Current monitoring circuits and methods and transistor arrangement

Patent metadata

Field	Value
Publication number	US-9529016-B2
Application number	US-201314101745-A
Country	US
Kind code	B2
Filing date	Dec 10, 2013
Priority date	Dec 19, 2012
Publication date	Dec 27, 2016
Grant date	Dec 27, 2016

Abstract

A transistor arrangement is disclosed. The transistor arrangement includes at least first and second sets of sense cells and at least one set of main cells. Each set of sense cells shares drain and gate connections with an associated set of main cells, with a different ratio of number of sense cells to associated main cells for the first set as for the second set.

First claim

The invention claimed is:

1. A transistor arrangement, comprising:
first and second sets of sense cells; and
at least one set of main cells, wherein each set of sense cells shares drain and gate connections with an associated set of main cells, and the first and second sets of sense cells respectively have different sense ratios of sense cells to associated main cells based upon independent control of gate signals.

2. The transistor arrangement as claimed in claim 1 , comprising:
a first set of main cells which shares a first gate connection with the first set of sense cells; and
a second set of main cells which shares a second gate connection with the second set of sense cells, such that the transistor arrangement has at least two gate connections.

3. The transistor arrangement in claim 2 , wherein the first and second sets of sense cells share an identical source connection.

4. The transistor arrangement as claimed in claim 1 , wherein an identical of main cells is associated with the first and second sets of sense cells, and they all share an identical gate connection.

5. The transistor arrangement as claimed in claim 4 , wherein the first and second sets of sense cells have separate source connections configured to independently monitor sense currents.

6. A current monitoring circuit comprising:
the transistor arrangement as claimed in claim 1 , connected in series with a load,
a gate controller configured to control the gate connection or gate connections of the transistor arrangement; and
a sense amplifier configured to measure a current through the load, wherein the sense amplifier is controllable to be able to measure a sense current from the first set of sense cells, or from the second set of sense cells.

7. The current monitoring circuit as claimed in claim 6 , wherein the transistor arrangement comprises a single transistor.

8. The current monitoring circuit as claimed in claim 6 , wherein the transistor arrangement comprises:
a first transistor having the first set of sense cells and a first set of main cells, and
a second transistor having the second set of sense cells and a second set of main cells.

9. The current monitoring circuit as claimed in claim 6 , further comprising:
a set of one or more measurement branches in parallel with the transistor arrangement, each measurement branch comprising a series resistor and a switch configured to control connection of the respective measurement branch into the current monitoring circuit, wherein the gate controller is configured to control switching of the transistor arrangement and branch switches, and the sense amplifier is configured to measure a current through the load based on a current flowing through the transistor arrangement or the respective measurement branch.

10. The current monitoring circuit as claimed in claim 9 , wherein the sense amplifier comprises:
a first part configured to sense a sense cell current; and
a second part configured to sense a voltage across a branch resistor.

11. The current monitoring circuit as claimed in claim 6 , further comprising:
a main controller configured to set a desired circuit setting corresponding to a desired current monitoring range, wherein the gate controller is configured to provide an overload detection signal to the main controller for use in setting the desired circuit setting.

12. A monitoring device, comprising the current monitoring circuit as claimed in claim 6 , wherein the current monitoring circuit is configured to provide a fuse function.

13. A current monitoring method, comprising:
controlling a gate of a transistor arrangement connected in series with a load, wherein the transistor arrangement comprises first and second sets of sense cells and at least one set of main cells, and each set of sense cells shares drain and gate connections with an associated set of main cells, and the first and second sets of sense cells respectively have different sense ratios of sense cells to associated main cells; and
measuring a current through the load by measuring a sense current from the first set of sense cells, or from the second set of sense cells.

14. The current monitoring method as claimed in claim 13 , wherein the transistor arrangement comprises at least a first set of main cells which shares a first gate connection with the first set of sense cells, and a second set of main cells which shares a second gate connection with the second set of sense cells, such that the transistor arrangement has at least two gate connections, further comprising:
controlling signals applied to the first and second gate connections to control a configuration of the transistor arrangement.

15. The current monitoring method as claimed in claim 13 , wherein an identical set of main cells is associated with the first and second sets of sense cells, and they all share an identical gate connection, further comprising:
monitoring the sense cells independently using separate source connections.

Assignees

• Nxp Bv

Inventors

• Aerts Steven

Classifications

• G01R19/0092

  Measuring current only · CPC title

• G01R1/203

  Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts (resistors in general H01C; microwave or radiowave terminations H01P1/26; coupling devices H01R) · CPC title

• H03K17/0822 Primary

  in field-effect transistor switches · CPC title

• G01R1/30 Primary

  Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier · CPC title