Quantum bits and method of forming the same
US-9355362-B2 · May 31, 2016 · US
US9490296B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9490296-B2 |
| Application number | US-201514589574-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 5, 2015 |
| Priority date | Feb 27, 2009 |
| Publication date | Nov 8, 2016 |
| Grant date | Nov 8, 2016 |
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Various techniques and apparatus permit fabrication of superconductive circuits and structures, for instance Josephson junctions, which may, for example be useful in quantum computers. For instance, a low magnetic flux noise trilayer structure may be fabricated having a dielectric structure or layer interposed between two elements or layers capable of superconducting. A superconducting via may directly overlie a Josephson junction. A structure, for instance a Josephson junction, may be carried on a planarized dielectric layer. A fin may be employed to remove heat from the structure. A via capable of superconducting may have a width that is less than about 1 micrometer. The structure may be coupled to a resistor, for example by vias and/or a strap connector.
Opening claim text (preview).
We claim: 1. An integrated circuit comprising: a substrate; a Josephson junction carried by the substrate wherein the Josephson junction is comprised of a first electrode, a second electrode, and an electrically insulative layer interposed between the first and the second electrodes, and wherein the first and the second electrodes are each formed of a material that superconducts at or below a critical temperature; a first planarized dielectric layer carried by the Josephson junction; and a metal layer carried by the first planarized dielectric layer, wherein the metal layer includes at least one electrical current path that superconducts at or below a critical temperature; a superconducting via that superconductingly electrically couples at least one electrical current path from the metal layer with the first electrode of the Josephson junction, wherein the superconducting via comprises a hole extending through the dielectric layer that is at least partially filled with a material that is superconducting at or below a critical temperature; and a second planarized dielectric layer interposed between the Josephson junction and the substrate. 2. The integrated circuit of claim 1 wherein the at least one electrical current path is comprised of at least one material selected from the group consisting of: niobium, aluminum, zinc, tin, and lead. 3. The integrated circuit of claim 1 wherein the superconducting via has a width that is less than 1 micrometer. 4. The integrated circuit of claim 1 , further comprising: a resistor. 5. The integrated circuit of claim 4 wherein the resistor comprises platinum. 6. The integrated circuit of claim 4 wherein the resistor is carried by the second planarized dielectric layer. 7. The integrated circuit of claim 6 wherein the resistor is thermally conductively coupled to the substrate. 8. The integrated circuit of claim 4 , further comprising: a fin thermally conductively coupled to the resistor. 9. A superconducting integrated circuit comprising: a substrate; a resistor carried by the substrate; a first trilayer carried by the substrate wherein the first trilayer comprises a first electrode that superconducts at or below a critical temperature, a second electrode that superconducts at or below a critical temperature, and a first electrically insulative layer interposed between the first and the second electrodes wherein the first electrode of the first trilayer is electrically coupled to the resistor; a second trilayer that is carried by the substrate wherein the second trilayer comprises a third electrode that superconducts at or below a critical temperature, a fourth electrode that superconducts at or below a critical temperature, and a second electrically insulative layer interposed between the third and the fourth electrodes and wherein the third electrode of the second trilayer is electrically coupled to the resistor; and a dielectric layer carried by the substrate wherein the dielectric layer does not cover at least a portion of the resistor and wherein the first and the third electrodes each form a respective strap contact with the resistor. 10. The superconducting integrated circuit of claim 9 wherein the resistor comprises platinum. 11. The superconducting integrated circuit of claim 9 , further comprising: a dielectric layer carried by the substrate wherein the dielectric layer covers at least a portion of the resistor; a first via formed through the dielectric layer wherein the first electrode of the first trilayer is electrically coupled to the resistor through the first via; and a second via formed through the dielectric layer wherein the third electrode of the second trilayer is electrically coupled to the resistor through the second via.
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