Luminescence imaging systems and methods for evaluating photovoltaic devices

Patent metadata

Field	Value
Publication number	US-9641125-B2
Application number	US-201615002628-A
Country	US
Kind code	B2
Filing date	Jan 21, 2016
Priority date	Jan 23, 2015
Publication date	May 2, 2017
Grant date	May 2, 2017

Abstract

The present disclosure relates to optical methods and systems for detecting defects in photovoltaic (PV) devices such as PV cells, PV panels, PV modules, and PV arrays.

First claim

What is claimed is:

1. A method comprising:
illuminating, using a non-solar light source, a first portion of a surface of a photovoltaic (PV) device;
collecting, using a detector, a first set of measurements relating to at least one of the presence or absence of luminescence from a second portion of the surface that is not illuminated by the non-solar light source; and
analyzing the first set of measurements to produce a first representation of the surface, wherein:
the first representation identifies at least one of a first luminescing region or a first non-luminescing region within the second portion of the surface, and
the first portion of the surface and the second portion of the surface are electrically connected.

2. The method of claim 1 , wherein the illuminating and collecting are completed without attaching an external power source to the PV device and without detaching the PV device from a power component used during normal operation of the PV device.

3. The method of claim 1 , further comprising:
stopping the illuminating of the first portion of the surface by the non-solar light source;
subsequently illuminating, using the non-solar light source, the second portion of the surface;
collecting, using a detector, a second set of measurements relating to at least one of the presence or absence of luminescence from the first portion of the surface that is not illuminated by the non-solar light source;
analyzing the second set of measurements to produce a second representation of the surface, wherein the second representation identifies at least one of a second luminescing region or a second non-luminescing region within the first portion of the surface; and
combining the first representation with the second representation to produce a composite representation of the surface that includes both the first portion and the second portion of the surface.

4. The method of claim 3 , wherein the non-solar light source and the detector are moved as a unit.

5. The method of claim 3 , wherein the detector is moved independently of the non-solar light source.

6. The method of claim 1 , wherein the illuminating and the collecting are performed while the surface of the PV device is further illuminated using a solar light source.

7. The method of claim 6 , wherein the illuminating using the non-solar light source comprises at least one of pulsing or modulating the non-solar light source.

8. The method of claim 6 , wherein the first set of measurements and the second set of measurements comprise luminescence intensity data from the second portion and the first portion of the surface, respectively.

9. The method of claim 1 , wherein the non-solar light source provides light comprising at least one wavelength of less than about 1100 nm.

10. The method of claim 9 , wherein:
the first set of measurements and the second set of measurements comprise luminescence intensity data from the second portion and the first portion of the surface, respectively, and
the luminescence intensity data are for light emitted with wavelengths greater than the at least one wavelength of the light provided by the non-solar light source.

11. The method of claim 1 , wherein the non-solar light source comprises at least one of an light-emitting diode (LED) light, an incandescent light, a fluorescent light, a laser diode light, or a halogen light.

12. The method of claim 1 , wherein the detector comprises at least one of a silicon camera or an indium-gallium-arsenide camera.

13. The method of claim 1 , wherein the camera comprises at least one of a charge-coupled camera or a complimentary metal-oxide-semiconductor camera.

14. The method of claim 1 , wherein the illuminating and the collecting are performed with both the non-solar light source and the detector within a distance of about six meters or less from the PV device.

15. The method of claim 1 , wherein the illuminating and the collecting are performed with both the non-solar light source and the detector at a distance greater than about six meters from the PV device.

16. A system comprising:
a non-solar light source configured to produce non-solar light having at least one wavelength less than about 1100 nm; and
a camera configured to detect emitted light having a wavelength greater than the at least one wavelength produced by the non-solar light source, wherein:
the non-solar light source is configured to direct the non-solar light substantially towards a first target, and
the camera is configured to receive the emitted light from a second target that is electrically connected to the first target.

17. The system of claim 16 , wherein the non-solar light source comprises at least one of an light-emitting diode (LED) light, an incandescent light, a fluorescent light, a laser diode light, or a halogen light.

18. The system of claim 16 , wherein the camera comprises at least one of a silicon camera or an indium-gallium-arsenide camera.

19. The system of claim 16 , further comprising a housing, wherein:
the non-solar light source is positioned within the housing,
the housing comprises an aperture, and
the non-solar light produced by the light source passes through the aperture.

20. The system of claim 19 , further comprising a support frame, wherein the housing and the camera are physically connected to the support frame, such that the housing, the non-solar light source, and the camera move as a unit when the support frame is moved.

Assignees

• Alliance Sustainable Energy

Inventors

• Johnston Steven

Classifications

• G01N2021/646

  Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects · CPC title

• H02S50/15 Primary

  using optical means, e.g. using electroluminescence · CPC title

• G01N21/6489

  Photoluminescence of semiconductors · CPC title

• G01N21/956

  Inspecting patterns on the surface of objects {(contactless testing of electronic circuits G01R31/308; testing currency G07D; manufacturing processes per se of semiconductor devices implementing a measuring step H10P74/20)} · CPC title

• G01N21/63

  optically excited · CPC title