Metal material for electronic component and method for manufacturing the same

Patent metadata

Field	Value
Publication number	US-9576693-B2
Application number	US-201214346025-A
Country	US
Kind code	B2
Filing date	Sep 10, 2012
Priority date	Sep 20, 2011
Publication date	Feb 21, 2017
Grant date	Feb 21, 2017

Abstract

There are provided a metal material for electronic component which has low insertability/extractability, low whisker formability, and high durability, and a method for manufacturing the metal material. The metal material 10 for electronic components has a base material 11 , an A layer 14 constituting a surface layer on the base material 11 and formed of Sn, In or an alloy thereof, and a B layer 13 constituting a middle layer provided between the base material 11 and the A layer 14 and formed of Ag, Au, Pt, Pd, Ru, Rh, Os, Ir or an alloy thereof, wherein the surface layer (A layer) 14 has a thickness of 0.002 to 0.2 μm, and the middle layer (B layer) 13 has a thickness of 0.001 to 0.3 μm.

First claim

The invention claimed is:

1. A metal material for electronic component, having low whisker formability and high durability, comprising:
a base material;
an A layer constituting a surface layer on the base material and formed of Sn, In or an alloy thereof; and
a B layer constituting a middle layer provided between the base material and the A layer and formed of Ag, Au, Pt, Pd, Ru, Rh, Os, Ir or an alloy thereof,
wherein the surface layer (A layer) has the following constituents (i) or (ii):

(i) a thickness of 0.002 to 0.2 μm,
(ii) a deposition amount of Sn, In of 1 to 150 μg/cm 2 ; and
the middle layer (B layer) has the following constituents (iii) or (iv):

(iii) a thickness of 0.001 to 0.3 μm,
(iv) a deposition amount of Ag, Au, Pt, Pd, Ru, Rh, Os, Ir of 1 to 330 μg/cm 2 ;
wherein the surface layer (A layer) has a surface arithmetic mean deviation (Ra) of 0.1 μm or lower.

2. The metal material for electronic component according to claim 1 , wherein the surface layer (A layer) has an alloy composition comprising 50 mass % or more of Sn, In or a total of Sn and In, and the other alloy component(s) comprising one or two or more elements selected from the group consisting of Ag, As, Au, Bi, Cd, Co, Cr, Cu, Fe, Mn, Mo, Ni, Pb, Sb, W, Zn.

3. The metal material for electronic component according to claim 1 , wherein the middle layer (B layer) has an alloy composition comprising 50 mass % or more of Ag, Au, Pt, Pd, Ru, Rh, Os, Ir or a total of Ag, Au, Pt, Pd, Ru, Rh, Os and Ir, and the other alloy component(s) comprising one or two or more elements selected from the group consisting of Bi, Cd, Co, Cu, Fe, In, Mn, Mo, Ni, Pb, Sb, Se, Sn, W, Tl, Zn.

4. The metal material for electronic component according to claim 1 , wherein when a depth analysis by XPS (X-ray photoelectron spectroscopy) is carried out, a position (D 1 ) where an atomic concentration (at %) of Sn or In of the surface layer (A layer) is a maximum value and a position (D 2 ) where an atomic concentration (at %) of Ag, Au, Pt, Pd, Ru, Rh, Os or Ir of the middle layer (B layer) is a maximum value are present in the order of D 1 and D 2 from the surface.

5. The metal material for electronic component according to claim 1 , wherein when a depth analysis by XPS (X-ray photoelectron spectroscopy) is carried out, the surface layer (A layer) has a maximum value of an atomic concentration (at %) of Sn or In of 10 at % or higher.

6. The metal material for electronic component according to claim 1 , wherein when a depth analysis by XPS (X-ray photoelectron spectroscopy) is carried out, the middle layer (B layer) has a maximum value of an atomic concentration (at %) of Ag, Au, Pt, Pd, Ru, Rh, Os or Ir of 10 at % or higher.

7. The metal material for electronic component according to claim 1 , wherein the surface layer (A layer) has a thickness of 0.01 to 0.1 μm, the surface layer (A layer) has a deposition amount of Sn, In of 7 to 75 μg/cm 2 , and the metal material is whisker-free.

8. The metal material for electronic component according to claim 1 , wherein the middle layer (B layer) has a thickness of 0.005 to 0.1 μm, and the middle layer (B layer) has a deposition amount of Ag, Au, Pt, Pd, Ru, Rh, Os, Ir of 4 to 120 μg/cm 2 .

9. The metal material for electronic component according to claim 1 , further comprising a C layer provided between the base material and the B layer and constituting an underlayer, and formed of one or two or more selected from the group consisting of Ni, Cr, Mn, Fe, Co, Cu.

10. The metal material for electronic component according to claim 9 , wherein the underlayer (C layer) has an alloy composition comprising 50 mass % or more of a total of Ni, Cr, Mn, Fe, Co, Cu, and further comprising one or two or more selected from the group consisting of B, P, Sn, Zn.

11. The metal material for electronic component according to claim 9 , wherein when a depth analysis by XPS (X-ray photoelectron spectroscopy) is carried out, a position (D 1 ) where an atomic concentration (at %) of Sn or In of the surface layer (A layer) is a maximum value, a position (D 2 ) where an atomic concentration (at %) of Ag, Au, Pt, Pd, Ru, Rh, Os or Ir of the middle layer (B layer) is a maximum value and a position (D 3 ) where an atomic concentration (at %) of Ni, Cr, Mn, Fe, Co or Cu of the underlayer (C layer) is a maximum value are present in the order of D 1 , D 2 and D 3 from the surface.

12. The metal material for electronic component according to claim 9 , wherein when a depth analysis by XPS (X-ray photoelectron spectroscopy) is carried out, the surface layer (A layer) has a maximum value of an atomic concentration (at %) of Sn or In of 10 at % or higher, and the middle layer (B layer) has a maximum value of an atomic concentration (at %) of Ag, Au, Pt, Pd, Ru, Rh, Os or Ir of 10 at % or higher; and a depth where the underlayer (C layer) has an atomic concentration (at %) of Ni, Cr, Mn, Fe, Co or Cu of 25% or higher is 50 nm or more.

13. The metal material for electronic component according to claim 9 , wherein the underlayer (C layer) has a thickness of 0.05 μm or larger, and the underlayer (C layer) has a deposition amount of Ni, Cr, Mn, Fe, Co, Cu of 0.03 mg/cm 2 or larger.

14. The metal material for electronic component according to claim 9 , wherein when a depth analysis by XPS (X-ray photoelectron spectroscopy) is carried out, between a position (D 1 ) where an atomic concentration (at %) of Sn or In of the surface layer (A layer) is a maximum value and a position (D 3 ) where an atomic concentration (at %) of Ni, Cr, Mn, Fe, Co, Cu or Zn of the underlayer (C layer) is a maximum value, a region having 40 at % or more of Ag, Au, Pt, Pd, Ru, Rh, Os or Ir is present in a thickness of 1 nm or larger.

15. The metal material for electronic component according to claim 1 , wherein when an elemental analysis of a surface of the surface layer (A layer) is carried out by a survey measurement by XPS (X-ray photoelectron spectroscopy), a content of Sn, In is 2 at % or higher.

16. The metal material for electronic component according to claim 1 , wherein when an elemental analysis of a surface of the surface layer (A layer) is carried out by a survey measurement by XPS (X-ray photoelectron spectroscopy), a content of Ag, Au, Pt, Pd, Ru, Rh, Os or Ir is lower than 7 at %.

17. The metal material for electronic component according to claim 1 , wherein when an elemental analysis of a surface of the surface layer (A layer) is carried out by a survey measurement by XPS (X-ray photoelectron spectroscopy), a content of 0 is lower than 50 at %.

18. A connector terminal, wherein a metal material for electronic component according to claim 1 is used for a contact portion.

19. An FFC terminal, wherein a metal material for electronic component according to claim 1 is used for a contact portion.

20. An FPC terminal, wherein a metal material for electronic component according to claim 1 is used for a contact portion.

21. An electronic component, wherein a metal material for electronic component according to claim 1 is used for an electrode for external connection of the electronic component.

Assignees

• Shibuya Yoshitaka
• Fukamachi Kazuhiko
• Kodama Atsushi
• Jx Nippon Mining & Metals Corp

Inventors

• Shibuya Yoshitaka
• Fukamachi Kazuhiko
• Kodama Atsushi

Classifications

• C25D5/12

  at least one layer being of nickel or chromium · CPC title

• C22C38/00

  Ferrous alloys, e.g. steel alloys (cast-iron alloys C22C37/00) · CPC title

• Y10T428/12681

  Ga-, In-, Tl- or Group VA metal-base component · CPC title

• C25D3/64

  containing more than 50% by weight of silver · CPC title

• C25D3/20

  of iron · CPC title