Self-oscillating dual-slope integrating quantizer for sigma delta modulators

Patent metadata

Field	Value
Publication number	US-9825645-B1
Application number	US-201615389297-A
Country	US
Kind code	B1
Filing date	Dec 22, 2016
Priority date	Dec 22, 2016
Publication date	Nov 21, 2017
Grant date	Nov 21, 2017

Abstract

The disclosure is directed to low-power high-resolution analog-to-digital converter (ADCs) circuits implemented with a delta-sigma modulators (DSMs). The DSM includes a single-bit, self-oscillating digital to analog converter (SB-DAC) and a dual-slope integrating quantizer that may replace an N-bit quantizer found in a conventional DSM. The integrating quantizer of this disclosure oscillates after quantization because the SB-DAC in the feedback path directly closes the DSM loop. The integrating quantizer circuit includes a switch at the input and two phases per sample cycle. During the first phase the switch sends an input analog signal to an integrator. During the second phase, the switch sends the feedback signal from the output of the self-oscillating SB-DAC to the integrator. The input to the SB-DAC may be output from a clocked comparator.

First claim

The invention claimed is:

1. A method comprising:
receiving an analog signal at a first input of an integrating quantizer circuit, wherein the integrating quantizer circuit comprises a continuous time (CT) dual-slope integrating quantizer that holds a quantization error after a first sample as a starting point for integrating the next sample;
receiving a clock signal at a second input of the integrating quantizer circuit, wherein the clock signal defines a clock period;
determining a sample period, wherein the sample period is the clock period multiplied by a sum, N+M, wherein N and M are integers greater than zero;
in response to receiving a phase one switch control signal, integrating, by the integrating quantizer circuit for M clock periods, the analog signal; and
in response to receiving a phase two switch control signal, integrating, by the integrating quantizer circuit for N clock periods, a feedback signal, wherein the feedback signal comprises an output of a self-oscillating digital to analog converter (DAC).

2. The method of claim 1 , wherein an integration final value for a first sample cycle of a plurality of sample cycles is an integration initial value for the next sample cycle of the plurality of sample cycle.

3. The method of claim 1 , wherein a feedback input to a self-oscillating DAC comprises an inverted polarity output of a comparator, and wherein the comparator is single-bit, clocked, regenerative comparator, the method further comprising:
in response to receiving a phase one signal, receiving, by the comparator, the integrated analog signal; and
in response to receiving a phase two signal, receiving, by the comparator, the integrated feedback signal.

4. The method of claim 3 , wherein the self-oscillating DAC is a single bit DAC and wherein the feedback signal from the DAC closes a loop of a delta-sigma modulator (DSM).

5. The method of claim 4 , wherein the analog signal is a first analog signal, and the self-oscillating DAC is a first self-oscillating DAC, the method further comprising;
receiving a second analog signal at a third input of the integrating quantizer circuit;
summing the second analog signal with an output of a second self-oscillating DAC, wherein the second self-oscillating DAC:
receives the inverted polarity output of the comparator, and
receives a second reference voltage; and

integrating the sum of the second analog input and the output of the second self-oscillating DAC, wherein the integrated analog signal to the comparator comprises the integrated sum of the second analog input and the output of the second self-oscillating DAC.

6. The method of claim 5 , wherein the first reference voltage is approximately equal to the second reference voltage.

7. The method of claim 1 , wherein N equals M.

8. The method of claim 1 , wherein the analog signal is the output of a capacitive sensor.

9. The method of claim 1 , wherein a component of the integrating quantizer determines the sample period.

10. An integrating quantizer circuit comprising:
an integrator;
a clocked comparator circuit, wherein the clocked comparator circuit receives a clock input and an integrator output signal;
a digital to analog converter (DAC), wherein the DAC receives a bitstream signal from the clocked comparator circuit; and
a switch, wherein:
in response to a phase one switch control signal, the switch outputs to the integrator an analog input signal; and
in response to a phase two switch control signal, the switch outputs to the integrator, a feedback signal from the DAC, and

wherein the integrating quantizer circuit comprises a continuous time (CT) dual-slope integrating quantizer that holds a quantization error after a first sample as a starting point for integrating the next sample.

11. The integrating quantizer circuit of claim 10 , wherein the clocked comparator circuit is a single-bit, clocked, regenerative comparator.

12. The integrating quantizer circuit of claim 10 , wherein the DAC is a self-oscillating DAC.

13. The integrating quantizer circuit of claim 10 , wherein the feedback signal from the DAC comprises a signal of negative polarity compared to the bitstream signal from the clocked comparator circuit and the feedback signal from the DAC closes a loop of a delta-sigma modulator (DSM).

14. The integrating quantizer circuit of claim 10 wherein the switch receives the phase two switch control signal for twice as long as the switch receives the phase one switch control signal.

15. The integrating quantizer circuit of claim 10 , wherein the integrator is a first integrator, the analog input signal is a first analog input signal, and the DAC is a first DAC, the circuit further comprising:
a second DAC, wherein the second DAC receives the bitstream signal from the clocked comparator circuit;
a second integrator, wherein the second integrator:
outputs the first analog input signal to the switch,
receives an input signal comprising the sum of a second analog input signal and a DAC output signal from the second DAC.

16. The integrating quantizer circuit of claim 10 , wherein the analog input signal is a first analog input signal, the circuit further comprising a loop filter circuit, wherein the loop filter circuit:
outputs the first analog input signal to the switch,
receives a second analog input signal, and a DAC output signal from the DAC.

17. A system comprising:
a processor, wherein the processor outputs a timing signal;
a sensor, wherein the sensor outputs an analog signal; and
an integrating quantizer circuit, wherein:
the integrating quantizer circuit comprises a continuous time (CT) dual-slope integrating quantizer that holds a quantization error after a first sample as a starting point for integrating the next sample, and
the integrating quantizer circuit receives the analog signal from the sensor at a first input element and the timing signal at a second input element, the integrating quantizer circuit comprising:
an integrator, wherein the integrator outputs an integrator output signal;
a clocked comparator circuit, wherein the clocked comparator circuit receives the timing signal from the second input element and the integrator output signal;
a digital to analog converter (DAC), wherein the DAC receives a bitstream signal from the clocked comparator circuit; and
a switch, wherein:
the switch receives the analog signal from the first input element at a first switch input port and the switch receives a feedback signal from the DAC at a second switch input port and at a third switch input port, the switch receives a phase one switch control signal and a phase two switch control signal,
in response to the phase one switch control signal, the switch outputs the analog signal to the integrator; and
in response to the phase two switch control signal, the switch outputs the feedback signal from the DAC to the integrator.

18. The system of claim 17 , wherein the DAC is a self-oscillating, single-bit DAC and the feedback signal from the DAC comprises a signal of negative polarity compared to the bitstream signal from the clocked comparator circuit.

19. The system of claim 17 , further comprising a delta-sigma modulator (DSM), wherein the feedback signal from the DAC closes a DSM loop.

20. An integrating quantizer circuit comprising:
an integrator;
a clocked comparator circuit, wherein the clocked comparator circuit receives a clock input and an integrator output signal and the clocked comparator circuit is a single-bit, clocked, regenerative

Assignees

• Infineon Technologies Ag

Inventors

• Gaggl Richard
• Prefasi Enrique
• Perez Sanjurjo Francisco Javier
• Buffa Cesare

Classifications

• H03M1/12

  Analogue/digital converters ({H03M1/001 – } H03M1/10 take precedence) · CPC title

• H03M1/00

  Analogue/digital conversion; Digital/analogue conversion (conversion of analogue values to or from differential modulation H03M3/00) · CPC title

• H03M2201/4233

  Electricity · mapped topic

• H03M3/50

  Digital/analogue converters using delta-sigma modulation as an intermediate step (digital delta-sigma modulators per se H03M7/3004) · CPC title

• H03M3/30

  Delta-sigma modulation · CPC title