Self-light-emitting device

US9793328B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9793328-B2
Application numberUS-201615075436-A
CountryUS
Kind codeB2
Filing dateMar 21, 2016
Priority dateFeb 22, 2000
Publication dateOct 17, 2017
Grant dateOct 17, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Failure light emission of an EL element due to failure film formation of an organic EL material in an electrode hole 46 is improved. By forming the organic EL material after embedding an insulator in an electrode hole 46 on a pixel electrode and forming a protective portion 41 b , failure film formation in the electrode hole 46 can be prevented. This can prevent concentration of electric current due to a short circuit between a cathode and an anode of the EL element, and can prevent failure light emission of an EL layer.

First claim

Opening claim text (preview).

What is claimed is: 1. A self-light-emitting device comprising: a semiconductor film; a first insulating film over the semiconductor film; a first conductive film over the first insulating film; a second insulating film over the first conductive film; a second conductive film over the second insulating film; a third insulating film over the second conductive film; a third conductive film over the third insulating film; a fourth insulating film over the third insulating film; an EL layer over the third conductive film and the fourth insulating film; a fourth conductive film over the EL layer; and a fifth insulating film over the fourth conductive film; wherein the semiconductor film comprises a channel region, wherein the second conductive film is electrically connected to the semiconductor film; wherein the third insulating film has a contact hole, wherein the third conductive film is electrically connected to the second conductive film via the contact hole, wherein the third conductive film comprises a first portion not overlapping the contact hole, wherein the third conductive film comprises a second portion overlapping the contact hole, wherein the contact hole is filled up with the second portion and the fourth insulating film, wherein a surface of the fourth insulating film in the contact hole comprises a rising portion higher than a surface of the first portion, wherein the third insulating film comprises a first organic resin, and wherein the fourth insulating film comprises a second organic resin. 2. A self-light-emitting device comprising: a semiconductor film; a first insulating film over the semiconductor film; a first conductive film over the first insulating film; a second insulating film over the first conductive film; a second conductive film over the second insulating film; a third insulating film over the second conductive film; a third conductive film over the third insulating film; a fourth insulating film over the third insulating film; an EL layer over the third conductive film and the fourth insulating film; and a fourth conductive film over the EL layer; wherein the semiconductor film comprises a channel region, wherein the second conductive film is electrically connected to the semiconductor film; wherein the third insulating film has a contact hole, wherein the third conductive film is electrically connected to the second conductive film via the contact hole, wherein the third conductive film comprises a first portion not overlapping the contact hole, wherein the third conductive film comprises a second portion overlapping the contact hole, wherein the contact hole is filled up with the second portion and the fourth insulating film, wherein a surface of the fourth insulating film in the contact hole comprises a rising portion higher than a surface of the first portion, wherein the third insulating film comprises a first organic resin, wherein the fourth insulating film comprises a second organic resin, and wherein the third conductive film overlaps the channel region. 3. A self-light-emitting device comprising: a semiconductor film; a first insulating film over the semiconductor film; a first conductive film over the first insulating film; a second insulating film over the first conductive film; a second conductive film over the second insulating film; a third insulating film over the second conductive film; a third conductive film over the third insulating film; a fourth insulating film over the third insulating film; an EL layer over the third conductive film and the fourth insulating film; a fourth conductive film over the EL layer; and a fifth insulating film over the fourth conductive film; wherein the semiconductor film comprises a channel region, wherein the second conductive film is electrically connected to the semiconductor film; wherein the third insulating film has a contact hole, wherein the third conductive film is electrically connected to the second conductive film via the contact hole, wherein the third conductive film comprises a first portion not overlapping the contact hole, wherein the third conductive film comprises a second portion overlapping the contact hole, wherein the contact hole is filled up with the second portion and the fourth insulating film, wherein a surface of the fourth insulating film in the contact hole comprises a rising portion higher than a surface of the first portion, wherein the third insulating film comprises a first organic resin, wherein the fourth insulating film comprises a second organic resin, and wherein the third conductive film overlaps the channel region. 4. The self-light-emitting device according to claim 1 , the third insulating film comprising a material selected from acrylic resin, polyimide and polyamide. 5. The self-light-emitting device according to claim 1 , the fourth insulating film comprising a material selected from acrylic resin, polyimide and polyamide. 6. The self-light-emitting device according to claim 1 , the fifth insulating film comprising silicon nitride. 7. The self-light-emitting device according to claim 2 , the third insulating film comprising a material selected from acrylic resin, polyimide and polyamide. 8. The self-light-emitting device according to claim 2 , the fourth insulating film comprising a material selected from acrylic resin, polyimide and polyamide. 9. The self-light-emitting device according to claim 3 , the third insulating film comprising a material selected from acrylic resin, polyimide and polyamide. 10. The self-light-emitting device according to claim 3 , the fourth insulating film comprising a material selected from acrylic resin, polyimide and polyamide. 11. The self-light-emitting device according to claim 3 , the fifth insulating film comprising silicon nitride. 12. The self-light-emitting device according to claim 1 , further comprising: a substrate on which the semiconductor film is formed; a pixel portion in which the EL layer is formed; a gate side driver circuit adjacent to the pixel portion; and a flexible print circuit (FPC) attached to the substrate. 13. The self-light-emitting device according to claim 2 , further comprising: a substrate on which the semiconductor film is formed; a pixel portion in which the EL layer is formed; a gate side driver circuit adjacent to the pixel portion; and a flexible print circuit (FPC) attached to the substrate. 14. The self-light-emitting device according to claim 3 , further comprising: a substrate on which the semiconductor film is formed; a pixel portion in which the EL layer is formed; a gate side driver circuit adjacent to the pixel portion; and a flexible print circuit (FPC) attached to the substrate.

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What does patent US9793328B2 cover?
Failure light emission of an EL element due to failure film formation of an organic EL material in an electrode hole 46 is improved. By forming the organic EL material after embedding an insulator in an electrode hole 46 on a pixel electrode and forming a protective portion 41 b , failure film formation in the electrode hole 46 can be prevented. This can prevent concentration of electr…
Who is the assignee on this patent?
Semiconductor Energy Lab
What technology area does this patent fall under?
Primary CPC classification H01L27/3258. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Oct 17 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).