9842895-B2
Application number	US-201615055959-A
Country	US
Kind code	B2
Filing date	Feb 29, 2016
Priority date	Dec 28, 2012
Publication date	Dec 12, 2017
Grant date	Dec 12, 2017

Abstract

An integrated circuit contains a thin film resistor in which a body of the thin film resistor is disposed over a lower dielectric layer in a system of interconnects in the integrated circuit. Heads of the thin film resistor are disposed over electrodes which are interconnect elements in the lower dielectric layer, which provide electrical connections to a bottom surface of the thin film resistor. Top surfaces of the electrodes are substantially coplanar with a top surface of the lower dielectric layer. A top surface of the thin film resistor is free of electrical connections. An upper dielectric layer is disposed over the thin film resistor.

First claim

What is claimed is:

1. An integrated circuit, comprising:
a lower dielectric layer disposed above active components of said integrated circuit;
electrodes disposed in said lower dielectric layer, such that top surfaces of said electrodes are substantially coplanar with a top surface of said lower dielectric layer between said electrodes;
a thin film resistor disposed over said lower dielectric layer, said thin film resistor making electrical connections to said top surfaces of said electrodes at a bottom surface of said thin film resistor, so that a top surface of said thin film resistor is free of electrical connections; and
an upper dielectric layer disposed over said thin film resistor and said lower dielectric layer.

2. The integrated circuit of claim 1 , in which said thin film resistor comprises a resistive material selected from the group consisting of nickel chromium, silicon chromium and tantalum silicon nitride.

3. The integrated circuit of claim 1 , in which said electrodes are interconnect lines.

4. The integrated circuit of claim 3 , in which said interconnect lines comprise an aluminum-based metal.

5. The integrated circuit of claim 3 , in which said interconnect lines are damascene interconnect lines comprising copper.

6. The integrated circuit of claim 1 , in which said electrodes are vias.

7. The integrated circuit of claim 6 , in which said vias comprise tungsten.

8. The integrated circuit of claim 6 , in which said vias are damascene vias comprising copper.

9. The integrated circuit of claim 1 , further comprising a protective dielectric layer disposed over said thin film resistor and under said upper dielectric layer, a lateral boundary of said protective dielectric layer being substantially coincident with a lateral boundary of said thin film resistor.

10. The integrated circuit of claim 1 , further comprising head contacts of a metal layer disposed between said thin film resistor and said electrodes, so that said thin film resistor makes said electrical connections to said top surfaces of said electrodes through said head contacts.

Assignees

• Texas Instruments Inc

Inventors

• Hao Pinghai
• Wang Fuchao
• Yue Duofeng

Classifications

• H01C17/075

  by thin-film techniques · CPC title

• H01C17/06

  adapted for coating resistive material on a base · CPC title

• Y10T29/435

  Solid dielectric type · CPC title

• H01L28/24 Primary

  Electricity · mapped topic

• H01C7/006

  Thin film resistors · CPC title