Optical measurement system for determining the position of an electrode during the electrochemical processing of a component

Patent metadata

Field	Value
Publication number	US-9822462-B2
Application number	US-201414333611-A
Country	US
Kind code	B2
Filing date	Jul 17, 2014
Priority date	Jul 19, 2013
Publication date	Nov 21, 2017
Grant date	Nov 21, 2017

Abstract

Disclosed is a device for the electrochemical processing of components, having at least one electrode and at least one electrode holder, with which the electrode is movably mounted. The device comprises at least one optical measurement system for determining the position of the electrode. Also disclosed is a method for the electrochemical processing of a component, in particular with such a device, in which the electrode is moved during the electrochemical processing, the position of the electrode being detected by means of an optical measurement system.

First claim

What is claimed is:

1. A method for the electrochemical processing of a component, in which an electrode is moved during the electrochemical processing, wherein the method comprises detecting a position of the electrode by an optical measurement system comprising a single light source, a detection instrument, and deviation optics which deviate light from the light source with positional accuracy onto the detection instrument, the light source and the detection instrument being arranged on at least one stationary carrier and/or the deviating optics being arranged on an electrode holder or on the electrode.

2. The method of claim 1 , wherein the position of the electrode is detected constantly at least one of during, before and after the processing.

3. The method of claim 1 , wherein the position of the electrode is detected with an accuracy of 5 μm.

4. The method of claim 1 , wherein the position of the electrode is detected with an accuracy of 1 μm.

5. The method of claim 1 , wherein the position of the electrode is detected with an accuracy of 0.5 μm.

6. The method of claim 1 , wherein the electrode is moved in oscillation.

7. The method of claim 1 , wherein the electrochemical processing is carried out in a pulsed fashion.

8. A device for the processing of a component, wherein the device is capable of electrochemical processing of the component and comprises at least one electrode and at least one electrode holder, with which the electrode is movably mounted, as well as at least one optical measurement system for determining a position of the electrode, which optical measurement system comprises a single light source, a detection instrument, and deviation optics which deviate light from the light source with positional accuracy onto the detection instrument, the light source and the detection instrument being arranged on at least one stationary carrier and/or the deviating optics being arranged on the holder or on the electrode.

9. The device of claim 8 , wherein the light source and the detection instrument are arranged on at least one stationary carrier.

10. The device of claim 8 , wherein the deviating optics are arranged on the holder or the electrode.

11. The device of claim 9 , wherein the deviating optics are arranged on the holder or the electrode.

12. The device of claim 8 , wherein the deviating optics comprise a retroreflector.

13. The device of claim 11 , wherein the deviating optics comprise a retroreflector.

14. The device of claim 8 , wherein the deviating optics comprise a triple mirror, a triple prism or a Porro prism.

15. The device of claim 8 , wherein the detection instrument comprises a PSD (position sensitive device) sensor or a CCD sensor (charge coupled device).

16. The device of claim 8 , wherein the optical measurement instrument comprises a laser and/or focusing optics and/or a filter instrument.

17. The device of claim 8 , wherein the optical measurement instrument comprises a protective barrier.

18. The device of claim 8 , wherein the optical measurement instrument comprises a bellows and/or a sealing air system.

19. The device of claim 8 , wherein the holder is configured in such a way that a two-dimensional and/or three-dimensional movement of the electrode is made possible.

20. The device of claim 8 , wherein the optical measurement system is configured in such a way that a two-dimensional and/or three-dimensional movement of the electrode is made possible.

Assignees

• MTU Aero Engines AG

Inventors

• Huttner Roland
• Satzger Wilhelm

Classifications

• B23H2500/20

  Methods or devices for detecting wire or workpiece position · CPC title

• G01S17/46

  Indirect determination of position data · CPC title

• B23H3/00

  Electrochemical machining, i.e. removing metal by passing current between an electrode and a workpiece in the presence of an electrolyte · CPC title

• C25F7/00

  Constructional parts, or assemblies thereof, of cells for electrolytic removal of material from objects (for both electrolytic coating and removal C25D); Servicing or operating · CPC title

• B23H7/26

  Apparatus for moving or positioning electrode relatively to workpiece; Mounting of electrode · CPC title