Package substrate and semiconductor package including the same
US-2024429153-A1 · Dec 26, 2024 · US
US9673140B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9673140-B2 |
| Application number | US-201514620328-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 12, 2015 |
| Priority date | Apr 8, 2014 |
| Publication date | Jun 6, 2017 |
| Grant date | Jun 6, 2017 |
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A method for fabricating a package structure is provided, which includes the steps of: providing a carrier having a plurality of bonding pads; laminating a laminate on the carrier, wherein the laminate has a built-up portion and a release portion smaller in size than the built-up portion, the release portion covering the bonding pads and the built-up portion being laminated on the release portion and the carrier; forming a plurality of conductive posts in the built-up portion; and removing the release portion and the built-up portion on the release portion such that a cavity is formed in the laminate to expose the bonding pads, the conductive posts being positioned around a periphery of the cavity. Therefore, the present invention has simplified processes.
Opening claim text (preview).
What is claimed is: 1. A method for fabricating a package structure, comprising the steps of: providing a carrier having a plurality of bonding pads; laminating a laminate on the carrier, wherein the laminate has a built-up portion and a release portion smaller in size than the built-up portion, the release portion covering the bonding pads and the built-up portion being laminated on the release portion and the carrier, wherein the release portion has a first metal layer and a second metal layer stacked on and in physical contact with one another, the first metal layer is bonded to the bonding pads and the carrier, and a projection area of the second metal layer in a top view is less than a projection area of the first metal layer in the top view; forming a plurality of conductive posts in the built-up portion; and removing the release portion and the built-up portion on the release portion such that a cavity is formed in the laminate to expose the bonding pads, the conductive posts being positioned around a periphery of the cavity. 2. The method of claim 1 , wherein the carrier is made of prepreg, polypropylene, glass fiber resin or polyimide. 3. The method of claim 1 , wherein forming the conductive posts comprises forming a plurality of through holes penetrating the built-up portion and filling a conductive material in the through holes to form the conductive posts. 4. The method of claim 1 , wherein the built-up portion has a circuit layer electrically connected to the conductive posts. 5. The method of claim 1 , further comprising disposing a stack member on the built-up portion, wherein the stack member is electrically connected to the conductive posts. 6. The method of claim 5 , wherein the stack member is a packaging substrate, a semiconductor chip, a silicon interposer or a package. 7. The method of claim 1 , wherein removing the release portion and the built-up portion on the release portion comprises the steps of: laser cutting the built-up portion to remove a portion of the release portion and the built-up portion thereon; and removing the remaining portion of the release portion by etching. 8. The method of claim 1 , further comprising disposing an electronic component in the cavity, wherein the electronic component is electrically connected to the bonding pads. 9. The method of claim 1 , wherein the built-up portion further comprises: a dielectric layer that is in contact with the carrier and has an opening; a supporting plate formed on the dielectric layer.
between a chip and a stacked insulating package substrate, interposer or RDL · CPC title
between stacked chips · CPC title
characterised by containers, encapsulations, or other housings for the stacked chips · CPC title
Package configurations · CPC title
on active surfaces of flip-chip devices, e.g. underfills · CPC title
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