Flexural testing apparatus for materials and method of testing materials

Patent metadata

Field	Value
Publication number	US-9739696-B2
Application number	US-201514841652-A
Country	US
Kind code	B2
Filing date	Aug 31, 2015
Priority date	Aug 31, 2015
Publication date	Aug 22, 2017
Grant date	Aug 22, 2017

Abstract

A material testing apparatus and methods of testing material are disclosed. The material testing apparatus may include a support ring contacting a test material and a moveable contact component positioned adjacent to the support ring. The moveable contact component may include a substantially curved contact surface comprising a radius-varying curvature profile formed between a center and a perimeter of the substantially curve contact surface. The curvature profile may be based on a predetermined deflection-force profile specific to the test material. Additionally, the curvature profile may also be based on the material characteristics of the test material, the physical characteristics of the test material, the physical characteristics of the support ring and/or a testing process performed on the test material.

First claim

What is claimed is:

1. A material testing apparatus, comprising:
a support ring adjacent a sapphire test material; and
a moveable contact component positioned adjacent the support ring and comprising:
a substantially curved contact surface defined by a curvature profile of varying radius formed between a center and a perimeter of the substantially curved contact surface, wherein

the moveable contact component is configured to deflect the sapphire test material into an aperture of the ring.

2. The material testing apparatus of claim 1 , wherein the substantially curved contact surface contacts the sapphire test material on a side opposite the support ring.

3. The material testing apparatus of claim 1 , wherein the substantially curved contact surface further comprises:
a first curved region having a first curvature radius; and
a second curved region substantially surrounding the first curved region, and having a second curvature radius different from the first curvature radius of the first curved region.

4. The material testing apparatus of claim 3 , wherein the second curvature radius of the second curved region is less than the first curvature radius of the first curved region.

5. The material testing apparatus of claim 3 , wherein the first curved region contacts the sapphire test material in response to:
deflecting the sapphire test material to a calculated flexion distance for the test material; and
deflecting the sapphire test material beyond the calculated flexion distance for the test material.

6. The material testing apparatus of claim 5 , wherein the second curved region contacts the sapphire test material in response to deflecting the sapphire test material beyond the calculated flexion distance for the sapphire test material.

7. The material testing apparatus of claim 1 , wherein the moveable contact component further comprises a cylindrical portion positioned adjacent the substantially curved contact surface.

8. The material testing apparatus of claim 1 , wherein the substantially curved contact surface has a diameter equal to or smaller than an inner diameter of the support ring.

9. A material testing apparatus, comprising:
a support ring operative to support a first side of a sapphire test material; and
a moveable contact component operative to contact a second side of the sapphire test material and comprising
a contact surface having a curvature profile of varying radius, configured to contact the test material when a predetermined force is exerted on the sapphire test material by the moveable contact component, wherein

the sapphire test material is subject to flex within the support ring when the predetermined force is applied.

10. The material testing apparatus of claim 9 , wherein a contact surface has a curvature profile of varying radius that comprises:
a first region configured to contact the second side of the sapphire test material when a first force is exerted by the moveable contact component on the sapphire test material; and
a second region surrounding the first region and configured to contact the second side of the sapphire test material when a second force is exerted by the moveable contact component on the sapphire test material.

11. The material testing apparatus of claim 10 , wherein:
the first force is less than the second force; and
the second region does not contact the second side of the sapphire test material when the first force is exerted by the moveable contact component on the sapphire test material.

12. The material testing apparatus of claim 10 , wherein the support ring defines a test area contacted by the second region when the second force is exerted on the sapphire test material.

13. The material testing apparatus of claim 12 , wherein the test area is substantially the entire second surface of the sapphire test material.

14. The material testing apparatus of claim 9 , wherein the support ring delineates a boundary between a first region of the sapphire test material subject to flex when the first force is applied and a second region of the sapphire test material that is not subject to flex when the first force is applied.

15. The material testing apparatus of claim 14 , wherein the first region of the sapphire test material defines a curvature identical to the contact surface having the curvature profile of the varying radius when the first force is applied.

16. A method for testing a sapphire test material, the method comprising:
positioning a sapphire test material on a support ring of a material testing apparatus;
moving a contact component of the material testing apparatus toward the sapphire test material to contact a substantially curved contact surface of the contact component to the sapphire test material, the substantially curved contact surface comprising a variably curved curvature profile ; and
deflecting the sapphire test material by pressing the contact component into the sapphire test material, wherein the sapphire test material deflects to one of:
a calculated flexion distance for the sapphire test material, or
beyond the calculated flexion distance for the sapphire test material.

17. The method of claim 16 , wherein deflecting the sapphire test material comprises generating a substantially uniform stress in the sapphire test material.

18. The method of claim 17 , wherein generating the substantially uniform stress comprises substantially uniformly stressing a test area of the sapphire test material defined by the support ring of the material testing apparatus.

19. The method of claim 17 , wherein deflecting the sapphire test material further comprises at least one of:
continuously moving the contact component toward the sapphire test material and the support ring;
increasing a force applied to the sapphire test material via the contact component; and
increasing an area of the uniform stress generated in the sapphire test material.

20. The method of claim 16 , wherein:
the method further comprises determining the deflection-force profile for the sapphire test material based on at least one of:
material characteristics of the sapphire test material;
physical characteristics of the sapphire test material; or
physical characteristics of the support ring; and

the curvature profile is based on the determined deflection-force profile for the sapphire test material.

21. The method of claim 20 , wherein the substantially curved contact surface further comprises:
a first curved portion having a first curvature radius; and
a second curved portion substantially surrounding the first curved portion, the second curved portion having a second curvature radius different from the first curvature radius of the first curved portion.

22. The method of claim 21 , wherein:
the first curved portion contacts the sapphire test material in response to deflecting the sapphire test material to the calculated flexion distance for the sapphire test material; and
the second curved portion contacts the sapphire test material in response to deflecting the sapphire test material beyond the calculated flexion distance for the sapphire test material.

Assignees

• Apple Inc

Inventors

• Luzzato Victor
• Memering Dale N

Classifications

• G01N3/24

  by applying steady shearing forces (G01N3/26, G01N3/28 take precedence) · CPC title

• G01N3/20 Primary

  by applying steady bending forces (G01N3/26, G01N3/28 take precedence) · CPC title

• G01N2203/0494

  Clamping ring, "whole periphery" clamping · CPC title

• G01N2203/0282

  Two dimensional, e.g. tapes, webs, sheets, strips, disks or membranes · CPC title