Thermographic inspection system

US9518946B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9518946-B2
Application numberUS-201314097143-A
CountryUS
Kind codeB2
Filing dateDec 4, 2013
Priority dateDec 4, 2013
Publication dateDec 13, 2016
Grant dateDec 13, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A thermographic inspection system includes a heat source configured to be removably attached to an exterior surface of an object. A thermal imaging device obtains a thermal image of the object, and an analyzing device determines a location of a defect in the object based on the thermal image.

First claim

Opening claim text (preview).

What is claimed is: 1. A thermographic inspection system comprising: a heat source configured to be removably attached to an exterior surface of an object; a thermal imaging device that obtains a thermal image of the heat source; and an analyzing device that determines a location of a defect in the object based on the thermal image, wherein the heat source is disposed between the object and the thermal imaging device, and wherein the analyzing device determines a surface temperature of the heat source to determine the location of the defect in the object when the heat source is attached to the object. 2. The thermographic inspection system according to claim 1 , wherein the heat source is a heater having a sheet configuration. 3. The thermographic inspection system according to claim 1 , wherein the heat source generates heat and the heat is transmitted to the exterior surface of the object by thermal conduction. 4. The thermographic inspection system according to claim 1 , wherein the heat source is in direct contact with the exterior surface of the object. 5. The thermographic inspection system according to claim 1 , wherein the heat source further comprises an adhesive film connecting the heater to the exterior surface. 6. The thermographic inspection system according to claim 1 , wherein the plurality of heating elements are energized differently to provide different heat energy. 7. The thermographic inspection system according to claim 1 , wherein the plurality of heating elements are energized simultaneously. 8. The thermographic inspection system according to claim 1 , wherein the heat source includes a polyimide heater. 9. The thermographic inspection system according to claim 1 , wherein the analyzing device determines the location of the defect based on a temperature rise on the exterior surface. 10. The thermographic inspection system according to claim 1 , wherein the heat source includes a plurality of heating elements that are independently controllable. 11. The thermographic inspection system according to claim 10 , wherein the plurality of heating elements are disposed along the exterior surface of the object. 12. The thermographic inspection system according to claim 1 , wherein the thermal imaging device includes an infrared camera. 13. The thermographic inspection system according to claim 12 , wherein the infrared camera continuously acquires a plurality of thermal images over a predetermined period of time. 14. A method of inspecting an object, comprising: removably attaching a heat source to an exterior surface of an object; energizing the heat source to generate heat; transmitting the heat to the exterior surface of the object by thermal conduction; acquiring a thermal image of an exterior surface of the heat source when the heat source is attached to the exterior surface of the object; and determining a location of a defect in the object based on the thermal image. 15. The method according to claim 14 , further comprising removably attaching the heat source to the exterior surface of the object using an adhesive film. 16. The method according to claim 15 , wherein the heat source includes a plurality of resistive heating elements. 17. The method according to claim 16 , further comprising independently controlling the plurality of resistive heating elements. 18. The method according to claim 16 , further comprising arranging the plurality of resistive heating elements in an array and along the exterior surface of the object. 19. The method according to claim 16 , further comprising analyzing the temperatures of the exterior surface at a plurality of locations corresponding to the plurality of resistive heating elements to determine the location of the defect. 20. A method of inspecting an object comprising: removably attaching a heat source to an exterior surface of an object; injecting heat into the object from the heat source through the exterior surface of the object by thermal conduction; acquiring a thermal image of an exterior surface of the heat source when the heat source is attached to the exterior surface of the object; and determining a location of a defect in the object based on the thermal image.

Assignees

Inventors

Classifications

  • for generating image signals from infrared radiation only · CPC title

  • Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges (G01N21/8806 and G01N21/93 - G01N21/95692 take precedence; optical measurement of dimensions G01B11/00; optical scanning G02B26/10; image transformation G06T3/00; computerised image enhancement G06T5/00; image processing per se for flaw detection G06T7/0002) · CPC title

  • by investigating thermal conductivity (by calorimetry G01N25/20; by measuring change of resistance of an electrically-heated body G01N27/18) · CPC title

  • Thermography; Techniques using wholly visual means · CPC title

  • G01N25/72Primary

    Investigating presence of flaws · CPC title

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Frequently asked questions

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What does patent US9518946B2 cover?
A thermographic inspection system includes a heat source configured to be removably attached to an exterior surface of an object. A thermal imaging device obtains a thermal image of the object, and an analyzing device determines a location of a defect in the object based on the thermal image.
Who is the assignee on this patent?
Watlow Electric Mfg
What technology area does this patent fall under?
Primary CPC classification G01N25/72. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Dec 13 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).