Optical method for characterizing a diffractive surface and apparatus for implementing such a method

Patent metadata

Field	Value
Publication number	US-9652865-B2
Application number	US-201414782478-A
Country	US
Kind code	B2
Filing date	Mar 26, 2014
Priority date	Apr 5, 2013
Publication date	May 16, 2017
Grant date	May 16, 2017

Abstract

An optical method for characterizing a diffractive surface having a crystal grain structure, including the steps of: a) successively illuminating said surface with a plurality of light beams (Fi) having propagation directions inclined by a same angle Θ; relative to the normal to the surface and of which the projections on the surface form azimuth angle φ{umlaut over (ι)} that are different relative to a reference direction; b) acquiring an image of the surface corresponding to each of the light beams; and c) digitally processing images to obtain at least one item of information on at least one property of the surface chosen from: the grain structure, texture and level of ordering thereof. An optical head (TO) and apparatus for implementing such a method.

First claim

The invention claimed is:

1. A method for characterizing a diffracting surface having a grain structure, comprising the steps:
a) illuminating in succession said surface with N>1 light beams (F i j ) having propagation directions inclined at the same angle θ i to the normal to the surface and the projections of which onto the surface make different azimuthal angles φ i j to a reference direction;
b) acquiring an image of said surface in correspondence with each of said light beams in a given acquisition direction; and
c) digitally processing said images to obtain at least one piece of information on at least one property of said surface, chosen from: its grain structure, its texture and its degree of order;
wherein said step c) comprises determining, for each point of said surface corresponding to a pixel of said images, an average azimuthal angle of a range of azimuthal angles φ i j for which said point appears bright when it is observed in said acquisition direction.

2. The method as claimed in claim 1 , in which said step c) comprises, for each point of said surface corresponding to a pixel of said images, substeps comprising:
c1) constructing a binary vector containing N elements each associated with one of said light beams, each element of this vector being representative of the light intensity of said pixel when the surface is illuminated by the corresponding light beam, the element taking a first binary value if said intensity is lower than a threshold and a second binary value if it is higher than said threshold; and
c2) determining said average azimuthal angle from said vector.

3. The method as claimed in claim 2 , in which said substep c2) comprises identifying, in said vector, a block of contiguous elements having said second binary value and determining a central element of said block, said average azimuthal angle being that of the light beam associated with said central element.

4. The method as claimed in claim 1 , in which each of said grains has a two-dimensional periodicity with hexagonal symmetry and in which said azimuthal angles φ i j are given by: φ i j =φ 0 +j·(60°/N), where the index j ranges from 1 to N and φ 0 is a constant.

5. The method as claimed in claim 1 , in which the number N of light rays used is higher than or equal to 3.

6. The method as claimed in claim 1 , in which, in said step b), said images are acquired in an observation direction normal to the surface to be characterized.

7. The method as claimed in claim 1 , in which said step c) also comprises automatically detecting those regions of said diffracting surface which are formed by points characterized by the same said average azimuthal angle, said regions being identified with crystal grains.

8. The method as claimed in claim 7 , in which said step c) also comprises automatically detecting outlines of said regions of said diffracting surface, said outlines being identified with grain boundaries.

9. The method as claimed in claim 6 , in which said step c) also comprises calculating a degree of order of said diffracting surface, said degree of order being defined as the difference between the proportion of points of said surface corresponding to pixels of said images identified as belonging to crystal grains, and the proportion of points of said surface corresponding to pixels of said images identified as belonging to grain boundaries.

10. The method as claimed in claim 1 , in which said surface to be characterized is formed by an assembly of particles of nanoscale or micron-size dimensions on a substrate.

11. The application of a method as claimed in claim 10 to the monitoring of a process for manufacturing an assembly of particles of nanoscale or micron-size dimensions on a substrate.

12. An apparatus for implementing a method as claimed in claim 1 , comprising:
an optical head configured for generating a plurality of light beams (F i j ) having propagation directions inclined at the same angle θ i ; to the normal to a diffracting surface to be characterized, and the projections of which onto the surface make different azimuthal angles φ i j to a reference direction;
a camera, having an optical axis coincident with said axis of symmetry, arranged to acquire an image of said surface in correspondence with each of said light beams; and
a means for digitally processing the images acquired by said camera in order to obtain at least one piece of information on at least one property of said surface, chosen from: its grain structure, its texture and its degree of order; said digitally processing means being configured or programmed to determine, for each point of said surface corresponding to a pixel of said images, an average azimuthal angle of a range of azimuthal angles φ i j for which said point appears bright when it is observed in said acquisition direction.

13. The method as claimed in claim 1 , in which the number N of light rays used is higher than or equal to 6.

Assignees

• Commissariat Energie Atomique

Inventors

• Dellea Olivier
• Desage Simon-Frédéric
• Fugier Pascal

Classifications

• G02B1/005

  made of photonic crystals or photonic band gap materials (photonic band-gap structures or photonic lattices in integrated optics G02B6/1225; photonic band-gap structures or photonic lattices in optical fibres G02B6/02295) · CPC title

• G06T2207/20136

  Physics · mapped topic

• G01N2021/4735

  Solid samples, e.g. paper, glass · CPC title

• G01N21/4788 Primary

  Diffraction (for sizing particles G01N15/0205) · CPC title

• G06T2207/10028

  Range image; Depth image; 3D point clouds · CPC title