Tap counting circuit scan clock prime and enable prime leads

Patent metadata

Field	Value
Publication number	US-9529043-B2
Application number	US-201514700963-A
Country	US
Kind code	B2
Filing date	Apr 30, 2015
Priority date	Jun 11, 2009
Publication date	Dec 27, 2016
Grant date	Dec 27, 2016

Abstract

The disclosure describes novel methods and apparatuses for controlling a device's TCA circuit when the device exists in a JTAG daisy-chain arrangement with other devices. The methods and apparatuses allow the TCA test pattern set used during device manufacturing to be reused when the device is placed in a JTAG daisy-chain arrangement with other devices, such as in a customers system using the device. Additional embodiments are also provided and described in the disclosure.

First claim

What is claimed is:

1. An integrated circuit comprising:
A. a test data in lead, a scan clock lead, a scan enable lead, a scan clock prime lead, and a scan enable prime lead;
B. gating circuitry having inputs coupled to the test data in lead, the scan clock lead, and the scan enable lead, outputs coupled to the scan clock prime lead and the scan enable prime lead, and the gating circuitry also having a count complete input; and
C. counting circuitry having a scan clock prime i…

Assignees

• Texas Instruments Inc

Inventors

• Whetsel Lee D

Classifications

• G01R31/31725

  Physics · mapped topic

• G01R31/3177 Primary

  Physics · mapped topic

• G01R31/3172

  Physics · mapped topic

• G01R31/318547 Primary

  Physics · mapped topic

• G01R31/31715

  Physics · mapped topic