Method for removing native oxide and residue from a III-V group containing surface

US9653291B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9653291-B2
Application numberUS-201414540104-A
CountryUS
Kind codeB2
Filing dateNov 13, 2014
Priority dateNov 13, 2014
Publication dateMay 16, 2017
Grant dateMay 16, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

Official abstract text for this publication.

Native oxides and residue are removed from surfaces of a substrate by performing a multiple-stage native oxide cleaning process. In one example, the method for removing native oxides from a substrate includes supplying a first gas mixture including an inert gas onto a surface of a material layer disposed on a substrate into a first processing chamber, wherein the material layer is a III-V group containing layer for a first period of time, supplying a second gas mixture including an inert gas and a hydrogen containing gas onto the surface of the material layer for a second period of time, and supplying a third gas mixture including a hydrogen containing gas to the surface of the material layer while maintaining the substrate at a temperature less than 550 degrees Celsius.

First claim

Opening claim text (preview).

We claim: 1. A method for removing native oxides from a material layer disposed on a substrate, comprising: supplying an inert gas to a surface of a material layer disposed on a substrate to alter bonding structures of native oxide on the surface of the material layer for a first period of time at a first temperature, wherein the material layer is a III-V group containing layer; supplying a H 2 gas and an inert gas to remove the native oxide from the material layer for a second period of time at a second temperature; and supplying a H 2 gas to remove residual oxide from the material layer for a third period of time while maintaining the substrate at a third temperature, wherein the third temperature is higher than the first and the second temperature. 2. The method for claim 1 , further comprising: forming a III-V group material on the material layer while maintaining the substrate at the third temperature.

Assignees

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Classifications

  • mainly by radiation · CPC title

  • during, before or after processing of insulating materials · CPC title

  • by dry cleaning only (H10P70/52 takes precedence) · CPC title

  • being group IIIA-VIA materials · CPC title

  • being Group IIIA-VA semiconductors · CPC title

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What does patent US9653291B2 cover?
Native oxides and residue are removed from surfaces of a substrate by performing a multiple-stage native oxide cleaning process. In one example, the method for removing native oxides from a substrate includes supplying a first gas mixture including an inert gas onto a surface of a material layer disposed on a substrate into a first processing chamber, wherein the material layer is a III-V group…
Who is the assignee on this patent?
Applied Materials Inc
What technology area does this patent fall under?
Primary CPC classification H10P14/3602. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue May 16 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).