Silicon carbide semiconductor device and manufacturing method of silicon carbide semiconductor device

Patent metadata

Field	Value
Publication number	US-9825125-B2
Application number	US-201615297261-A
Country	US
Kind code	B2
Filing date	Oct 19, 2016
Priority date	Aug 24, 2011
Publication date	Nov 21, 2017
Grant date	Nov 21, 2017

Abstract

In a silicon carbide semiconductor device, a trench penetrates a source region and a first gate region and reaches a drift layer. On an inner wall of the trench, a channel layer of a first conductivity-type is formed by epitaxial growth. On the channel layer, a second gate region of a second conductivity-type is formed. A first depressed portion is formed at an end portion of the trench to a position deeper than a thickness of the source region so as to remove the source region at the end portion of the trench. A corner portion of the first depressed portion is covered by a second conductivity-type layer.

First claim

The invention claimed is:

1. A manufacturing method of a silicon carbide semiconductor device including a JFET, comprising:
preparing a semiconductor substrate including a first conductivity-type substrate made of silicon carbide, a drift layer of a first conductivity-type formed on the first conductivity-type substrate by epitaxial growth, a first gate region of a second conductivity-type formed on the drift layer by epitaxial growth, and a source region of the first conductivity-type formed on the first gate region by epitaxial growth or ion implantation;
forming a trench penetrating the source region and the first gate region and reaching the drift layer, the trench having a strip shape whose longitudinal direction is set in one direction;
forming a channel layer of the first conductivity-type on an inner wall of the trench by epitaxial growth;
forming a second gate region of the second conductivity-type on the channel layer;
planarizing the channel layer and the second gate region until the source region is exposed;
performing a selective etching after the planarizing so as to remove the source region, the channel layer and the second gate region from an end portion of the trench and to form a first depressed portion deeper than a thickness of the source region at the end portion of the trench; and
performing an activation anneal process at a temperature equal to or higher than 1300° C. in a mixed gas in which gas including an element working as a second conductivity-type dopant is mixed to inert gas after forming the first depressed portion so as to form a second conductivity-type layer covering a corner portion located at a boundary between a bottom surface and a side surface of the first depressed portion.

2. The manufacturing method according to claim 1 ,
wherein as the gas including the second conductivity-type dopant, TMA or B 2 H 6 , which is gas including a p type dopant, is used.

3. The manufacturing method according to claim 1 , further comprising
forming an interlayer insulating layer at a region including an inside of the first depressed portion after forming the second conductivity-type layer.

4. The manufacturing method according to claim 1 , further comprising:
forming a second depressed portion deeper than the first gate region and reaching the drift layer in a peripheral region that surrounds a cell region in which a cell of the JFET is formed;
forming a RESURF layer of the second conductivity-type in the drift layer such that the RESURF layer extends from a side surface to a bottom surface of the second depressed portion; and
performing the activation anneal process after forming the RESURF layer so as to form the second conductivity-type layer covering the corner portion of the first depressed portion and to form a second conductivity-type layer covering a corner portion at a boundary between the bottom surface and the side surface of the second depressed portion.

Assignees

• Denso Corp

Inventors

• Takeuchi Yuichi

Classifications

• H10P50/00

  Etching of wafers, substrates or parts of devices · CPC title

• H10P32/172

  being crystalline silicon carbide · CPC title

• H01L21/0475

  Electricity · mapped topic

• H01L29/66068

  Electricity · mapped topic

• H01L29/1608

  Electricity · mapped topic