Solder material and bonded structure

US9789569B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9789569-B2
Application numberUS-201514920772-A
CountryUS
Kind codeB2
Filing dateOct 22, 2015
Priority dateNov 27, 2013
Publication dateOct 17, 2017
Grant dateOct 17, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Solder material used in soldering of an Au electrode including Ni plating containing P includes Ag satisfying 0.3≦[Ag]≦4.0, Bi satisfying 0≦[Bi]≦1.0, and Cu satisfying 0<[Cu]≦1.2, where contents (mass %) of Ag, Bi, Cu and In in the solder material are denoted by [Ag], [Bi], [Cu], and [In], respectively. The solder material includes In in a range of 6.0≦[In]≦6.8 when [Cu] falls within a range of 0<[Cu]<0.5, In in a range of 5.2+(6−(1.55×[Cu]+4.428))≦[In]≦6.8 when [Cu] falls within a range of 0.5≦[Cu]≦1.0, In in a range of 5.2≦[In]≦6.8 when [Cu] falls within a range of 1.0<[Cu]≦1.2. A balance includes only not less than 87 mass % of Sn.

First claim

Opening claim text (preview).

What is claimed is: 1. Solder material used in soldering a component electrode and a substrate electrode, where the component electrode includes an Au electrode and a Cu electrode, or the substrate electrode includes an Au electrode and a Cu electrode, the solder material comprising: Ag (silver) satisfying 0.3≦[Ag]<4.0; where 0.5 mass % and 1.0 mass % of Ag are excluded, Bi (bismuth) satisfying 0≦[Bi]≦1.0; Cu (copper) satisfying 0.2≦[Cu]≦1.2; In (indium) in a range of 6.0≦[In]6.8 when [Cu] falls within a range of 0.2≦[Cu]<0.5; In in a range of 5.2+(6−(1.55×[Cu]+4.428))≦[In]6.8 when [Cu] falls within a range of 0.5[Cu]1.0; and In in a range of 5.2≦[In]≦6.8 when [Cu] falls within a range of 1.0<[Cu]≦1.2, with a balance including 87≦[Sn], where contents (mass %) of Ag, Bi, Cu, In, and Sn (tin) in the solder material are denoted by [Ag], [Bi], [Cu], [In] and [Sn], respectively. 2. The solder material of claim 1 , wherein Ag satisfies 0.5≦[Ag]≦3.8, Bi satisfies 0.2≦[Bi]≦1.0, In satisfies 6.0≦[In]≦6.8, Cu satisfies 0.2≦[Cu]≦1.2, and a balance includes only not less than 87.2 mass % of Sn. 3. The solder material of claim 1 , wherein Ag satisfies 1.8≦[Ag]≦3.8, Bi satisfies 0.2≦[Bi]≦1.0, In satisfies 6.0≦[In]≦6.7, Cu satisfies 0.8≦[Cu]≦1.2, and a balance includes only not less than 87.3 mass % of Sn. 4. The solder material of claim 1 , wherein Ag satisfies 3.5≦[Ag]≦3.8, Bi satisfies 0.6≦[Bi]≦1.0, In satisfies 6.0≦[In]≦6.1, Cu satisfies 1.1≦[Cu]≦1.2, and a balance includes only not less than 87.9 mass % of Sn. 5. The solder material of claim 1 , wherein Bi satisfies [Bi]=0, Ag satisfies 0.5[Ag]≦3.2, In satisfies 6.0[In]≦6.8, Cu satisfies 0.6[Cu]≦1.1, and a balance includes only not less than 88.9 mass % of Sn. 6. The solder material of claim 1 , wherein Bi satisfies [Bi]=0, Ag satisfies 2.8[Ag]≦3.2, In satisfies 6.0[In]≦6.2, Cu satisfies 0.85[Cu]≦1.1, and a balance includes only not less than 89.5 mass % of Sn. 7. A bonded structure comprising: solder material defined in claim 1 ; an electronic circuit board having a plurality of substrate electrodes; and an electronic component having a plurality of component electrodes, wherein any of the plurality of substrate electrodes and the plurality of component electrodes is the Au electrode including Ni plating containing P (phosphorous), and the plurality of substrate electrodes and the plurality of component electrodes are bonded to each other with the solder material. 8. A bonded structure comprising: solder material defined in claim 2 ; an electronic circuit board having a plurality of substrate electrodes; and an electronic component having a plurality of component electrodes, wherein any of the plurality of substrate electrodes and the plurality of component electrodes is the Au electrode including Ni plating containing P (phosphorous), and the plurality of substrate electrodes and the plurality of component electrodes are bonded to each other with the solder material. 9. A bonded structure comprising: solder material defined in claim 3 ; an electronic circuit board having a plurality of substrate electrodes; and an electronic component having a plurality of component electrodes, wherein any of the plurality of substrate electrodes and the plurality of component electrodes is the Au electrode including Ni plating containing P (phosphorous), and the plurality of substrate electrodes and the plurality of component electrodes are bonded to each other with the solder material. 10. A bonded structure comprising: solder material defined in claim 4 ; an electronic circuit board having a plurality of substrate electrodes; and an electronic component having a plurality of component electrodes, wherein any of the plurality of substrate electrodes and the plurality of component electrodes is the Au electrode including Ni plating containing P (phosphorous), and the plurality of substrate electrodes and the plurality of component electrodes are bonded to each other with the solder material. 11. A bonded structure comprising: solder material defined in claim 5 ; an electronic circuit board having a plurality of substrate electrodes; and an electronic component having a plurality of component electrodes, wherein any of the plurality of substrate electrodes and the plurality of component electrodes is the Au electrode including Ni plating containing P (phosphorous), and the plurality of substrate electrodes and the plurality of component electrodes are bonded to each other with the solder material. 12. A bonded structure comprising: solder material defined in claim 6 ; an electronic circuit board having a plurality of substrate electrodes; and an electronic component having a plurality of component electrodes, wherein any of the plurality of substrate electrodes and the plurality of component electrodes is the Au electrode including Ni plating containing P (phosphorous), and the plurality of substrate electrodes and the plurality of component electrodes are bonded to each other with the solder material.

Assignees

Inventors

Classifications

  • Solder materials or compositions specially adapted therefor · CPC title

  • structurally associated with non-printed electric components (H05K1/16 takes precedence) · CPC title

  • Alloys based on tin · CPC title

  • Materials of terminal, e.g. of leads or electrodes of components · CPC title

  • Layered conductor, e.g. layered metal substrate, layered finish layer or layered thin film adhesion layer · CPC title

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What does patent US9789569B2 cover?
Solder material used in soldering of an Au electrode including Ni plating containing P includes Ag satisfying 0.3≦[Ag]≦4.0, Bi satisfying 0≦[Bi]≦1.0, and Cu satisfying 0<[Cu]≦1.2, where contents (mass %) of Ag, Bi, Cu and In in the solder material are denoted by [Ag], [Bi], [Cu], and [In], respectively. The solder material includes In in a range of 6.0≦[In]≦6.8 when [Cu] falls within a range of…
Who is the assignee on this patent?
Panasonic Ip Man Co Ltd, Panasonic Intellectual Property Managment Co Ltd
What technology area does this patent fall under?
Primary CPC classification B23K35/26. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Oct 17 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).