Underlay film composition for imprints and method of forming pattern and pattern formation method using the same

US9507263B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9507263-B2
Application numberUS-201414245491-A
CountryUS
Kind codeB2
Filing dateApr 4, 2014
Priority dateOct 7, 2011
Publication dateNov 29, 2016
Grant dateNov 29, 2016

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  1. Title

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  2. Abstract

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Provided is the pattern formability and line edge roughness of the resultant substrate. An underlay film composition for imprints comprising a compound (A) and a solvent (B), the compound (A) having at least either one of a group (Ka) capable of covalently bonding and/or interacting with a substrate, and, a group (Kb) capable of covalently bonding and/or interacting with a curable composition for imprints, an Ohnishi parameter (Z) calculated from (equation 1) of 3.8 or larger, and a molecular weight of 400 or larger: the Ohnishi parameter=(total number of atoms)/(number of carbon atoms−number of oxygen atoms).  (Equation 1)

First claim

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What is claimed is: 1. An underlay film composition for imprints comprising a compound (A) and a solvent (B), the compound (A) having at least either one of a group (Ka) capable of covalently bonding and/or interacting with a substrate, and, a group (Kb) capable of covalently bonding and/or interacting with a curable composition for imprints, an Ohnishi parameter (Z) calculated from (equation 1) of 3.8 or larger, and a molecular weight of 400 or larger: the Ohnishi parameter=(total number of atoms)/(number of carbon atoms−number of oxygen atoms).  (Equation 1) 2. The underlay film composition for imprints of claim 1 , wherein the ratio of a sum (Za) of products of the Ohnishi parameters of the individual components and the mass fractions thereof, with respect to the whole components excluding the solvent (B), is 3.8 or larger. 3. The underlay film composition for imprints of claim 1 , wherein the underlay film composition for imprints contains a compound (Aa) having a group (Ka) capable of covalently bonding and/or interacting with the substrate, and a compound (Ab) having a group (Kb) capable of covalently bonding and/or interacting with the curable composition for imprints; or contains a compound (Aab) having a group (Ka) capable of covalently bonding and/or interacting with the substrate, and having a group (Kb) capable of covalently bonding and/or interacting with the curable composition for imprints. 4. The underlay film composition for imprints of claim 1 , wherein the compound (A) is a polymer having a molecular weight of 3000 or larger. 5. The underlay film composition for imprints of claim 1 , wherein the compound (A) is an addition polymerization-type polymer having a molecular weight of 3000 or larger. 6. The underlay film composition for imprints of claim 1 , wherein the group (Kb) capable of covalently bonding and/or interacting with the curable composition for imprints, bound to the compound (A), is a (meth)acryloyl group. 7. The underlay film composition for imprints of claim 1 , wherein the group (Ka) capable of covalently bonding and/or interacting with the substrate, bound to the compound (A), is selected from carboxyl group, hydroxy group and ether group. 8. The underlay film composition for imprints of claim 1 , wherein the compound (A) has substantially no aromatic group. 9. The underlay film composition for imprints of claim 1 , wherein the underlay film composition for imprints is substantially composed of the compound (A) and the solvent (B) only. 10. The underlay film composition for imprints of claim 1 , wherein the curable composition for imprints contains a polymerizable compound (C), and the Ohnishi parameter (Y) of the polymerizable compound (C) and the Ohnishi parameter (Z) of the compound (A) satisfy (Y)≦(Z). 11. The underlay film composition for imprints of claim 1 , wherein the curable composition for imprints contains a polymerizable compound (C), and the Ohnishi parameter (Y) of the polymerizable compound, and a sum (Za) of products of the Ohnishi parameters of the individual components and the mass fraction thereof, with respect to the whole components excluding the solvent of the underlay film composition for imprints, satisfy (Y)≦(Za).

Assignees

Inventors

Classifications

  • Composite [nonstructural laminate] · CPC title

  • G03F7/094Primary

    Multilayer resist systems, e.g. planarising layers · CPC title

  • G03F7/0002Primary

    Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping · CPC title

  • H10P76/204Primary

    of organic photoresist masks · CPC title

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What does patent US9507263B2 cover?
Provided is the pattern formability and line edge roughness of the resultant substrate. An underlay film composition for imprints comprising a compound (A) and a solvent (B), the compound (A) having at least either one of a group (Ka) capable of covalently bonding and/or interacting with a substrate, and, a group (Kb) capable of covalently bonding and/or interacting with a curable composi…
Who is the assignee on this patent?
Fujifilm Corp
What technology area does this patent fall under?
Primary CPC classification G03F7/094. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 29 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).