Method of analogue measurement scanning on a machine tool

US9726481B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9726481-B2
Application numberUS-201314391837-A
CountryUS
Kind codeB2
Filing dateApr 16, 2013
Priority dateApr 18, 2012
Publication dateAug 8, 2017
Grant dateAug 8, 2017

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method of building up a measurement data set for a surface of an object using an analog measurement probe mounted on a machine tool apparatus which obtains scanned measurement data of the surface over a plurality of offset traverses. Subsequent traverses are offset from previous traverses such that over a series of traverses the analog probe's surface detecting region progresses i) laterally across the object, and/or ii) away from or towards the object. The course of relative motion for at least one subsequent traverse is generated and/or updated based on data obtained during at least one previous traverse.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method of building up a measurement data set for a surface of an object, the method comprising: using an analogue measurement probe mounted on a machine tool apparatus to obtain scanned measurement data of the surface over a plurality of offset traverses, in which a subsequent traverse is offset from a previous traverse such that, over a series of traverses, a surface detecting region of the analogue probe progresses i) laterally across the object, and/or ii) away from or towards the object, and in which the course of relative motion for at least one subsequent traverse is generated and/or updated based on data obtained during at least one previous traverse. 2. A method as claimed in claim 1 , in which the course of relative motion for said at least one subsequent traverse is generated and/or updated by altering a predetermined course of motion for said subsequent traverse based on data obtained during at least one previous traverse. 3. A method as claimed in claim 1 , in which at least one subsequent traverse is updated so as to avoid adverse positional relationships between the object and analogue probe. 4. A method as claimed in claim 3 , in which at least one subsequent traverse is updated so as to avoid positional relationships between the object and analogue probe which would cause the analogue probe to obtain data exceeding a first threshold so as to thereby avoid said adverse positional relationships. 5. A method as claimed in claim 1 , in which the analogue probe used to obtain the scanned measurement data has a preferred measurement range. 6. A method as claimed in claim 5 , in which the preferred measurement range is defined by at least an upper boundary, and in which at least one subsequent traverse is updated so as to avoid positional relationships which would cause the analogue probe to obtain measurements that would exceed the upper boundary. 7. A method as claimed in claim 1 , in which for each traverse, the analogue probe obtains measurement data along substantially the same nominal measurement line on the surface of the object. 8. A method as claimed in claim 1 , in which for each traverse, the analogue probe obtains measurement data along a different nominal measurement line on the surface of the object. 9. A method as claimed in claim 8 , in which the form of the nominal measurement line of the traverses is substantially identical. 10. A method as claimed in claim 9 , in which the nominal measurement lines extend substantially parallel to each other. 11. A method as claimed in claim 1 , in which the analogue probe used to obtain the scanned measurement data is a contact analogue probe. 12. A non-transitory computer readable medium comprising instructions which when executed by a machine tool apparatus cause the machine tool apparatus to perform the method of claim 1 . 13. A method of measuring a feature of an object using an analogue probe mounted on a machine tool apparatus, the method comprising: loading into a controller of the machine tool apparatus a predetermined course of motion along which the analogue probe and object can move relative to each other so as to collect scanned measurement data regarding the feature; performing a scanning operation by relatively moving the analogue probe and/or object according to the predetermined course of motion, in which the predetermined course of motion is updated at at least one of a number of predetermined points along the predetermined course of motion based on prior collected scanned measurement data. 14. A machine tool apparatus, comprising: a machine tool; and an analogue measurement probe mounted on the machine tool, in which the machine tool apparatus is configured to move the analogue measurement probe so as to build up a measurement data set for a surface of an object using the analogue measurement probe by obtaining scanned measurement data of the surface over a plurality of offset traverses, in which a subsequent traverse is offset from a previous traverse such that, over a series of traverses, a surface detecting region of the analogue probe progresses i) laterally across the object, and/or ii) away from or towards the object, and in which the course of relative motion for at least one subsequent traverse is generated and/or updated based on data obtained during at least one previous traverse. 15. A method of building up a measurement data set for a surface of an object, the method comprising: using an analogue measurement probe mounted on a machine tool apparatus to obtain scanned measurement data of the surface over a plurality of offset traverses, wherein: over a series of the plurality of offset traverses comprising previous and subsequent traverses, a said subsequent traverse is offset from a said previous traverse such that a surface detecting region of the analogue probe progresses i) laterally across the object, and/or ii) away from or towards the object, and the course of relative motion for at least one of the subsequent traverses is generated and/or updated based on data obtained during at least one of the previous traverses.

Assignees

Inventors

Classifications

  • using coordinate measuring machines · CPC title

  • using coordinate measuring machines · CPC title

  • G01B21/045Primary

    Correction of measurements (G01B9/02055 takes precedence) · CPC title

  • characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes (G05B19/19 takes precedence) · CPC title

  • G01B21/04Primary

    by measuring coordinates of points · CPC title

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What does patent US9726481B2 cover?
A method of building up a measurement data set for a surface of an object using an analog measurement probe mounted on a machine tool apparatus which obtains scanned measurement data of the surface over a plurality of offset traverses. Subsequent traverses are offset from previous traverses such that over a series of traverses the analog probe's surface detecting region progresses i) laterally …
Who is the assignee on this patent?
Renishaw Plc
What technology area does this patent fall under?
Primary CPC classification G01B21/045. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 08 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).