Semiconductor package having an isolation wall to reduce electromagnetic coupling
US-2015170986-A1 · Jun 18, 2015 · US
US9728426B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9728426-B2 |
| Application number | US-201414581624-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 23, 2014 |
| Priority date | Apr 24, 2014 |
| Publication date | Aug 8, 2017 |
| Grant date | Aug 8, 2017 |
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The present invention provides a method for producing a resin-encapsulated electronic component, capable of simply and efficiently producing a resin-encapsulated electronic component having both of a via electrode(s) (bump(s)) and a plate-like member. The method includes a resin-encapsulation step of encapsulating at least one electronic component in a resin. A produced resin-encapsulated electronic component includes: a substrate; the at least one electronic component; the resin; a plate-like member; and at least one bump. A wiring pattern is formed on the substrate. In the resin-encapsulation step, between a bump-formed surface in a bump-formed plate-like member obtained by forming the at least one bump in the plate-like member and a wiring pattern-formed surface in the substrate, the at least one electronic component is encapsulated in the resin, and the at least one bump is caused to be in contact with the wiring pattern.
Opening claim text (preview).
The invention claimed is: 1. A method for producing a resin-encapsulated electronic component including a substrate; at least one electronic component; a resin; a plate-like member having at least one surface; at least one bump; and a wiring pattern, the method comprising: a step of disposing the at least one electronic component on the surface; and a resin-encapsulation step of encapsulating the at least one electronic component in the resin, wherein the resin-encapsulation step comprises: encapsulating the at least one electronic component in the resin between a bump-formed surface of the plate-like member on which the at least one bump is formed and a wiring pattern-formed surface of the substrate on which the wiring pattern is formed, and causing the at least one bump to be in contact with the wiring pattern, in the resin-encapsulation step, the resin-encapsulation of the at least one electronic component is performed by compression molding, the method further comprises: a resin placement step of placing the resin on the bump-formed surface of the plate-like member; and a transfer step of transferring the plate-like member to a die cavity in a molding die, wherein the resin-encapsulation step is performed by compression molding of the resin in the die cavity together with the plate-like member and the at least one electronic component in a state where the at least one electronic component is immersed in the resin placed on the plate-like member, the transfer step comprises transferring the plate-like member to the die cavity in the molding die in a state where the plate-like member is placed on a release film so as to face the bump-formed surface upward, and the transfer step comprises placing a frame on the release film together with the plate-like member, and transferring the bump-formed plate-like member to the die cavity in the molding die in a state where the plate-like member is surrounded by the frame. 2. The method according to claim 1 , wherein the resin placement step comprises placing the frame on the release film together with the plate-like member, and placing the resin on the bump-formed surface by supplying the resin to a space surrounded by the plate-like member and the frame in a state where the plate-like member is surrounded by the frame. 3. The method according to claim 2 , wherein the resin placement step is performed prior to the transfer step.
the semiconductor body being completely enclosed · CPC title
using batch processing · CPC title
protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons · CPC title
in encapsulations · CPC title
Electroforming · CPC title
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