Light beam measurement device, laser apparatus, and light beam separator

Patent metadata

Field	Value
Publication number	US-9835495-B2
Application number	US-201514947335-A
Country	US
Kind code	B2
Filing date	Nov 20, 2015
Priority date	Jun 27, 2013
Publication date	Dec 5, 2017
Grant date	Dec 5, 2017

Abstract

A light beam measurement device includes: a polarization measurement unit including a first measurement beam splitter provided on an optical path of a laser beam and configured to measure a polarization state of the laser beam having been partially reflected by the first measurement beam splitter; a beam profile measurement unit including a second measurement beam splitter provided on the optical path of the laser beam and configured to measure a beam profile of the laser beam having been partially reflected by the second measurement beam splitter; and a laser beam-directional stability measurement unit configured to measure a stability in a traveling direction of the laser beam, while the first measurement beam splitter and the second measurement beam splitter are made of a material containing CaF 2 .

First claim

The invention claimed is:

1. A light beam separator comprising:
a first separator substrate formed by a wedged substrate and provided on an optical path of a laser beam; and
a second separator substrate formed by a wedged substrate and provided on the optical path of the laser beam, wherein:
the first separator substrate is configured such that the laser beam having entered a first surface of the first separator substrate is partially reflected by the first surface to separate part of the laser beam;
the second separator substrate is configured such that the laser beam having entered the first surface of the first separator substrate and transmitted through the first separator substrate exits a second surface of the first separator substrate, enters a first surface of the second separator substrate, and exits a second surface of the second separator substrate;
the first surface of the first separator substrate and the second surface of the second separator substrate are approximately parallel to one another;
the second surface of the first separator substrate and the first surface of the second separator substrate are approximately parallel to one another;
a thickness of the first separator substrate and a thickness of the second separator substrate are approximately the same on the optical path of the laser beam; and
an optical axis of the laser beam entering the first separator substrate and an optical axis of the laser beam exiting the second separator substrate approximately align in a straight line.

2. The light beam separator according to claim 1 , wherein the first separator substrate and the second separator substrate are made of a material containing CaF 2 .

3. The light beam separator according to claim 1 , wherein:
the first separator substrate is provided such that an incident angle of the laser beam entering the first surface of the first separator substrate is 45 degrees, and an output angle of the laser beam exiting the second surface of the first separator substrate is Brewster's angle; and
the second separator substrate is provided such that an incident angle of the laser beam entering the first surface of the second separator substrate is the Brewster's angle, and an output angle of the laser beam exiting the second surface of the second separator substrate is 45 degrees.

4. The light beam separator according to claim 3 , wherein:
the first separator substrate and the second separator substrate are made of a material containing a CaF 2 crystal;
the first surface of the first separator substrate is ground to be approximately perpendicular to a <111> axis of the CaF 2 crystal; and
the second surface of the second separator substrate is ground to be approximately perpendicular to the <111> axis of the CaF 2 crystal.

5. The light beam separator according to claim 4 , wherein:
the first separator substrate is provided such that the optical path of the laser beam entering the first surface of the first separator substrate is approximately parallel to a plane containing the <111> axis and a <010> axis of the CaF 2 crystal; and
the second separator substrate is provided such that the optical path of the laser beam exiting the second surface of the second separator substrate is approximately parallel to the plane containing the <111> axis and the <010> axis of the CaF 2 crystal.

6. The light beam separator according to claim 1 ,
the first surface of the first separator substrate and the second surface of the first separator substrate are not parallel to one another; and
the first surface of the second separator substrate and the second surface of the second separator substrate are not parallel to one another.

7. The light beam separator according to claim 6 , wherein:
an angle of inclination of the first surface of the first separator substrate with respect to the second surface of the first separator substrate is 5.57 degrees; and
an angle of inclination of the first surface of the second separator substrate with respect to the second surface of the second separator substrate is 5.57 degrees.

8. The beam measurement device according to claim 1 , further comprising:
a first holder configured to hold the first separator substrate; and
a second holder configured to hold the second separator substrate,
wherein the first and second holders are respectively made of a ternary alloy of iron, nickel, and cobalt.

9. The beam measurement device according to claim 8 , further comprising:
a first flange configured to be mounted on the first holder;
a first spacer configured to press the first separator substrate against the first flange;
a first annular flat spring configured to press the first spacer against the first the flange and the first holder;
a second flange configured to be mounted on the second holder;
a second spacer configured to press the second separator substrate against the second flange; and
a second annular flat spring configured to press the second spacer against the second flange and the second holder.

10. The beam measurement device according to claim 9 , wherein:
the first spacer includes three of first protrusions configured to press the first separator substrate;
the first annular flat spring includes three of first wedged portions configured to press the first spacer;
the first annular flat spring is configured to be placed to match the positions of the first wedged portions with the positions of the first protrusions;
the second spacer includes three of second protrusions configured to press the second separator substrate;
the second annular flat spring includes three of second wedged portions configured to press the second spacer; and
the second annular flat spring is configured to be placed to match the positions of the first wedged portions with the positions of the second protrusions.

11. The beam measurement device according to claim 9 , wherein each one of the first and second flanges includes one or more O-rings.

12. A light beam measurement device comprising:
a light beam separator including:
a first separator substrate formed by a wedged substrate and provided on an optical path of a laser beam; and
a second separator substrate formed by a wedged substrate and provided on the optical path of the laser beam; wherein:
the first separator substrate is configured such that the laser beam having entered a first surface of the first separator substrate is partially reflected by the first surface to separate part of the laser beam;
the second separator substrate is configured such that the laser beam having entered the first surface of the first separator substrate and transmitted through the first separator substrate exits a second surface of the first separator substrate, enters a first surface of the second separator substrate, and exits a second surface of the second separator substrate;
the first surface of the first separator substrate and the second surface of the second separator substrate are approximately parallel to one another;
the second surface of the first separator substrate and the first surface of the second separator substrate are approximately parallel to one another; and
a thickness of the first separator substrate and a thickness of the second separator substrate are approximately the same on the optical path of the laser beam;

a polarization measurement unit configured to measure a polarization state of a laser beam partially reflected by the first surface of the first separator substrate;
a beam profile measurement unit configured to measure a beam profile of the laser beam partially reflected by the first surface of the first separator substrate; and
a lase

Assignees

• Gigaphoton Inc

Inventors

• Moriya Masato
• Wakabayashi Osamu
• Watabe Yoshinobu

Classifications

• H01S3/0014

  Monitoring arrangements not otherwise provided for (photometry G01J1/00, e.g. G01J1/4257; radiation pyrometry G01J5/00; measuring coherence of light G01J9/00; measuring wavelength of light G01J9/00, e.g. G01J9/0246; measuring optical pulses G01J11/00; calorimetrically measuring power of laser beams G01K17/003) · CPC title

• G01J1/0429

  using polarisation elements · CPC title

• G01J2001/4261

  Scan through beam in order to obtain a cross-sectional profile of the beam · CPC title

• G02B27/148

  including stacked surfaces having at least one double-pass partially reflecting surface · CPC title

• G01J11/00 Primary

  Measuring the characteristics of individual optical pulses or of optical pulse trains · CPC title