Systems and methods of building sequenceable test methodologies

Patent metadata

Field	Value
Publication number	US-9817737-B2
Application number	US-201514856449-A
Country	US
Kind code	B2
Filing date	Sep 16, 2015
Priority date	Sep 16, 2014
Publication date	Nov 14, 2017
Grant date	Nov 14, 2017

Abstract

Networks and applications can have many different profiles. Template configurations can consist of a wide variety of technologies such as IPv4, DHCP, and BGP. A list of application profiles would include web services, VoIP, Email, and Point-to-point. Network and application profiles can be combined into topology templates. Test methodologies can include complex sets of instructions that allow for testing any number of topology templates in a number of ways. The technology disclosed allows for the assembly, edit, and execution of those profiles and methodologies by someone who does not possess detailed domain knowledge.

First claim

What is claimed is:

1. A test generator system coupled in communication with a system under test (SUT), wherein the test generator system sends simulated input over network connections from simulated first and second endpoints to the SUT and monitors at a packet analysis level traffic received from the SUT, the system including:
a test harness device;
at least one multi-layered test definition data structure that implements a test protocol when run on the test harness device, wherein the multi-layered test definition data structure includes:
a base object layer including test processor configuration definitions that implement basic devices and protocols;
a command sequencer object layer that incorporates devices and protocols from the base object layer and that defines a test in a series of commands, including (a) topology commands that configure the simulated first and second endpoint devices and protocols running on those devices, (b) one or more traffic commands that configure test traffic messages to send between the first and second endpoint devices, (c) test and control commands that implement test operations, including iteration over test operations, and (d) one or more result commands that specify result assembly for dynamic results reported during a test and after-test results reported after the test completes;
command parameter data that specifies parameters of at least some of the commands (a)-(d); and
exposed parameter modification data that an end user can modify to specify operation of a test instance, wherein the exposed parameter modification data is a subset of less than one quarter of the parameters in the command parameter data;

an end user test modification tool that:
receives at least one test selection message specifying a selected test and loads into processing memory of the test harness device the multi-layered test definition data structure that implements a selected test; and
receives at least one exposed parameter modification message specifying a value to apply to an exposed command parameter of a selected test instance; and

a test sequence processor that combines test protocol data from the multi-layered test definition data structure that implements the selected test, runs the selected test on the test harness device, and reports results specified by the result commands of the selected test.

2. The system of claim 1 , wherein:
the test harness device includes the processing memory, a processor coupled to the processing memory, and an FPGA coupled to the processor; and
the test harness device sends messages from the first and second endpoints to the SUT over the network connections for a specified duration of time at a specified message volume and receives messages from the SUT.

3. The system of claim 1 , further including multiple multi-layered test definition data structures available to the end user.

4. The system of claim 1 , wherein the base object layer is locked against editing by the end user.

5. The system of claim 1 , wherein the command sequencer object layer is locked against editing by the end user.

6. The system of claim 1 , wherein the command parameter data is locked against editing by the end user, except that the exposed parameter modification data is modifiable by the end user with an effect of modifying exposed portions of the command parameter data.

7. The system of claim 1 , wherein the exposed parameter modification data includes command parameters specifying counts of the first and second endpoint devices configured by the topology commands.

8. The system of claim 1 , wherein the exposed parameter modification data includes command parameters specifying network protocols running on the first and second endpoint devices configured by the topology commands.

9. The system of claim 1 , wherein the exposed parameter modification data includes command parameters specifying simulated traffic duration and volume from the first and second endpoint devices configured by the traffic commands.

10. A method for sending simulated input over network connections from simulated first and second endpoints to a system under test (SUT) in communication with a test generator system that monitors at a packet analysis level traffic received from the SUT, the method including:
implementing a test protocol using at least one multi-layered test definition data structure that runs on a test harness device, wherein the multi-layered test definition data structure includes:
a base object layer including test processor configuration definitions that implement basic devices and protocols;
a command sequencer object layer that incorporates devices and protocols from the base object layer and that defines a test in a series of commands, including (a) topology commands that configure simulated first and second endpoint devices and protocols running on those devices, (b) one or more traffic commands that configure test traffic messages to send between the first and second endpoint devices, (c) test and control commands that implement test operations, including iteration over test operations, and (d) one or more result commands that specify result assembly for dynamic results reported during a test and after-test results reported after the test completes;
command parameter data that specifies parameters of at least some of the commands (a)-(d); and
exposed parameter modification data that an end user can modify to specify operation of a test instance, wherein the exposed parameter modification data is a subset of less than one quarter of the parameters in the command parameter data;
receiving, at an end user test modification tool, at least one test selection message specifying a selected test and loads into processing memory of the test harness device the multi-layered test definition data structure that implements a selected test;
receiving, at the end user test modification tool, at least one exposed parameter modification message specifying a value to apply to an exposed command parameter of a selected test instance; and
combining, using a test sequence processor, test protocol data from the multi-layered test definition data structure that implements the selected test, runs the selected test on the test harness device, and reports results specified by the result commands of the selected test.

11. The method of claim 10 , wherein a test author indicates whether a parameter in the command parameter data is to be an exposed parameter.

12. The method of claim 11 , wherein a test author uses an authoring tool to specify the exposed parameter.

13. The method of claim 10 , wherein an end user specifies a value to apply to an exposed parameter by modifying a data structure that maps the exposed parameters.

14. The method of claim 13 , wherein the data structure includes a JSON format.

15. The method of claim 13 , wherein the data structure includes a TXML format.

16. The method of claim 13 , wherein a test author locks against editing by the end user, command parameter data that is not exposed parameters by ensuring that the command parameter data that is not exposed parameters is not included in the data structure.

17. The method of claim 13 , wherein the end user specifies the value to apply to an exposed parameter by editing a JSON format data structure and applying the edited JSON format data structure to a test sequence.

18. The method of claim 10 , wherein the exposed parameter modification data includes command parameters specifying counts of the first and second endpoint devices configured by the topology commands.

Assignees

• Spirent Communications Inc

Inventors

• Kodama Greg
• Lei Kahou
• Wang Gwo-Jieh
• Castelli Brian
• Morikuni Caden Jon Y

Classifications

• H04L43/16

  Threshold monitoring · CPC title

• G06F11/261

  by simulating additional hardware, e.g. fault simulation · CPC title

• H04L43/0888

  Throughput · CPC title

• G06F11/263 Primary

  Generation of test inputs, e.g. test vectors, patterns or sequences {; with adaptation of the tested hardware for testability with external testers} · CPC title

• G06F11/3684

  for test design, e.g. generating new test cases · CPC title