Package architecture utilizing wafer to wafer bonding
US-2024379487-A1 · Nov 14, 2024 · US
US9812376B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9812376-B2 |
| Application number | US-201514753797-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 29, 2015 |
| Priority date | Jul 8, 2014 |
| Publication date | Nov 7, 2017 |
| Grant date | Nov 7, 2017 |
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An electrically conductive element includes an electrically conductive material and a plurality of inclusions of a phase change material. The phase change material has a phase transition temperature Tc between 150° C. and 400° C. The inclusions are separated from each other and are embedded in the electrically conductive material.
Opening claim text (preview).
What is claimed is: 1. A power semiconductor device, comprising: a semiconductor body; an active portion of the power semiconductor device formed in the semiconductor body; and an electrically conductive element electrically coupled to the active portion in the semiconductor body, the electrically conductive element comprising: an electrically conductive material; and a plurality of inclusions of a phase change material, the phase change material having a phase transition temperature Tc between 150° C. and 400° C., wherein the inclusions are separated from each other and embedded in the electrically conductive material. 2. The power semiconductor device of claim 1 , wherein the phase change material is solid at a temperature below Tc and is liquid at a temperature above Tc. 3. The power semiconductor device of claim 1 , wherein the phase change material is at least one selected from the group consisting of tin, bismuth, zinc and indium. 4. The power semiconductor device of claim 1 , wherein the electrically conductive material is a metal. 5. The power semiconductor device of claim 4 , wherein the metal is aluminum or copper. 6. The power semiconductor device of claim 1 , wherein the inclusions have a diameter of 0.1 to 10 μm. 7. The power semiconductor device of claim 1 , wherein a mass ratio of the phase change material to the electrically conductive element is more than 30 mass-% and less than 95 mass-%. 8. The power semiconductor device of claim 1 , wherein a volume ratio of the phase change material to the electrically conductive element is more than 35 volume-% and less than 95 volume-%. 9. The power semiconductor device of claim 1 , wherein the electrically conductive element has a thickness between 1 μm and 100 μm. 10. The power semiconductor device of claim 1 , wherein the electrically conductive element is patterned so as to form lines. 11. The power semiconductor device of claim 1 , wherein the electrically conductive element is disposed at least at one side of the semiconductor body and patterned so as to form a wiring structure. 12. The power semiconductor device of claim 1 , wherein the electrically conductive element is configured to conduct a current from the active portion in the semiconductor body to a first or to a second load terminal. 13. The power semiconductor device of claim 1 , wherein: the semiconductor device is a vertical semiconductor device comprising a first load terminal contact at a first side of the semiconductor body and a second load terminal contact at a second side of the semiconductor body opposite the first side; the semiconductor device is configured to conduct a load current between the first and the second load terminal contacts along a vertical direction perpendicular to the main surface; the electrically conductive element is configured to conduct a current from the active portion in the semiconductor body to the first or to the second load terminal. 14. The power semiconductor device of claim 1 , further comprising a transistor cell array, the electrically conductive element being electrically coupled to at least one of the group consisting of a source terminal of the transistor cell array, a drain terminal of the transistor cell array, and a gate terminal of the transistor cell array.
of conductive package substrates serving as an interconnection, e.g. of metal plates (manufacture or treatment of leadframes H10W70/04) · CPC title
by melting or evaporation of solids · CPC title
the principal metal being copper · CPC title
the principal metal being aluminium · CPC title
based on metals, e.g. alloys, metal silicides (H10W20/4484 takes precedence) · CPC title
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