Target material thickness measuring apparatus

Patent metadata

Field	Value
Publication number	US-9778024-B2
Application number	US-201514913163-A
Country	US
Kind code	B2
Filing date	Jul 28, 2015
Priority date	Feb 5, 2015
Publication date	Oct 3, 2017
Grant date	Oct 3, 2017

Abstract

Embodiments of the present invention disclose a target material thickness measuring apparatus including: a support; and a plurality of distance measuring units mounted on the support and arranged in a first direction, the plurality of distance measuring units being configured to respectively measure thicknesses of portions of a target material at a plurality of positions in the first direction. A plurality of thickness values of different portions of the target material along a straight line can be obtained at one time, for example, by performing a single measurement of thicknesses of the portions of the target material at the plurality of positions by means of the plurality of distance measuring units, thereby improving measurement efficiency.

First claim

What is claimed is:

1. A target material thickness measuring apparatus, comprising:
a support; and
a plurality of distance measuring units ( 13 ) mounted on the support and arranged in a first direction, the plurality of distance measuring units ( 13 ) being configured to measure respectively thicknesses of portions of a target material at a plurality of positions in the first direction,
wherein each of the distance measuring units ( 13 ) comprises:
a test probe ( 15 ) which is movable in a second direction perpendicular to the first direction and also perpendicular to a surface of the target material, the test probe ( 15 ) having a first end configured to contact the surface of the target material and an opposite second end; and

a helical spring ( 16 ) fitted over the test probe ( 15 ) and adapted for exerting a force on the test probe ( 15 ) towards the surface of the target material in the second direction, and the helical springs ( 16 ) provided on the adjacent test probes ( 15 ) are arranged in a staggered way in the second direction.

2. The target material thickness measuring apparatus of claim 1 , wherein:
the thickness of the target material is measured by measuring a distance of movement of the test probe ( 15 ) in the second direction.

3. The target material thickness measuring apparatus of claim 2 , further comprising:
a scale plate detachably mounted to the support and arranged adjacent to the test probe, wherein a surface of the scale plate facing towards the test probe has graduations, and a position of the second end of the test probe in the second direction is determinable in accordance with the graduation of the scale plate.

4. The target material thickness measuring apparatus of claim 3 , wherein:
the surface of the scale plate facing towards the test probe is substantially parallel to the first direction and the second direction.

5. The target material thickness measuring apparatus of claim 1 , further comprising:
a measurement value collection unit adapted for collecting measurement values at the plurality of positions, measured by the plurality of distance measuring units.

6. The target material thickness measuring apparatus of claim 2 , further comprising:
a measurement value collection unit adapted for collecting measurement values at the plurality of positions, measured by the plurality of distance measuring units.

7. The target material thickness measuring apparatus of claim 6 , wherein:
the measurement value collection unit comprises an image acquisition device adapted for acquiring images of the second ends of the plurality of test probes; and
the target material thickness measuring apparatus further comprises a processing unit adapted for processing the images acquired by the image acquisition device to obtain positions of the second ends of the plurality of test probes, so as to obtain the thickness of the target material.

8. The target material thickness measuring apparatus of claim 1 , wherein:
the support is provided with a stopper, and
one end of the helical spring is connected with the stopper while the other end of the helical spring is connected with the test probe.

9. The target material thickness measuring apparatus of claim 8 , wherein:
the stopper is provided with a plurality of through holes through which the test probes are configured to pass respectively.

10. The target material thickness measuring apparatus of claim 2 , wherein:
the first end of the test probe is provided with a roller, such that the test probe is smoothly movable on the surface of the target material.

11. The target material thickness measuring apparatus of claim 7 , wherein:
the measurement value collection unit is fixed on a bracket extending from the support.

12. The target material thickness measuring apparatus of claim 2 , further comprising:
a guiding device adapted for guiding the support to move in a third direction perpendicular to the first direction and the second direction.

13. The target material thickness measuring apparatus of claim 12 , further comprising:
a bearing plate on which the target material is mounted; and
the guiding device comprises a rail provided on the bearing plate and a slide assembly connected to the support and being movable on the rail.

14. The target material thickness measuring apparatus of claim 7 , wherein:
the image acquisition device is adapted for acquiring images of the graduations of the scale plate; and
the image processing unit is adapted for processing the acquired images of the graduations of the scale plate so as to obtain position data of the graduations of the scale plate as a reference of measurement.

15. The target material thickness measuring apparatus of claim 3 , further comprising:
a measurement value collection unit adapted for collecting measurement values at the plurality of positions, measured by the plurality of distance measuring units.

16. The target material thickness measuring apparatus of claim 4 , further comprising:
a measurement value collection unit adapted for collecting measurement values at the plurality of positions, measured by the plurality of distance measuring units.

17. The target material thickness measuring apparatus of claim 15 , wherein:
the measurement value collection unit comprises an image acquisition device adapted for acquiring images of the second ends of the plurality of test probes; and
the target material thickness measuring apparatus further comprises a processing unit adapted for processing the images acquired by the image acquisition device to obtain positions of the second ends of the plurality of test probes, so as to obtain the thickness of the target material.

18. The target material thickness measuring apparatus of claim 3 , further comprising:
a guiding device adapted for guiding the support to move in a third direction perpendicular to the first direction and the second direction.

19. The target material thickness measuring apparatus of claim 4 , further comprising:
a guiding device adapted for guiding the support to move in a third direction perpendicular to the first direction and the second direction.

Assignees

• Boe Technology Group Co Ltd
• Hefei Xinsheng Optoelectronics Technology Co Ltd

Inventors

• Wang Deyong
• Li Yefa
• Peng Liang
• Zheng Congqi
• Choi Daeyoung

Classifications

• G01B11/06 Primary

  for measuring thickness {; e.g. of sheet material (thickness measurement by thermal means G01B21/085)} · CPC title

• G01B2210/42

  with one or more detectors on a single side of the object to be measured and with a backing surface of support or reference on the other side · CPC title

• G01B5/207

  using a plurality of fixed, simultaneously operating transducers (G01B5/213 - G01B5/22 take precedence) · CPC title

• G01B11/0608

  Height gauges · CPC title

• G01B5/061 Primary

  height gauges · CPC title