Memory devices having source lines directly coupled to body regions and methods
US-2024386966-A1 · Nov 21, 2024 · US
US9633735B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9633735-B2 |
| Application number | US-201414486687-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 15, 2014 |
| Priority date | Jul 22, 2014 |
| Publication date | Apr 25, 2017 |
| Grant date | Apr 25, 2017 |
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A system and method to inhibit the erasing of a portion of a sector of split gate flash memory cells while allowing the remainder of the sector to be erased is disclosed. The inhibiting is controlled by control logic that applies one or more bias voltages to the portion of the sector whose erasure is to be inhibited.
Opening claim text (preview).
What is claimed is: 1. A method of erasing a portion of a sector of a flash memory system, the sector comprising a first row of flash memory cells and a second row of flash memory cells, wherein the first row and second row share an erase gate, comprising: applying a first non-zero bias voltage to a control gate for the first row, wherein the first non-zero bias voltage is around 9 volts; applying a second non-zero bias voltage to a control gate for the second row, wherein the second non-zero bias voltage is around −9 volts; applying a third non-zero bias voltage to a word line for the second row, wherein the third non-zero bias voltage is within the range of 0.8 to 5 volts; and applying a signal to the erase gate to erase the first row while not erasing the second row. 2. The method of claim 1 , wherein the first row of flash memory cells and the second row of flash memory cells each comprise split gate flash memory cells.
in voltage or current generators · CPC title
comprising cells containing a merged floating gate and select transistor · CPC title
Programming voltage switching circuits · CPC title
Circuits for erasing electrically, e.g. erase voltage switching circuits · CPC title
with adaption or trimming of parameters · CPC title
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