Semiconductor device and manufacturing method thereof
US-2015357422-A1 · Dec 10, 2015 · US
US9685869B1 · US · B1
| Field | Value |
|---|---|
| Publication number | US-9685869-B1 |
| Application number | US-201615360123-A |
| Country | US |
| Kind code | B1 |
| Filing date | Nov 23, 2016 |
| Priority date | Sep 16, 2014 |
| Publication date | Jun 20, 2017 |
| Grant date | Jun 20, 2017 |
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GaN-based half bridge power conversion circuits employ control, support and logic functions that are monolithically integrated on the same devices as the power transistors. In some embodiments a low side GaN device communicates through one or more level shift circuits with a high side GaN device. Both the high side and the low side devices may have one or more integrated control, support and logic functions. Some devices employ electro-static discharge circuits and features formed within the GaN-based devices to improve the reliability and performance of the half bridge power conversion circuits.
Opening claim text (preview).
What is claimed is: 1. A half bridge circuit comprising: a GaN-based low side circuit including: a GaN-based low side switch having a low side switch control gate, a low side switch source and a low side switch drain, wherein the low side switch source is coupled to a ground and the low side switch drain is connected to a switch node; and a GaN-based low side switch driver having an output coupled to the low side switch control gate; a GaN-based high side circuit including: a GaN-based high side switch having a high side control gate, a high side switch source and a high side switch drain, wherein the high side switch source is coupled to the switch node and the high side switch drain is coupled to a voltage source; and a GaN-based high side switch driver having an output coupled to the high side switch control gate and an input coupled to a level shift circuit; a blanking pulse circuit configured to generate a signal that controls a state of at least one of the GaN-based low side switch and the GaN-based high side switch; a state storage device that is configured to change a stored state corresponding to on and off states of the GaN-based high side switch driver; and an under voltage lock out circuit configured to prevent drive signals from reaching the input of the GaN-based high side switch driver when a circuit supply voltage is less than a threshold voltage. 2. The half bridge circuit of claim 1 wherein the blanking pulse circuit is configured to generate a pulse signal that corresponds to a turn off transient of the GaN-based low side switch to prevent turn-on of the GaN-based high side switch. 3. The half bridge circuit of claim 1 wherein the state storage device is a flip-flop device. 4. The half bridge circuit of claim 1 wherein the GaN-based low side circuit and the GaN-based high side circuit are disposed on a single monolithic GaN-based device. 5. The half bridge circuit of claim 1 wherein the GaN-based low side circuit is disposed on a first monolithic GaN-based device and the GaN-based high side circuit is disposed on a second monolithic GaN-based device. 6. The half bridge circuit of claim 1 further comprising a boot strap transistor configured to conduct when the GaN-based low side switch is in an on state. 7. The half bridge circuit of claim 1 wherein at least one of the GaN-based low side circuit and the GaN-based high side circuit have an ESD protection circuit. 8. The half bridge circuit of claim 1 wherein all transistors within the GaN-based low side circuit and within the GaN-based high side circuit are enhancement mode devices. 9. The half bridge circuit of claim 1 wherein all inverters and gates within the GaN-based low side circuit and within the GaN-based high side circuit are enhancement mode transistors. 10. The half bridge circuit of claim 1 wherein all inverters and gates within the GaN-based low side circuit and within the GaN-based high side circuit use charge pump capacitors to drive gates of pull-up transistors above a positive rail voltage. 11. A method of operating a half bridge power conversion circuit, the method comprising: operating a low side switch using a low side driver, wherein the low side switch and the low side driver comprise a first GaN-based circuit; operating a high side switch using a high side driver, wherein the high side switch and the high side driver comprise a second GaN-based circuit; controlling the low side driver and the high side driver with a control circuit that transmits on and off signals to the low side and the high side drivers; generating a blanking pulse to control a state of at least one of the GaN-based low side switch and the GaN-based high side switches; changing a state of a state storage device corresponding to on and off states of the GaN-based high side switch driver; transmitting a drive signal to an input of the high side driver with a level shift circuit; and preventing the high side driver from operating the high side switch when a circuit supply voltage is less than a threshold voltage. 12. The method of claim 11 wherein the blanking pulse corresponds to a turn off transient of the GaN-based low side switch to prevent turn-on of the GaN-based high side switch. 13. The method of claim 11 wherein the state storage device is a flip-flop device. 14. The method of claim 11 wherein the GaN-based low side switch and the GaN-based high side switch are disposed on a single monolithic GaN-based device. 15. The method of claim 11 wherein the GaN-based low side switch is disposed on a first GaN-based device and the GaN-based high side switch is disposed on a second GaN-based device. 16. An electronic package including one or more semiconductor devices that form a circuit comprising: a GaN-based low side circuit including: a GaN-based low side switch having a low side switch control gate, a low side switch source and a low side switch drain, wherein the low side switch source is coupled to a ground and the low side switch drain is connected to a switch node; and a GaN-based low side switch driver having an output coupled to the low side switch control gate; a GaN-based high side circuit including: a GaN-based high side switch having a high side control gate, a high side switch source and a high side switch drain, wherein the high side switch source is coupled to the switch node and the high side switch drain is coupled to a voltage source; and a GaN-based high side switch driver having an output coupled to the high side switch control gate and an input coupled to a level shift circuit; a blanking pulse circuit configured to generate a signal that controls a state of at least one of the GaN-based low side switch and the GaN-based high side switch; a state storage device that is configured to change a stored state corresponding to on and off states of the GaN-based high side switch driver; and an under voltage lock out circuit configured to prevent drive signals from reaching the input of the GaN-based high side switch driver when a circuit supply voltage is less than a threshold voltage. 17. The electronic package of claim 16 wherein the blanking pulse circuit is configured to generate a pulse signal that corresponds to a turn off transient of the GaN-based low side switch to prevent turn-on of the GaN-based high side switch. 18. The electronic package of claim 16 wherein the state storage device is a flip-flop device. 19. The electronic package of claim 16 wherein the GaN-based low side circuit and the GaN-based high side circuit are disposed on a single monolithic GaN-based device. 20. The electronic package of claim 16 wherein the GaN-based low side circuit is disposed on a first GaN-based device and the GaN-based high side circuit is disposed on a second GaN-based device.
Multiple chips on leadframes · CPC title
Package configurations · CPC title
for devices being provided for in groups H10D8/00 - H10D48/00 · CPC title
Chip-supporting parts, e.g. die pads · CPC title
protecting against overcurrent or overload, e.g. fuses or shunts (integrated devices comprising arrangements for electrical protection H10D89/60) · CPC title
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