High resistivity iron-based, thermally stable magnetic material for on-chip integrated inductors
US-9590026-B2 · Mar 7, 2017 · US
US9793336B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9793336-B2 |
| Application number | US-201715410987-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 20, 2017 |
| Priority date | Mar 24, 2015 |
| Publication date | Oct 17, 2017 |
| Grant date | Oct 17, 2017 |
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An on-chip magnetic structure includes a palladium activated seed layer and a substantially amorphous magnetic material disposed onto the palladium activated seed layer. The substantially amorphous magnetic material includes nickel in a range from about 50 to about 80 atomic % (at. %) based on the total number of atoms of the magnetic material, iron in a range from about 10 to about 50 at. % based on the total number of atoms of the magnetic material, and phosphorous in a range from about 0.1 to about 30 at. % based on the total number of atoms of the magnetic material. The magnetic material can include boron in a range from about 0.1 to about 5 at. % based on the total number of atoms of the magnetic material.
Opening claim text (preview).
What is claimed is: 1. A method for forming an on-chip magnetic structure, the method comprising: activating a magnetic seed layer with palladium, the magnetic seed layer being positioned over a substrate; and electrolessly plating a soft magnetic alloy onto the palladium in the presence of a magnetic field bias; wherein the soft magnetic alloy comprises nickel in a range from about 50 to about 80 at % based on the total number of atoms of the soft metallic alloy, iron in a range from about 10 to about 50 at. % based on the total number of atoms of the soft metallic alloy, phosphorous in a range from about 0.1 to about 30 at. % based on the total number of atoms in the soft metallic alloy, and boron in a range from about 0.1 to about 5 at. % based on the total number of atoms of the soft magnetic alloy. 2. The method of claim 1 , wherein activating the magnetic seed layer comprises exposing the magnetic seed layer to a solution comprising palladium. 3. The method of claim 2 , wherein the solution further comprises an acid. 4. The method of claim 3 , wherein the palladium is present in an amount in a range from about 45 to about 65 ppm. 5. The method of claim 3 , wherein the acid is sulfuric acid, hydrochloric acid, nitric acid, or any combination thereof. 6. The method of claim of claim 1 , wherein the soft metallic alloy's resistivity is at least 110 μΩ·cm. 7. The method of claim 1 , wherein the magnetic field bias is in a range from about 0.1 to about 1.5 Tesla. 8. The method of claim 1 , wherein the soft magnetic alloy's coercivity is about or less than about 1 oersted (Oe). 9. The method of claim 1 , wherein the magnetic seed layer comprises nickel. 10. The method of claim 9 , wherein the magnetic seed layer further comprises an iron layer. 11. The method of claim 1 , wherein the on-chip magnetic structure is an inductor. 12. The method of claim 1 , wherein the magnetic seed layer comprises nickel in an amount in a range from about 0.1 to about 80 at. %. 13. The method of claim 1 , wherein the magnetic seed layer comprises iron in an amount in a range from about 0.1 to about 50 at. %. 14. The method of claim 1 , wherein the magnetic seed layer comprises about 80 wt. % nickel and about 20 wt. % iron. 15. The method of claim 1 , wherein the magnetic seed layer has a thickness in a range from about 50 to about 70 nm. 16. The method of claim 1 , wherein the magnetic seed layer further comprises a protective layer, and the protective layer is removed before electrolessly plating. 17. The method of claim 16 , wherein the protective layer is a metal or a non-metal. 18. The method of claim 17 , wherein the protective layer is the metal, and the metal is titanium. 19. The method of claim 1 , wherein activating the magnetic seed layer comprises immersing the substrate in a palladium sulfate solution. 20. The method of claim 1 , wherein activating the magnetic seed layer comprises immersing the substrate in a palladium salt solution.
using a liquid · CPC title
the principal metal being a noble metal, e.g. gold · CPC title
based on metals, e.g. alloys, metal silicides (H10W20/4484 takes precedence) · CPC title
Inductive arrangements or effects of, or between, wiring layers · CPC title
Electricity · mapped topic
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