Test and measurement instrument and method of switching waveform display styles

Patent metadata

Field	Value
Publication number	US-9529017-B2
Application number	US-201414178684-A
Country	US
Kind code	B2
Filing date	Feb 12, 2014
Priority date	Oct 16, 2008
Publication date	Dec 27, 2016
Grant date	Dec 27, 2016

Abstract

A test and measurement instrument and method of switching waveform display styles includes acquiring an electrical signal, storing peak detect data samples from the electrical signal to one or more memory devices, storing filtered data samples or unfiltered data from the electrical signal, automatically switching to a first waveform display style having the peak detect data samples configured in a first mode when a user selects the unfiltered data, and automatically switching to a second waveform display style having the peak detect data samples configured in a second mode when the user selects the filtered data samples.

First claim

What is claimed is:

1. A method of switching waveform display styles on a digital oscilloscope having a visual display, comprising:
acquiring an analog electrical signal;
converting the analog electrical signal to a digital electrical signal;
storing peak detect digital data samples from the digital electrical signal to one or more memory devices of the test and measurement instrument;
storing one or both of filtered data samples and unfiltered data samples from the digital electrical signal to the one or more memory devices, wherein the filtered data samples are produced by lowpass filtering to remove a high frequency component of the digital electrical signal;
displaying a waveform of the digital electrical signal;
automatically switching the visual display to a first waveform display style in which the peak detect data samples are configured in a first mode when a user selects the unfiltered data; and
automatically switching the visual display to a second waveform display style in which the peak detect data samples are configured in a second mode when the user selects the filtered data samples wherein the second waveform display style displays a combined waveform in which the peak detect digital data samples are overlaid with the lowpass filtered data samples with changing an intensity of pixels associated with the peak detect digital data samples based on the proximity to pixels associated with the lowpass filtered data samples.

2. The method of switching waveform display styles according to claim 1 , wherein switching to the second waveform display style having the peak detect data samples configured in the second mode includes changing a hue of pixels associated with the peak detect data samples when the user selects the filtered data samples.

3. The method of switching waveform display styles according to claim 1 , wherein switching to the second waveform display style having the peak detect data samples configured in the second mode includes changing an intensity of pixels associated with the peak detect data samples when the user selects the filtered data samples.

4. The method of switching waveform display styles according to claim 1 , wherein switching to the second waveform display style having the peak detect data samples configured in the second mode includes dimming pixels associated with the peak detect data samples that are proximally located to pixels associated with the filtered data samples when the user selects the filtered data samples.

5. The method of switching waveform display styles according to claim 1 , wherein switching to the second waveform display style having the peak detect data samples configured in the second mode includes:
applying a first hue to pixels associated with the peak detect data samples that are proximally located to pixels associated with the filtered data samples when the user selects the filtered data samples; and
applying a second hue to pixels associated with the peak detect data samples that are more distantly located to pixels associated with the filtered data samples than the proximally located pixels when the user selects the filtered data samples.

6. The method of switching waveform display styles according to claim 1 , wherein switching to the first waveform display style having the peak detect data samples configured in the first mode includes changing an intensity of pixels associated with the peak detect data samples to substantially match a dimmest pixel from among pixels associated with the unfiltered data when the user selects the unfiltered data.

7. The method of switching waveform display styles according to claim 1 , wherein the filtered data samples include lowpass filtered data samples.

8. The method of switching waveform display styles according to claim 1 , wherein the filtered data samples include decimated data samples.

9. The method of switching waveform display styles according to claim 1 , wherein the unfiltered data includes decimated data samples.

10. The method of switching waveform display styles according to claim 1 , wherein the peak detect data samples include compressed data samples.

11. The method of switching waveform display styles according to claim 1 , further comprising changing an intensity of pixels associated with the peak detect data samples that are proximally located to pixels associated with the filtered data samples responsive to the user changing an amount of lowpass filtering applied to the electrical signal, reflecting changes in the filtered data samples.

Assignees

• Tektronix Inc

Inventors

• Martin Gregory A
• Farrell David D
• Dickinson Evan A

Classifications

• G06T11/23

  using straight lines or curves · CPC title

• G01R13/0227 Primary

  Controlling the intensity or colour of the display · CPC title

• G09G5/02

  characterised by the way in which colour is displayed {(details of colour display specific for CRTs G09G1/28; specific for flat matrix panels other than liquid crystal displays G09G3/2003; specific for liquid crystal displays G09G3/3607)} · CPC title

• G01R13/02 Primary

  for displaying measured electric variables in digital form · CPC title

• G06T11/203

  Physics · mapped topic