Partitioned scan chain diagnostics using multiple bypass structures and injection points

Patent metadata

Field	Value
Publication number	US-9529046-B2
Application number	US-201414573975-A
Country	US
Kind code	B2
Filing date	Dec 17, 2014
Priority date	Dec 12, 2014
Publication date	Dec 27, 2016
Grant date	Dec 27, 2016

Abstract

A method and apparatus are provided for isolating a defect in a scan chain comprising a plurality of components of an integrated circuit. A plurality of injection points may be positioned along the scan chain. Each injection point may be configured to introduce binary test data. A plurality of bypass structures may each be configured to selectively direct a flow of the binary test data to generate a plurality of partitioned scan paths. Test logic may be configured to execute a plurality of tests using the plurality of partitioned scan paths and to combine results of the plurality of tests to isolate a faulty component of the plurality of components.

First claim

The invention claimed is:

1. An apparatus comprising:
a scan chain comprising components of an integrated circuit;
injection point structures positioned in the scan chain, wherein each injection point structure is configured to introduce binary test data at a respective point in the scan chain;
bypass structures, wherein each bypass structure includes a corresponding input coupled to an output of one injection point structure in the scan chain, wherein an output of each bypass…

Assignees

• IBM

Inventors

• Douskey Steven M
• Hamilton Michael J
• Kaufer Amanda R

Classifications

• G01R31/318583 Primary

  Physics · mapped topic

• G01R31/318563

  Physics · mapped topic