Apparatus and method for remotely testing memory-mapped devices of a system-on-chip via an ethernet interface
US-2016330094-A1 · Nov 10, 2016 · US
Api-based pattern-controlled test on an ate
US2015293174A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2015293174-A1 |
| Application number | US-201514687259-A |
| Country | US |
| Kind code | A1 |
| Filing date | Apr 15, 2015 |
| Priority date | Apr 15, 2014 |
| Publication date | Oct 15, 2015 |
| Grant date | — |
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Abstract
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Method and apparatus for performing Pattern-Controlled tests on an automatic test equipment (ATE). The ATE includes a diagnostic instrument and a control device. An application programming interface (API) is installed in the control device and operates to interact with a test program and thereby automatically controls the diagnostic instrument to perform a test. The test program is coded in a high-level programming language and defines a plurality of operation events for the test based on user input. The API identifies the operational events and determines respective operational types associated therewith. Events of an operational type are assigned to a respective pattern label. The pattern labels are then aggregated into a pattern burst which is downloaded to the diagnostic instrument.
First claim
Opening claim text (preview).
What is claimed is: 1 . A computer implemented testing method of testing an electronic device with an automatic testing equipment (ATE), said method comprising: accessing a test program coded in a high level programming language; identifying a plurality of operational events defined in said test program; based on said test program, classifying said plurality of operational events into one or more operational types; assigning a pattern label to each operational type of said…
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Physics · mapped topic
Physics · mapped topic
- G01R31/31907Primary
Physics · mapped topic
Physics · mapped topic
- G01R31/3177Primary
Physics · mapped topic
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- What does patent US2015293174A1 cover?
- Method and apparatus for performing Pattern-Controlled tests on an automatic test equipment (ATE). The ATE includes a diagnostic instrument and a control device. An application programming interface (API) is installed in the control device and operates to interact with a test program and thereby automatically controls the diagnostic instrument to perform a test. The test program is coded in a h…
- Who is the assignee on this patent?
- Advantest Corp
- What technology area does this patent fall under?
- Primary CPC classification G01R31/31907. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Thu Oct 15 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).