Substrate processing apparatus

US9687886B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9687886-B2
Application numberUS-201514687649-A
CountryUS
Kind codeB2
Filing dateApr 15, 2015
Priority dateAug 29, 2006
Publication dateJun 27, 2017
Grant dateJun 27, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method and apparatus capable of eliminating occurrence of a development failure when a DI water discharge nozzle 20 is scanned to dry a substrate by spinning. A substrate is held in a horizontal posture by a spin chuck and rotated about a vertical axis by a rotation motor, and when an outlet of the nozzle is scanned from a position opposed to a center of the substrate W to a position opposed to a circumferential edge while a cleaning solution being discharged, immediately after the nozzle has started to move, only one dried core is produced in the vicinity of the center of the substrate, and thus production of not less than two dried cores in the vicinity of the center of the substrate is prevented. The dried region is spread all over the surface of the substrate.

First claim

Opening claim text (preview).

What is claimed is: 1. A substrate processing apparatus comprising: a substrate holder for holding a substrate in a horizontal posture; a substrate rotator connected to said substrate holder for rotating the substrate held by said substrate holder about a vertical axis; a discharge nozzle arranged for discharging a cleaning solution from an outlet thereof to a surface of the substrate that is held by said substrate holder and rotated by said substrate rotator; a cleaning solution supply source connected to said discharge nozzle for feeding the cleaning solution to said discharge nozzle; and a nozzle rotating drive connected to said discharge nozzle for scanning the outlet of said discharge nozzle from a position opposed to a center of the substrate to a position opposed to a circumferential edge of the substrate while the cleaning solution is being discharged onto the surface of the substrate from said outlet; the substrate processing apparatus further comprising: a controller configured to control said nozzle rotating drive such that after the outlet of said discharge nozzle has started to move from a position opposed to a center of the substrate toward a circumferential edge of the substrate, before drying at the center portion of the substrate is started, wherein a center position of the substrate is a center and wherein a distance to a position on the substrate surface opposed to the outlet of said discharge nozzle is a radius, the outlet of said discharge nozzle is once stopped, and after drying has started in a small region the outlet of said discharge nozzle is moved again toward the circumferential edge of the substrate, wherein said controller is further configured to control said nozzle rotating drive such that the movement of the outlet of said discharge nozzle is once stopped after the outlet of said discharge nozzle has started to move from the position opposed to the center of the substrate toward the circumferential edge of the substrate and before drying at the center of the substrate is started, and the outlet of said discharge nozzle is moved again toward the circumferential edge of the substrate after drying has started, by a centrifugal force causing the cleaning solution, which the surface of the substrate is covered with, to flow in a region inside a circumference defined by the center of the substrate as the center and by a distance to a position on the substrate surface opposed to the outlet of said discharge nozzle as a radius. 2. The substrate processing apparatus according to claim 1 , further comprising: a gas jet nozzle arranged for blowing out a drying gas from a jet hole thereof to the center surface of the substrate that is held by said substrate holder and rotated by said substrate rotator; and a gas feeding supply source connected to said gas jet nozzle for feeding a drying gas to said gas jet nozzle. 3. A substrate processing apparatus comprising: a substrate holder that holds a substrate in a horizontal posture; a substrate rotator connected to the substrate holder that rotates the substrate held by said substrate holder about a vertical axis; a discharge nozzle that has an outlet from which a cleaning solution is discharged; and a nozzle rotating drive that moves the outlet of said discharge nozzle from a first position to a second position, the first position being opposed to a center of the substrate, the second position being opposed to a circumferential edge of the substrate, wherein said nozzle rotating drive stops the movement of the outlet discharging the cleaning solution at a third position between the first position and the second position and then starts to move the outlet from the third position to the second position after forming a dried core at a center surface of the substrate and then spreading the dried core over a region inside a circumference, wherein a center position of the substrate is a center, and wherein a distance to a position on the substrate surface opposed to the third position is a radius; and further comprising: a controller configured to control said nozzle rotating drive such that after the outlet of said discharge nozzle has started to move from a position opposed to a center of the substrate toward a circumferential edge of the substrate, before drying at the center portion of the substrate is started, wherein a center position of the substrate is a center and wherein a distance to a position on the substrate surface opposed to the outlet of said discharge nozzle is a radius, the outlet of said discharge nozzle is once stopped, and after drying has started in a small region the outlet of said discharge nozzle is moved again toward the circumferential edge of the substrate, wherein said controller is further configured to control said nozzle rotating drive such that the movement of the outlet of said discharge nozzle is once stopped after the outlet of said discharge nozzle has started to move from the position opposed to the center of the substrate toward the circumferential edge of the substrate and before drying at the center of the substrate is started, and the outlet of said discharge nozzle is moved again toward the circumferential edge of the substrate after drying has started, by a centrifugal force causing the cleaning solution, which the surface of the substrate is covered with, to flow in a region inside a circumference defined by the center of the substrate as the center and by a distance to a position on the substrate surface opposed to the outlet of said discharge nozzle as a radius. 4. The substrate processing apparatus according to claim 2 , wherein said gas jet nozzle is mounted on a gas jet rotating drive which is arranged separately from said nozzle rotating drive.

Assignees

Inventors

Classifications

  • using mainly spraying means, e.g. nozzles · CPC title

  • for drying · CPC title

  • for cleaning followed by drying, rinsing, stripping, blasting or the like · CPC title

  • H10P70/20Primary

    Cleaning during device manufacture · CPC title

  • H10P52/00Primary

    Grinding, lapping or polishing of wafers, substrates or parts of devices · CPC title

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What does patent US9687886B2 cover?
A method and apparatus capable of eliminating occurrence of a development failure when a DI water discharge nozzle 20 is scanned to dry a substrate by spinning. A substrate is held in a horizontal posture by a spin chuck and rotated about a vertical axis by a rotation motor, and when an outlet of the nozzle is scanned from a position opposed to a center of the substrate W to a position oppose…
Who is the assignee on this patent?
Screen Holdings Co Ltd
What technology area does this patent fall under?
Primary CPC classification H10P70/20. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jun 27 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).