Reverse osmosis for purifying mixtures of hydrofluoric acid and nitric acid

US9840667B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9840667-B2
Application numberUS-201414786211-A
CountryUS
Kind codeB2
Filing dateApr 16, 2014
Priority dateApr 25, 2013
Publication dateDec 12, 2017
Grant dateDec 12, 2017

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  1. Title

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Abstract

Official abstract text for this publication.

Disclosed is a method of purifying a solution containing hydrofluoric acid, nitric acid and at least one silicon impurity by treating the solution with at least one reverse osmosis membrane. According to the method of the present invention, silicon impurities contained in the solution containing hydrofluoric acid and nitric acid can be selectively removed or reduced. This method can be advantageously used in the photovoltaic industry or in the battery component industry.

First claim

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The invention claimed is: 1. A method of purifying a solution containing hydrofluoric acid, nitric acid and at least one silicon impurity, the method comprising treating the solution with at least one reverse osmosis membrane, wherein at least 90% of the at least one silicon impurity is rejected, and wherein hydrofluoric acid and nitric acid in the solution are not significantly rejected. 2. The method according to claim 1 , wherein the solution mainly contains hydrofluoric acid and nitric acid and comprises silicon compound as an impurity. 3. The method according to claim 1 , wherein the content of nitric acid in the solution before the purification is from 0.1% w/w to 10% w/w. 4. The method according to claim 1 , wherein the content of hydrofluoric acid in the solution before the purification is from 0.001% w/w to 50% w/w. 5. The method according to claim 1 , wherein the content of silicon impurity in the solution before the purification is from 0.1% w/w to 30% w/w. 6. The method according to claim 1 , wherein one or more reverse osmosis membranes are used, in series or in parallel, or in combination of series and parallel. 7. The method according to claim 1 , wherein the silicon impurity is generated by contacting a solution containing hydrofluoric acid and nitric acid with a silicon containing surface. 8. The method according to claim 7 , wherein the contacting a solution containing hydrofluoric acid and nitric acid with a silicon containing surface is a surface texturing of solar cells or an etching of silicon based electrode for batteries. 9. The method according to claim 7 , further comprising recycling the purified solution to a flow of treatment of the silicon containing surface. 10. The method according to claim 1 , further comprising a step of adding hydrofluoric acid and/or nitric acid to set the concentration of hydrofluoric acid and nitric acid contained in the solution to a target level. 11. A process of manufacturing a silicon based solar cell, the process comprising purifying a solution containing hydrofluoric acid, nitric acid and at least one silicon impurity in accordance with the method according to claim 1 . 12. A process of manufacturing a silicon based electrode for a battery, the process comprising purifying a solution containing hydrofluoric acid, nitric acid and at least one silicon impurity in accordance with the method according to claim 1 . 13. The process according to claim 11 , further comprising recycling the purified solution to a flow of treatment of a silicon containing surface during the manufacturing process. 14. The process according to claim 11 , wherein the reverse osmosis membrane is made of polyamides, polypiperazine amides, polyacrylonitriles, polysulfones, cellulose acetates, polybenzimidazolines, polyoxadiazoles, polyfuranes, polyether-polyfuranes, polyvinyl amines, polypyrrolidines, carboxylated polysulfones or sulfonated polysulfones. 15. The process according to claim 12 , further comprising recycling the purified solution to a flow of treatment of a silicon containing surface during the manufacturing process. 16. The process according to claim 12 , wherein the reverse osmosis membrane is made of polyamides, polypiperazine amides, polyacrylonitriles, polysulfones, cellulose acetates, polybenzimidazolines, polyoxadiazoles, polyfuranes, polyether-polyfuranes, polyvinylamines, polypyrrolidines, carboxylated polysulfones or sulfonated polysulfones. 17. The method according to claim 1 , wherein the content of nitric acid in the solution before the purification is from 2% w/w to 10% w/w. 18. The method according to claim 1 , wherein the content of hydrofluoric acid in the solution before the purification is from 0.5% w/w to 30% w/w. 19. The method according to claim 1 , wherein the content of silicon impurity in the solution before the purification is from 0.5% w/w to 20% w/w. 20. The method according to claim 1 , wherein ⅔ of the hydrofluoric acid and nitric acid are not rejected.

Assignees

Inventors

Classifications

  • Silicon or alloys based on silicon · CPC title

  • Purification; Separation {; Stabilisation (C01B21/40 takes precedence)} · CPC title

  • Separation; Purification · CPC title

  • Reverse osmosis; Hyperfiltration · CPC title

  • of electrodes based on metals, Si or alloys · CPC title

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What does patent US9840667B2 cover?
Disclosed is a method of purifying a solution containing hydrofluoric acid, nitric acid and at least one silicon impurity by treating the solution with at least one reverse osmosis membrane. According to the method of the present invention, silicon impurities contained in the solution containing hydrofluoric acid and nitric acid can be selectively removed or reduced. This method can be advantag…
Who is the assignee on this patent?
Solvay
What technology area does this patent fall under?
Primary CPC classification C09K13/08. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Dec 12 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).