Persistent command parameter table for pre-silicon device testing

US9619312B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9619312-B2
Application numberUS-201514620431-A
CountryUS
Kind codeB2
Filing dateFeb 12, 2015
Priority dateFeb 12, 2015
Publication dateApr 11, 2017
Grant dateApr 11, 2017

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  1. Title

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  5. First independent claim

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Abstract

Official abstract text for this publication.

Embodiments relate to pre-silicon device testing using a persistent command table. An aspect includes receiving a value for a persistent command parameter from a user. Another aspect includes determining whether the value of the persistent command parameter is greater than zero. Another aspect includes based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test. Another aspect includes adding the selected commands to the persistent command table of the driver. Another aspect includes performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.

First claim

Opening claim text (preview).

What is claimed is: 1. A computer implemented method for pre-silicon device testing using a persistent command table, the method comprising: receiving a persistent command parameter from a user; determining whether the value of the persistent command parameter is greater than zero; based on determining whether the persistent command parameter is greater than zero, selecting a number of commands equal to the persistent command parameter from a regular command table of a driver of a device under test; adding the selected commands to the persistent command table of the driver; performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver; receiving from the user a time delay to wait between commands during the testing; and performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver based on persistently applying the received time delay. 2. The method of claim 1 , wherein the driver is one of a plurality of drivers of a single type of driver of the device under test, and wherein the method further comprises performing testing of the device under test via the plurality of drivers using only commands from the persistent command table. 3. The method of claim 1 , further comprising receiving a repetitive sequence parameter from the user, the repetitive sequence parameter indicating one of random order testing and given order testing. 4. The method of claim 3 , further comprising: based on the repetitive sequence parameter indicating the random order testing, performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver by driving the commands from the persistent command table to the driver in a random order. 5. The method of claim 3 , further comprising: based on the repetitive sequence parameter indicating the given order testing, performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver by driving the commands from the persistent command table to the driver in an order in which the commands are given in the persistent command table. 6. The method of claim 1 , further comprising, after completion of the testing of the device under test via the driver using the persistent command table: selecting a different set of commands from the regular command table; adding the different set of commands to a new persistent command table of the driver; and performing subsequent testing of the device under test via the driver using only commands from the new persistent command table. 7. The method of claim 1 , further comprising receiving from the user an address or attribute of the address to associate with commands during the testing; and performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver based on persistently applying the received address or attribute of the address. 8. A computer program product for implementing pre-silicon device testing using a persistent command table, the computer program product comprising: a non-transitory computer readable storage medium having program instructions embodied therewith, the program instructions readable by a processing circuit to cause the processing circuit to perform a method comprising: receiving a persistent command parameter from a user; determining whether the persistent command parameter is greater than zero; based on determining whether the persistent command parameter is greater than zero, selecting a number of commands equal to the persistent command parameter from a regular command table of a driver of a device under test; adding the selected commands to the persistent command table of the driver; performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver; receiving from the user a time delay to wait between commands during the testing; and performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver based on persistently applying the received time delay. 9. The computer program product of claim 8 , wherein the driver is one of a plurality of drivers of a single type of driver of the device under test, and wherein the method further comprises performing testing of the device under test via the plurality of drivers using only commands from the persistent command table. 10. The computer program product of claim 8 , further comprising receiving a repetitive sequence parameter from the user, the repetitive sequence parameter indicating one of random order testing and given order testing. 11. The computer program product of claim 10 , further comprising: based on the repetitive sequence parameter indicating the random order testing, performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver by driving the commands from the persistent command table to the driver in a random order. 12. The computer program product of claim 10 , further comprising: based on the repetitive sequence parameter indicating the given order testing, performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver by driving the commands from the persistent command table to the driver in an order in which the commands are given in the persistent command table. 13. The computer program product of claim 8 , further comprising, after completion of the testing of the device under test via the driver using the persistent command table: selecting a different set of commands from the regular command table; adding the different set of commands to a new persistent command table of the driver; and performing subsequent testing of the device under test via the driver using only commands from the new persistent command table. 14. A computer system for pre-silicon device testing using a persistent command table, the system comprising: a memory; and a processor, communicatively coupled to said memory, the computer system configured to perform a method comprising: receiving a persistent command parameter from a user; determining whether the persistent command parameter is greater than zero; based on determining whether the persistent command parameter is greater than zero, selecting a number of commands equal to the persistent command parameter from a regular command table of a driver of a device under test; adding the selected commands to the persistent command table of the driver; performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver; receiving from the user a time delay to wait between commands during the testing; and performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver based on persistently applying the received time delay. 15. The system of claim 14 , wherein the driver is one of a plurality of drivers of a single type of driver of the device under test, and wherein the method further comprises performing testing of the device under test via the plurality of drivers using only commands from the persistent command table. 16. The system of claim 14 , further comprising receiving a repetitive sequence parameter from the user, the repetitive sequen

Assignees

Inventors

Classifications

  • G06F11/073Primary

    in a memory management context, e.g. virtual memory or cache management (memory management G06F12/00; testing of static memory units G11C29/00) · CPC title

  • by simulating additional hardware, e.g. fault simulation · CPC title

  • G06F11/28Primary

    by checking the correct order of processing (G06F11/08 - G06F11/26 take precedence; monitoring patterns of pulse trains H03K5/19) · CPC title

  • Testing of logic operation, e.g. by logic analysers · CPC title

  • Arrangements for designing test circuits, e.g. design for test [DFT] tools · CPC title

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What does patent US9619312B2 cover?
Embodiments relate to pre-silicon device testing using a persistent command table. An aspect includes receiving a value for a persistent command parameter from a user. Another aspect includes determining whether the value of the persistent command parameter is greater than zero. Another aspect includes based on determining whether the value of the persistent command parameter is greater than ze…
Who is the assignee on this patent?
IBM
What technology area does this patent fall under?
Primary CPC classification G06F11/073. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 11 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).