Semiconductor Device and Method of Forming POP Semiconductor Device with RDL Over Top Package
US-2016276307-A1 · Sep 22, 2016 · US
US9793246B1 · US · B1
| Field | Value |
|---|---|
| Publication number | US-9793246-B1 |
| Application number | US-201615215590-A |
| Country | US |
| Kind code | B1 |
| Filing date | Jul 21, 2016 |
| Priority date | May 31, 2016 |
| Publication date | Oct 17, 2017 |
| Grant date | Oct 17, 2017 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
PoP devices and methods of forming the same are disclosed. A PoP device includes a first package structure and a second package structure. The first package structure includes a first chip, and a plurality of active through integrated fan-out vias and a plurality of dummy through integrated fan-out vias aside the first chip. The second package structure includes a plurality active bumps bonded to the plurality of active through integrated fan-out vias, and a plurality of dummy bumps bonded to the plurality of dummy through integrated fan-out vias. Besides, a total number of the active through integrated fan-out vias and the dummy through integrated fan-out vias at a first side of the first chip is substantially the same as a total number of the active through integrated fan-out vias and the dummy through integrated fan-out vias at a second side of the first chip.
Opening claim text (preview).
What is claimed is: 1. A PoP device, comprising: a first package structure, comprising: a first chip; and a plurality of active through integrated fan-out vias and a plurality of dummy through integrated fan-out vias aside the first chip; and a second package structure, comprising: a plurality active bumps bonded to the plurality of active through integrated fan-out vias; and a plurality of dummy bumps bonded to the plurality of dummy through integrated fan-out vias, wherein a total number of the active through integrated fan-out vias and the dummy through integrated fan-out vias at a first side of the first chip is substantially the same as a total number of the active through integrated fan-out vias and the dummy through integrated fan-out vias at a second side of the first chip. 2. The PoP device of claim 1 , wherein a distribution of the active through integrated fan-out vias and the dummy through integrated fan-out vias at the first side of the first chip is substantially symmetrical to a distribution of the active through integrated fan-out vias and dummy through integrated fan-out vias at the second side of the first chip. 3. The PoP device of claim 1 , wherein a height of the active through integrated fan-out vias is substantially the same as a height of the dummy through integrated fan-out vias. 4. The PoP device of claim 1 , wherein a height of the active through integrated fan-out vias is different from a height of the dummy through integrated fan-out vias. 5. The PoP device of claim 1 , wherein a width of the active through integrated fan-out vias is substantially the same as a width of the dummy through integrated fan-out vias. 6. The PoP device of claim 1 , wherein a width of the active through integrated fan-out vias is different from a width of the dummy through integrated fan-out vias. 7. The PoP device of claim 1 , wherein the active through integrated fan-out vias are at the first side and the second side of the first chip, and the dummy through integrated fan-out vias are at one of the first side and the second side of the first chip. 8. The PoP device of claim 1 , wherein a total number of the active through integrated fan-out vias at the first side of the first chip is at least two times a total number of the active through integrated fan-out vias at the second side of the first chip. 9. The PoP device of claim 1 , wherein the active through integrated fan-out vias are at one of the first side and the second side of the first chip, and the dummy through integrated fan-out vias are at the other of the first side and the second side of the first chip. 10. A PoP device, comprising: a first package structure, comprising: a first chip; a plurality of active through integrated fan-out vias; a plurality of active pads electrically connected to the active through integrated fan-out vias; and a plurality of dummy pads aside the active pads; and a second package structure, comprising: a plurality of active bumps bonded to the active pads; and a plurality of dummy bumps bonded to the dummy pads, wherein the dummy pads are at one of a first side and a second side of the first chip. 11. The PoP device of claim 10 , wherein a total number of the active pads and the dummy pads at a first side of the first chip is substantially the same as a total number of the active pads and the dummy pads at a second side of the first chip. 12. The PoP device of claim 10 , wherein a distribution of the active pads and the dummy pads at a first side of the first chip is substantially symmetrical to a distribution of the active pads and dummy pads at a second side of the first chip. 13. The PoP device of claim 10 , wherein the active pads are at the first side and the second side of the first chip. 14. The PoP device of claim 10 , wherein the active pads are at the other of the first side and the second side of the first chip. 15. A PoP device, comprising: a first package structure, comprising: a first chip; and a plurality of active through integrated fan-out vias and a plurality of dummy through integrated fan-out vias aside the first chip, wherein a dimension of the active through integrated fan-out vias is different from a dimension of the dummy through integrated fan-out vias; and a second package structure, comprising: a plurality of active bumps bonded to the active through integrated fan-out vias; and a plurality of dummy bumps bonded to the dummy through integrated fan-out vias. 16. The PoP device of claim 15 , wherein the dimension comprises a height, a width or both. 17. The PoP device of claim 15 , wherein a width of the active through integrated fan-out vias is substantially the same as a width of the dummy through integrated fan-out vias, and a height of the active through integrated fan-out vias is greater than a height of the dummy through integrated fan-out vias. 18. The PoP device of claim 15 , wherein a width of the active through integrated fan-out vias is greater than a width of the dummy through integrated fan-out vias, and a height of the active through integrated fan-out vias is greater than a height of the dummy through integrated fan-out vias. 19. The PoP device of claim 15 , wherein a total number of the active through integrated fan-out vias at a first side of the first chip is substantially the same as a total number of the dummy through integrated fan-out vias at a second side of the first chip. 20. The PoP device of claim 15 , wherein a distribution of the active through integrated fan-out vias at a first side of the first chip is substantially symmetrical to a distribution of the dummy through integrated fan-out vias at a second side of the first chip.
between a chip and a stacked insulating package substrate, interposer or RDL · CPC title
between stacked chips · CPC title
the stacked chips being on both top and bottom sides of a package substrate, interposer or RDL · CPC title
being orthogonal to a side surface of the chip, e.g. parallel arrangements · CPC title
Interconnections through encapsulations, e.g. pillars through molded resin on a lateral side a chip · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.