High throughput partial wave spectroscopic microscopy and associated systems and methods

Patent metadata

Field	Value
Publication number	US-9830501-B2
Application number	US-201414339239-A
Country	US
Kind code	B2
Filing date	Jul 23, 2014
Priority date	Jul 23, 2013
Publication date	Nov 28, 2017
Grant date	Nov 28, 2017

Abstract

The present technology provides methods, systems, and apparatuses to achieve high throughput and high speed acquisition of partial wave spectroscopic (PWS) microscopic images. In particular, provided herein are high-throughput, automated partial wave spectroscopy (HT/A-PWS) instruments and systems capable of rapid acquisition of PWS Microscopic images and clinical, diagnostic, and research applications thereof.

First claim

We claim:

1. A method of selecting one or more target locations on a sample-containing substrate for partial wave spectroscopy (PWS) microscopy, comprising:
(a) creating an image of the substrate at a first magnification using a PWS system; and
(b) selecting the one or more target locations on the substrate for PWS microscopy at a second magnification based on the image, wherein the second magnification is higher than the first magnification.

2. The method of claim 1 , wherein the one or more target locations comprise one or more cells with target-cell characteristics.

3. The method of claim 2 , wherein the target-cell characteristics are selected from the group consisting of size, morphology, positioning on the slide, and spacing between cells.

4. The method of claim 2 , wherein the target-cell characteristics are selected automatically by a selection algorithm.

5. The method of claim 1 , wherein the step of creating an image of the substrate at a first magnification, comprises:
(i) collecting multiple images of the substrate at the first magnification; and
(ii) tiling the multiple images together to create a single larger image of the substrate.

6. The method of claim 5 , further comprising:
measured autofocusing the PWS system prior to collecting a first image of the multiple images of the substrate at the first magnification; and
periodically repeating measured autofocusing of the PWS system during the collection of the multiple images.

7. The method of claim 6 , wherein a predictive autofocusing algorithm is used to focus the PWS system between instances of measured autofocusing.

8. A method of analyzing a sample by high-throughput partial wave spectroscopy (PWS) microscopy, comprising:
(a) selecting target locations on a sample-containing substrate, wherein selecting includes—
creating an image of the substrate at a first magnification using PWS microscopy; and
selecting one or more target locations on the substrate for PWS microscopy at a second magnification based on the image, wherein the second magnification is higher than the first magnification; and

(b) obtaining PWS measurements of the one or more target locations at the second magnification.

9. The method of claim 8 , wherein obtaining PWS measurements comprises automatically:
(i) centering a high throughput PWS system on a first target location;
(ii) autofocusing the system on the first target location;
(iii) spectrally scanning the first target location at a range of illumination wavelengths; and
(iv) collecting a PWS image at each illumination wavelength.

10. The method of claim 9 , wherein steps (iii) and (iv) comprise illuminating a target location with a wavelength of light and collecting a PWS image for each stepwise wavelength in said range of illumination wavelengths.

11. The method of claim 9 , wherein said range of illumination wavelengths comprises about 462 nm-700 nm.

12. The method of claim 8 , further comprising collecting a partial wave spectroscopy x/y/λ-data cube of the target location, wherein collecting includes:
focusing a partial wave spectroscopy (PWS) system on an x/y target location; and
spectrally scanning the x/y target location while collecting an x/y image at each illumination wavelength of the spectral scan.

13. The method of claim 12 , wherein spectrally scanning comprises illuminating the x/y target location at a series of illumination wavelengths throughout a spectrum and collecting an image at each wavelength.

14. The method of claim 13 , where each illumination wavelength in the series of illumination wavelengths are about 1 nm to about 10 nm apart.

15. The method of claim 12 , wherein the x/y image is the result of collected backscattered light from the x/y target location.

16. A partial wave spectroscopy (PWS) system, comprising:
a tunable illumination system to provide a broad spectrum of incident light on a target; and
a receiving end positioned in an imaging plane of the system to separately record intensity of multiple spectra of backscattered light from one or more preselected areas of the target illuminated with the incident light, wherein the multiple spectra of emergent light results from refractive index fluctuations within the target.

17. The PWS system of claim 16 , wherein the incident light is from a light source focused through an acousto-optic tunable filter.

18. The PWS system of claim 17 , wherein the incident light exiting from said acousto-optic tunable filter is focused through an aperture configured to provide an illumination numerical aperture (NA).

19. The PWS system of claim 16 , wherein the receiving end comprises an imaging spectrograph configured to receive at least two distinct spectra within a broad spectrum of incident light.

20. The PWS system of claim 16 , wherein the receiving end records spectral information on a cell-by-cell basis.

21. The PWS system of claim 18 , wherein the aperture is an electronic and/or motorized aperture.

22. The PWS system of claim 18 , wherein the incident light exiting the aperture is collimated, passed through a field aperture, and focused onto a back focal plane of an objective lens.

23. The PWS system of claim 16 , wherein the PWS system further comprises components for automated high throughput PWS selected from the group consisting of: an automated stage, an automated objective turret, a second aperture to control an angle of collected backscattered light, and hardware triggers between the acousto-optic tunable filter and the receiving end to synchronization wavelength tuning and image capture.

24. The PWS system of claim 18 , wherein the aperture is configured to set a low illumination NA to reduce an angle of emitted incident light.

25. The PWS system of claim 23 , wherein the second aperture is an electronic and/or motorized second aperture.

26. The PWS system of claim 23 , wherein the second aperture is configured to set a high collection NA to sharpen the PWS image.

Assignees

• Univ Northwestern

Inventors

• Backman Vadim
• Subramanian Hariharan
• Chandler John E
• White Craig
• Rogers Jeremy D
• Cherkezyan Lusik

Classifications

• H04N23/74

  by influencing the scene brightness using illuminating means · CPC title

• G01J3/44 Primary

  Raman spectrometry; Scattering spectrometry {; Fluorescence spectrometry} · CPC title

• H04N23/673

  based on contrast or high frequency components of image signals, e.g. hill climbing method · CPC title

• G01J3/1256

  using acousto-optic tunable filter; (acousto-optic elements or systems G02F1/11, G02F1/33) · CPC title

• H04N5/2354

  Electricity · mapped topic