Semiconductor test system and method
US-9222977-B2 · Dec 29, 2015 · US
US9170299B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9170299-B2 |
| Application number | US-201414508526-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 7, 2014 |
| Priority date | Oct 20, 2006 |
| Publication date | Oct 27, 2015 |
| Grant date | Oct 27, 2015 |
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A process and apparatus provide a JTAG TAP controller ( 302 ) to access a JTAG TAP domain ( 106 ) of a device using a reduced pin count, high speed DDR interface ( 202 ). The access is accomplished by combining the separate TDI and TMS signals from the TAP controller into a single signal and communicating the TDI and TMS signals of the single signal on the rising and falling edges of the TCK driving the DDR interface. The TAP domain may be coupled to the TAP controller in a point to point fashion or in an addressable bus fashion. The access to the TAP domain may be used for JTAG based device testing, debugging, programming, or other type of JTAG based operation.
Opening claim text (preview).
What is claimed is: 1. An integrated circuit comprising: A. a TDI/TMS input lead; B. a TCK input lead; C. a TDO output lead; D. double data rate circuitry having an input coupled to the TDI/TMS input lead, an input coupled to the TCK input lead, and separate TDI and TMS output leads; E. addressable TAP interface circuitry having: i. a TDI input coupled to the TDI output lead; ii. a TMS input coupled to the TMS output lead; iii. a TCK input coupled to the TCK input lea…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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