Temperature measurement device

Patent metadata

Field	Value
Publication number	US-9528887-B2
Application number	US-201113270342-A
Country	US
Kind code	B2
Filing date	Oct 11, 2011
Priority date	Oct 29, 2010
Publication date	Dec 27, 2016
Grant date	Dec 27, 2016

Abstract

A temperature measurement device includes a temperature measurement part, a calculation part, and a control part for controlling the operation of the temperature measurement part and the calculation part. The temperature measurement part has a substrate having a first surface as a contact surface with a measured body, and a second surface as an environment-lateral surface which is opposite the first surface, a first temperature sensor, a second temperature sensor, and a third temperature sensor, and the first temperature sensor. The second temperature sensor, and the third temperature sensor measure a first temperature, a second temperature, and a third temperature a plurality of times under conditions in which the temperature of the environment varies, and the calculation part calculates a deep temperature in a deep part of the measured body by using the measured temperatures.

First claim

What is claimed is:

1. A temperature measurement device comprising:
a substrate;
a first temperature sensor configured to measure first temperature at a first measurement point positioned on an outer surface of the substrate or inside of the substrate;
a second temperature sensor configured to measure second temperature at a second measurement point positioned on the outer surface of the substrate or inside of the substrate, the second measurement point being different from the first measurement point; and
a third temperature sensor configured to measure third temperature at a third measurement point positioned on the outer surface of the substrate or inside of the substrate, the third measurement point being different from the first and second measurement points,
the first temperature sensor, the second temperature sensor, and the third temperature sensor being configured to measure the first temperature, the second temperature, and the third temperature, respectively, at a plurality of times,
the first temperature being expressed by a first linear function having a first slope and a first intercept, the second temperature being a variable in the first linear function,
the first intercept of the first linear function being expressed by a second linear function having a second slope and a second intercept, the third temperature being a variable in the second linear function,
a plurality of constants corresponding to the first slope, the second slope, and the second intercept,
the first temperature sensor, the second temperature sensor, and the third temperature sensor measuring Tb 1 , Tp 1 , and Tout 1 ′ as the first temperature, the second temperature, and the third temperature, respectively, during a first measurement,
the first temperature sensor, the second temperature sensor, and the third temperature sensor measuring Tb 2 , Tp 2 , and Tout 2 ′, as the first temperature, the second temperature, and the third temperature, respectively, during a second measurement,
the first temperature sensor, the second temperature sensor, and the third temperature sensor measuring Tb 3 , Tp 3 , and Tout 3 ′, respectively, as the first temperature, the second temperature, and the third temperature, during a third measurement, and
the calculation part being configured to compute values of the first slope, the second slope, and the second intercept based on the first temperature Tb 1 , the second temperature Tp 1 , and the third temperature Tout 1 ′ that are measured during by the first measurement, the first temperature Tb 2 , the second temperature Tp 2 , and the third temperature Tout 2 ′ that are measured during the second measurement, and the first temperature Tb 3 , the second temperature Tp 3 , and the third temperature Tout 3 ′ that measured during the third measurement, and determining a deep temperature in a deep part of a measured body based on a deep temperature calculation equation that uses the values of the first slope, the second slope, and the second intercept that are calculated.

2. The temperature measurement device according to claim 1 , wherein
the calculation part is configured to compute values of a, c, and d by using an equation, which is

(

a

c

d

)

=

(

Tp
⁢

⁢
1

Tout
⁢

⁢

1
′

1

Tp
⁢

⁢
2

Tout
⁢

⁢

2
′

1

Tp
⁢

⁢
3

Tout
⁢

⁢

3
′

1

)

-
1

⁢

(

Assignees

• Shimizu Sakiko
• Seiko Epson Corp

Inventors

• Shimizu Sakiko

Classifications

• G01K13/002 Primary

  Physics · mapped topic

• G01K1/165 Primary

  for application in zero heat flux sensors · CPC title

• G01K7/42

  Circuits effecting compensation of thermal inertia; Circuits for predicting the stationary value of a temperature · CPC title

• G01K13/20 Primary

  Clinical contact thermometers for use with humans or animals · CPC title