Testing device for testing an under-test object

Patent metadata

Field	Value
Publication number	US-9817030-B2
Application number	US-201514641629-A
Country	US
Kind code	B2
Filing date	Mar 9, 2015
Priority date	Nov 7, 2014
Publication date	Nov 14, 2017
Grant date	Nov 14, 2017

Abstract

A testing device includes a base body, a holder, an electrically conductive plate, plural testing probes and plural insulation structures. The testing device of the present invention uses the electrically conductive plate to replace the plastic plate of the conventional testing device. Consequently, the electrostatic discharge effect is avoided. Moreover, the insulation structure is arranged between the testing probe and the electrically conductive plate to separate the testing probe from the electrically conductive plate so as to avoid the electric leakage problem. Consequently, the testing device of the present invention is capable of avoiding the electrostatic discharge effect without causing damage of the under-test object and reducing the measurement accuracy.

First claim

What is claimed is:

1. A testing device for testing an under-test object, an electrical contact being formed on the under-test object, the testing device comprising:
a base body;
a holder disposed on the base body, wherein the under-test object is supported by the holder;
an electrically conductive plate disposed on the base body and located over the holder, wherein the electrically conductive plate is movable relative to the base body so as to be close to or far away from the holder, wherein the electrically conductive plate has an opening, wherein the opening runs through the electrically conductive plate;
a testing probe penetrated through the electrically conductive plate and protruded from a bottom surface of the electrically conductive plate, wherein when the electrically conductive plate is close to the holder, the testing probe is contacted with the electrical contact, wherein the testing probe comprises an outer tube which runs the opening; and
an insulation structure disposed on an outer surface of the outer tube of the testing probe or an inner surface of the opening of the electrically conductive plate, wherein the testing probe and the electrically conductive plate are separated from each other by the insulation structure.

2. The testing device according to claim 1 , wherein the insulation structure is disposed on an outer surface of the testing probe, wherein the insulation structure separates the testing probe from the electrically conductive plate so as to avoid an electric leakage problem.

3. The testing device according to claim 2 , wherein the insulation structure is an insulation ink layer, which is formed on the outer surface of the testing probe by a coating process or a printing process.

4. The testing device according to claim 2 , wherein the testing probe further comprises:
an inner tube partially accommodated within the outer tube;
an elastic element accommodated within the inner tube, and providing an elastic force; and
a plunger shaft partially accommodated within the inner tube, wherein a first end of the plunger shaft is contacted with the elastic element, and a second end of the plunger shaft is contacted with the electrical contact, wherein when the second end of the plunger shaft is contacted with the electrical contact, the plunger shaft is pushed by the electrical contact, so that the plunger shaft is moved relative to the inner tube.

5. The testing device according to claim 4 , wherein when the second end of the plunger shaft is contacted with the electrical contact, a current is transmitted from the under-test object to the plunger shaft, the inner tube and the outer tube through the electrical contact, and the insulation structure on the outer tube blocks the current so as to avoid the electric leakage problem.

6. The testing device according to claim 1 , wherein the insulation structure is an insulation ink layer, which is formed on an inner surface of the opening by a coating process or a printing process.

7. The testing device according to claim 1 , wherein when the testing probe is contacted with the electrical contact, a current is transmitted from the under-test object to the testing probe through the electrical contact, and the insulation structure on the inner surface of the opening blocks the current so as to avoid an electric leakage problem.

8. The testing device according to claim 1 , wherein the holder comprises plural fixing posts and the under-test object comprises plural fixing holes, wherein after the plural fixing posts are penetrated through the corresponding fixing holes, the under-test object is fixed on the holder.

9. The testing device according to claim 1 , wherein the electrically conductive plate is made of a metallic material.

Assignees

• Primax Electronics Ltd

Inventors

• Chang Pei-Ming

Classifications

• G01R1/06722

  Spring-loaded · CPC title

• G01R31/2808

  Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards (probe, multiprobe, probe manipulator or probe fixture G01R1/067) · CPC title

• G01R1/18 Primary

  Screening arrangements against electric or magnetic fields, e.g. against earth's field · CPC title