Radiation analyzing apparatus

US9678218B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9678218-B2
Application numberUS-201614994196-A
CountryUS
Kind codeB2
Filing dateJan 13, 2016
Priority dateJan 20, 2015
Publication dateJun 13, 2017
Grant dateJun 13, 2017

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Abstract

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A wave height analyzer generates pre-sensitivity correction data using a radiation pulse signal transmitted from a room temperature amplifier, a heater value acquired from a temperature control section, a base line of a current flowing to a TES acquired from a base line monitor mechanism. The wave height analyzer outputs the pre-sensitivity correction data to a sensitivity correction arithmetic operation unit and receives post-sensitivity correction data, on which sensitivity correction is performed. The wave height analyzer generates composite data of a combination of the pre-sensitivity correction data and the post-sensitivity correction data. A spectrum display section receives pieces of composite data sequentially created by the wave height analyzer and displays at least one of a spectrum before sensitivity correction and a spectrum after sensitivity correction, in response to receiving an operator's request.

First claim

Opening claim text (preview).

What is claimed is: 1. A radiation analyzing apparatus comprising: a superconductive transition edge sensor configured to detect radiation and output a detection signal in accordance with sensitivity of the superconductive transition edge sensor; a data acquisition unit configured to acquire a physical quantity of data having correlation with the sensitivity of the superconductive transition edge sensor; a sensitivity correction unit configured to correct the detection signal output from the superconductive transition edge sensor by using information regarding the correlation between the physical quantity of data acquired by the data acquisition unit and the sensitivity of the superconductive transition edge sensor; and a spectrum generation unit configured to generate an energy spectrum of the radiation based on the detection signal output from the superconductive transition edge sensor and a signal obtained by performing sensitivity correction on the detection signal by the sensitivity correction unit, wherein the spectrum generation unit is configured to output signal data that includes the physical quantity of data and the detection signal output from the superconductive transition edge sensor, and wherein the sensitivity correction unit is configured to, by using the signal data output from the spectrum generation unit, while generating the information regarding correlation between the physical quantity of data and the sensitivity of the superconductive transition edge sensor, correct the detection signal by using the information regarding correlation. 2. The radiation analyzing apparatus according to claim 1 , wherein the sensitivity correction unit is configured to, by using the signal data obtained over the period of time, repeatedly update the information regarding correlation for each period of time until a predetermined condition is satisfied. 3. The radiation analyzing apparatus according to claim 1 , wherein the data acquisition unit acquires an output of a heater, which is configured to heat the superconductive transition edge sensor, as the physical quantity. 4. The radiation analyzing apparatus according to claim 1 , wherein the data acquisition unit acquires a current flowing to the superconductive transition edge sensor as the physical quantity. 5. The radiation analyzing apparatus according to claim 1 , further comprising: a display configured to display an energy spectrum of the radiation corresponding to each of presence and absence of sensitivity correction performed by the sensitivity correction unit. 6. The radiation analyzing apparatus according to claim 5 , wherein the display is configured to display the information regarding the correlation. 7. The radiation analyzing apparatus according to claim 5 , wherein the display is configured to display a setting screen for setting conditions for generating the information regarding correlation by the sensitivity correction unit, in response to receiving an operator's input.

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Classifications

  • G01T1/1606Primary

    with other specified detectors not provided for in the other subgroups of G01T1/16 · CPC title

  • Measuring spectral distribution of X-rays or of nuclear radiation {spectrometry (pulse selection circuits per se H03K; investigation of materials by radiation diffraction G01N23/20; spectrometer tubes H01J49/00)} · CPC title

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What does patent US9678218B2 cover?
A wave height analyzer generates pre-sensitivity correction data using a radiation pulse signal transmitted from a room temperature amplifier, a heater value acquired from a temperature control section, a base line of a current flowing to a TES acquired from a base line monitor mechanism. The wave height analyzer outputs the pre-sensitivity correction data to a sensitivity correction arithmetic…
Who is the assignee on this patent?
Hitachi High-Tech Science Corp
What technology area does this patent fall under?
Primary CPC classification G01T1/1606. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 13 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).