Liquid ejection head and method of manufacturing liquid ejection head
US-2024217235-A1 · Jul 4, 2024 · US
US9708183B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9708183-B2 |
| Application number | US-201615046239-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 17, 2016 |
| Priority date | Feb 17, 2015 |
| Publication date | Jul 18, 2017 |
| Grant date | Jul 18, 2017 |
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A process for filling one or more etched holes defined in a frontside surface of a wafer substrate. The process includes the steps of: (i) depositing a layer of a thermoplastic first polymer onto the frontside surface and into each hole; (ii) reflowing the first polymer; (iii) exposing the wafer substrate to a controlled oxidative plasma; (iv) optionally repeating steps (i) to (iii); (v) depositing a layer of a photoimageable second polymer; (vi) selectively removing the second polymer from regions outside a periphery of the holes using exposure and development; and (vii) planarizing the frontside surface to provide holes filled with a plug comprising the first and second polymers, which are different than each other. Each plug has a respective upper surface coplanar with the frontside surface.
Opening claim text (preview).
The invention claimed is: 1. A process for filling one or more etched holes defined in a surface of a wafer substrate, said process comprising the steps of: (i) depositing a layer of a thermoplastic first polymer onto the surface and into each hole; (ii) reflowing the first polymer; (iii) exposing the wafer substrate to a controlled oxidative plasma so as to reveal the surface; (iv) optionally repeating steps (i) to (iii); (v) depositing a layer of a photoimageable second polymer so as to overfill each hole with said second polymer; (vi) selectively removing the second polymer from regions outside a periphery of the holes to provide overfilled holes, the selective removing comprising exposure and development of the second polymer; and (vii) planarizing the surface to provide one or more holes filled with a plug comprising the first and second polymers, each plug having a respective upper surface coplanar with the surface of the wafer substrate, wherein the first and second polymers are different. 2. The process of claim 1 , wherein each hole has a depth of at least 10 microns. 3. The process of claim 1 , wherein each hole has an aspect ratio of >1:1. 4. The process of claim 1 , wherein the first polymer is less viscous than the second polymer. 5. The process of claim 1 , wherein, in step (iii), the controlled oxidative plasma exposure is timed so as to remove a predetermined thickness of the first polymer. 6. The process of claim 1 , wherein, in step (vii), the wafer is planarized by a chemical-mechanical planarization (CMP) process. 7. The process of claim 1 , wherein an extent of overfill of the hole immediately prior to step (vii) is less than 12 microns. 8. The process of claim 1 further comprising additional MEMS fabrication steps. 9. The process of claim 8 , wherein the additional MEMS fabrication steps construct inkjet nozzle devices on the planarized surface of the wafer substrate. 10. The process of claim 9 , wherein each nozzle device comprises a nozzle chamber in fluid communication with at least one hole. 11. The process of claim 10 , wherein a respective inlet for each nozzle chamber is defined by one of said holes. 12. The process of claim 11 , further comprising at least one of: wafer thinning and backside etching of ink supply channels. 13. The process of claim 12 , wherein each ink supply channel meets with one or more filled holes. 14. The process of claim 13 , wherein each ink supply channel is relatively wider said one or more holes. 15. The process of claim 14 , further comprising oxidative removal of the first and second polymers from the holes.
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