Light-emitting device and electronic device using the same
US-2024128272-A1 · Apr 18, 2024 · US
US9590151B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9590151-B2 |
| Application number | US-201414785620-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 14, 2014 |
| Priority date | Apr 19, 2013 |
| Publication date | Mar 7, 2017 |
| Grant date | Mar 7, 2017 |
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A method is provided for producing a plurality of radiation-emitting semiconductor chips, having the following steps: providing a plurality of semiconductor bodies ( 1 ) which are suitable for emitting electromagnetic radiation from a radiation exit face ( 3 ), applying the semiconductor bodies ( 1 ) to a carrier ( 2 ), applying a first mask layer ( 4 ) to regions of the carrier ( 2 ) between the semiconductor bodies ( 1 ), applying a conversion layer ( 5 ) to the entire surface of the semiconductor bodies ( 1 ) and the first mask layer ( 4 ) using a spray coating method, and removing the first mask layer ( 4 ), such that in each case a conversion layer ( 5 ) arises on the radiation exit faces ( 3 ) of the semiconductor bodies ( 1 ).
Opening claim text (preview).
The invention claimed is: 1. A method for producing a plurality of radiation-emitting semiconductor chips having the following steps: providing a plurality of semiconductor bodies which are suitable for emitting electromagnetic radiation from a radiation exit face; applying the semiconductor bodies to a carrier; applying a first mask layer to regions of the carrier between the semiconductor bodies; applying a conversion layer to the entire surface of the semiconductor bodies and the first mask layer using a spray coating method; removing the first mask layer, such that in each case a conversion layer arises on the radiation exit faces of the semiconductor bodies; applying a second mask layer to the conversion layer, which in each case completely covers the conversion layer and leaves the regions between the semiconductor bodies free; applying a reflective layer over the entire surface of the second mask layer and the regions between the semiconductor bodies using a spray coating method; and removing the second mask layer, such that the regions between the semiconductor bodies are covered with a reflective layer. 2. The method according to claim 1 , in which the first mask layer projects above the semiconductor bodies. 3. The method according to claim 1 , in which the conversion layer comprises an organic potting material, into which particles of an inorganic luminescent material have been introduced. 4. The method according to claim 3 , in which the spray coating method for applying the conversion layer ( 5 ) comprises the following steps: providing a suspension of the luminescent material particles, the organic potting material and an organic solvent; and spraying the suspension onto the surface to be coated. 5. The method according to claim 4 , in which the luminescent material particles have a concentration of between 10% by weight and 45% by weight inclusive in the suspension. 6. The method according to claim 1 , in which the diameter of the luminescent material particles has a median d 50 of at most 35 micrometers. 7. The method according to claim 1 , in which the conversion layer has a thickness of between 5 micrometers and 80 micrometers inclusive. 8. The method according to one claim 1 , in which the spray coating method for applying the conversion layer comprises a plurality of successive spraying steps, wherein in each spraying step an individual conversion layer is produced. 9. The method according to claim 8 , in which the individual conversion layers are dried between the individual spraying steps. 10. The method according to claim 1 , in which the reflective layer comprises reflective particles, which have been introduced into an organic potting material. 11. The method according to claim 1 , in which the spray coating method for applying the reflective layer comprises the following steps: providing a suspension of reflective particles, an organic potting material and an organic solvent; and spraying the suspension onto the surface to be coated. 12. The method according to claim 1 , in which the reflective layer has a thickness of between 5 micrometers and 30 micrometers inclusive. 13. The method according to claim 1 , in which one of the following devices is used as first mask layer and/or second mask layer: a patterned photoresist layer, a stencil or a prepatterned film. 14. A method for producing a plurality of radiation-emitting semiconductor chips having the following steps: providing a plurality of semiconductor bodies which are suitable for emitting electromagnetic radiation from a radiation exit face; applying the semiconductor bodies to a carrier; applying a first mask layer to regions of the carrier between the semiconductor bodies; applying a conversion layer to the entire surface of the semiconductor bodies and the first mask layer using a spray coating method; removing the first mask layer, such that in each case a conversion layer arises on the radiation exit faces of the semiconductor bodies; and applying an adhesion promoting layer over the entire surface of the carrier with the semiconductor bodies, wherein in each case a conversion layer is arranged on the radiation exit face. 15. A method for producing a plurality of radiation-emitting semiconductor chips having the following steps: providing a plurality of semiconductor bodies which are suitable for emitting electromagnetic radiation from a radiation exit face; applying the semiconductor bodies to a carrier; applying a first mask layer to regions of the carrier between the semiconductor bodies; applying a conversion layer to the entire surface of the semiconductor bodies and the first mask layer using a spray coating method; removing the first mask layer, such that in each case a conversion layer arises on the radiation exit faces of the semiconductor bodies; and applying a reflective layer over the entire surface of the semiconductor bodies, such that a reflective layer is arranged in the beam path of the semiconductor bodies of the subsequent semiconductor chips.
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