Method for activating an X-ray detector and associated control unit

Patent metadata

Field	Value
Publication number	US-9835738-B2
Application number	US-201514639330-A
Country	US
Kind code	B2
Filing date	Mar 5, 2015
Priority date	Mar 5, 2014
Publication date	Dec 5, 2017
Grant date	Dec 5, 2017

Abstract

In a method and control unit for activating an X-ray detector, having an X-ray sensitive sensor layer and an arrangement of pixel electrodes connected at the back to the sensor layer, an individually adjusted depletion voltage is applied to each of the pixel electrodes. The value of the depletion voltages applied to different pixel electrodes is chosen to be different such that the effective pixel sizes respectively associated with the pixel electrodes are aligned with each other.

First claim

We claim as our invention:

1. A method for activating an X-ray detector comprising an X-ray sensitive semiconductor sensor layer that produces charge carriers in response to incident x-rays according to a charge carrier behavior of said sensor layer that changes over time, said sensor layer having a front side on which X-ray radiation is incident and having a back side to which an arrangement of pixel electrodes is connected, each of said pixel electrodes defining a respective pixel having an effective pixel size that is dependent on said charge carrier behavior of said sensor layer, said method comprising:
applying an individual depletion voltage to each of said pixel electrodes; and
for each of said pixel electrodes, individually determining a respective voltage to be applied to that respective pixel electrode, so different respective values of respective depletion voltages are applied individually to different pixel electrodes, with each depletion voltage being individually determined in order to compensate said change over time in said charge carrier behavior, and applying the individually determined depletion voltage to the respective pixel electrode for which that depletion voltage was determined in order to thereby change the effective pixel size of the respective pixel defined by that respective pixel electrode, and thereby aligning the respective effective pixel sizes defined by the different pixel electrodes with each other.

2. A method as claimed in claim 1 comprising placing all of said pixel electrodes at an electric potential, and individually adjusting the depletion voltages for the respective pixel electrodes by individually adjusting the electric potential applied to the respective pixel electrodes.

3. A method as claimed in claim 1 comprising individually adjusting the respective depletion voltages applied to the respective pixel electrodes over time as a function of X-ray radiation detected by said X-ray detector.

4. A method as claimed in claim 3 wherein the detected X-ray radiation has a time curve of intensity, and comprising individually adjusting the respective depletion voltages applied to the respective pixel electrodes dependent on said time curve of intensity.

5. A method as claimed in claim 3 wherein said X-ray radiation detected by said X-ray detector has an average intensity, and individually adjusting the respective depletion voltages of the respective pixel electrodes dependent on said average intensity.

6. A method as claimed in claim 3 comprising detecting said X-ray radiation according to a respective counting rate of each pixel electrode, and varying the respective depletion voltages applied to the respective pixel electrodes over time dependent on the respective counting rates.

7. A method as claimed in claim 6 comprising calibrating said X-ray detector in a calibration procedure comprising:
irradiating said X-ray detector in a loading phase of said calibration procedure with homogeneous X-ray radiation at a first intensity;
determining a counting rate spectrum, comprised of at least two spectral values, after said loading phase at at least two measuring points in time while irradiating said X-ray detector with homogeneous X-ray radiation at a second intensity at each pixel electrode that is lower than said first intensity;
for each pixel electrode, determining a low-frequency limit value of said counting rate spectrum for each pixel electrode at each point in time;
measuring a drift of the respective pixel size for each pixel electrode from said at least two low-frequency limit values determined at said different measuring points in time; and
for each pixel electrode, determining the depletion voltage applied thereto using said measure of said drift of the effective pixel size.

8. A control computer for activating an X-ray detector comprising an X-ray sensitive semiconductor sensor layer that produces charge carriers in response to incident x-rays according to a charge carrier behavior of said sensor layer that time-dependently changes, said sensor layer having a front side on which X-ray radiation is incident and having a back side to which arrangement of pixel electrodes is connected, each of said pixel electrodes defining a respective pixel having an effective pixel size that is dependent on said charge carrier behavior of said sensor layer, said control computer comprising:
an interface that applies an individual depletion voltage to each of said pixel electrodes; and
said control computer being configured for each of said pixel electrodes, to individually determine a respective depletion voltage to be applied to that respective pixel electrode, so different respective values of respective depletion voltages are applied individually to different pixel electrodes, with each depletion voltage being determined so as to compensate said change over time in said charge carrier behavior, and to apply the individually determined depletion voltage to the respective pixel electrode for which that depletion voltage was determined in order to thereby change the effective pixel size of the respective pixel defined by that respective pixel electrode, and thereby aligning the respective effective pixel sizes defined by the different pixel electrodes with each other.

9. A control computer as claimed in claim 8 wherein said interface places all of said pixel electrodes at an electric potential, and wherein said control computer is configured to individually adjust the depletion voltages for the respective pixel electrodes by individually adjusting the electric potential applied to the respective pixel electrodes.

10. A control computer as claimed in claim 8 wherein said control computer is configured to individually adjust the respective depletion voltages applied to the respective pixel electrodes over time as a function of X-ray radiation detected by said X-ray detector.

11. A control computer as claimed in claim 10 wherein the detected X-ray radiation has a time curve of intensity, and wherein said control computer is configured to individually adjust the respective depletion voltages applied to the respective pixel electrodes dependent on said time curve of intensity.

12. A control computer as claimed in claim 10 wherein said X-ray radiation detected by said X-ray detector has an average intensity, and wherein said control computer is configured to individually adjust the respective depletion voltages of the respective pixel electrodes dependent on said average intensity.

13. A control computer as claimed in claim 10 wherein said control computer is configured to operate said X-ray detector to detect said X-ray radiation according to a respective counting rate of each pixel electrode, and wherein said control computer is configured to vary the respective depletion voltages applied to the respective pixel electrodes over time dependent on the respective counting rates.

14. A control computer as claimed in claim 13 wherein said control computer is configured to calibrate said X-ray detector in a calibration procedure comprising:
irradiating said X-ray detector in a loading phase of said calibration procedure with homogeneous X-ray radiation at a first intensity;
determining a counting rate spectrum, comprised of at least two spectral values, after said loading phase at at least two measuring points in time while irradiating said X-ray detector with homogeneous X-ray radiation at a second intensity at each pixel electrode that is lower than said first intensity;
for each pixel electrode, determining a low-frequency limit value of said counting rate spectrum for each pixel electrode at each point in time;

Assignees

• Siemens Ag

Inventors

• Göderer Edgar
• Kreisler Björn

Classifications

• G01T1/241 Primary

  Electrode arrangements, e.g. continuous or parallel strips or the like · CPC title

• G01T1/247 Primary

  Detector read-out circuitry (for processing gain or off-set correction H04N) · CPC title

• G01T1/17

  Circuit arrangements not adapted to a particular type of detector {(pulse-selection circuits H03K, G01R)} · CPC title

• G01T1/40

  Stabilisation of spectrometers · CPC title

• G01T7/005

  calibration techniques (stabilization of spectrometer G01T1/40) · CPC title