Post ion implant stripper for advanced semiconductor application

US9484218B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9484218-B2
Application numberUS-201013387787-A
CountryUS
Kind codeB2
Filing dateJul 26, 2010
Priority dateJul 30, 2009
Publication dateNov 1, 2016
Grant dateNov 1, 2016

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

The present invention relates to a substantially water-free photoresist stripping composition. Particularly, the present invention relates to a substantially water-free photoresist stripping composition useful in removing the photoresist after ion-implant process, comprising: (a) an amine, (b) an organic solvent A, and (c) a co-solvent, wherein the composition is substantially water-free (<3 wt % H 2 O). The present invention also provides a process for post-ion implantation stripping by using the composition of the present invention.

First claim

Opening claim text (preview).

What is claimed is: 1. A composition consisting of: (a) an amine selected from the group consisting of tetramethylammonium hydroxide, benzyl-trimethylammonium hydroxide, tetraethylammonium hydroxide and tetrabutylammonium hydroxide, and a combination thereof; (b) an organic solvent A selected from the group consisting of dimethyl sulfoxide (DMSO), dimethyl sulfone (DMSO 2 ), γ-butyrolactone (BLO)(GBL), ethyl methyl ketone, 2-pentanone, 3-pentanone, 2-hexanone, isobutyl methyl ketone, 1-propanol, 2-propanol, butyl alcohol, pentanol, 1-hexanol, 1-heptanol, 1-octanol, ethyldiglycol (EDG), butyldiglycol (BDG), benzyl alcohol, benzaldehyde, tridecane, dodecane, undecane, decane, N,N-Dimethylethanolamine, di-n-propylamine, tri-n-propylamine, isobutylamine, sec-butylamine, cyclohexylamine, methylamiline, o-toluidine, m-toluidine, o-chloroaniline, m-chloroaniline, octylamine, N,N-diethylhydroxylamine, quinoline, N,N-dimethylethanolamine, and N,N-dimethylformamide, and a combination thereof; (c) a co-solvent selected from the group consisting of an isopropyl alcohol, an isobutyl alcohol, a sec-butyl alcohol, an isopentyl alcohol, a tort-pentyl alcohol, ethylene glycol (EG), propylene glycol, 1,2-propanediol, 1,3-propanediol, 1,2,3-propanetriol, 1-amino-2-propanol, isopropyl acetate, ethyl acetoacetate, triethanol amine, ethanolamine (MEA), formamide, dimethylacetamide (DMAC), 2-(methylamino_ethanol (NMEA), and N-ethyldiisopropylamine, and a combination thereof; and (d) less than 1 wt % water; and (e) optional additives. 2. The composition of claim 1 , wherein said amine is present in an amount of 1 to 10 wt %. 3. The composition of claim 1 , wherein said amine is present in an amount of 1 to 4 wt %. 4. The composition of claim 1 , wherein the organic solvent A is selected from the group consisting of dimethyl sulfoxide (DMSO), benzyl alcohol, 1-propanol, 2-propanol, butyldiglycol, pentanol, N,N-dimethylethanol amine, and Benzaldehyde and a combination thereof. 5. The composition of claim 1 , wherein the organic solvent A is selected from the group consisting of dimethyl sulfoxide (DMSO), benzyl alcohol, and butyldiglycol and a combination thereof. 6. The composition of claim 1 , wherein the co-solvent is selected from the group consisting of ethylene glycol, 1,2-propanediol, 1-amino-2-propanol, triethanol amine, ethanolamine (MEA), and isopropyl acetate and a combination thereof. 7. The composition of claim 1 , wherein the co-solvent is selected from the group consisting of ethylene glycol, triethanol amine, and ethanolamine (MEA) and a combination thereof. 8. The composition of claim 1 , wherein water is present in an amount of less than 0.5 wt %. 9. A method for post-ion implantation stripping, comprising contacting a substrate having an implanted photoresist thereon with the composition of claim 1 under a process temperature for a period of time sufficient to remove the photoresist from the substrate. 10. The method of claim 9 , wherein the process temperature is 25° C. to 90° C. 11. The method of claim 9 , wherein the process temperature is 40° C. to 80° C. 12. The method of claim 9 , wherein the process temperature is 60° C. to 80° C. 13. The method of claim 9 , wherein the period of time is 20 min to 1 hr. 14. The composition of claim 1 , wherein the amine is tetramethylammonium hydroxide (TMAH). 15. The composition of claim 14 , wherein said amine is tetramethylammonium hydroxide (TMAH) which is present in an amount of 1 to 4 wt. %. 16. The composition of claim 15 , wherein water is present in an amount of less than 0.5 wt %. 17. The composition of claim 1 , wherein: the amine is tetramethylammonium hydroxide (TMAH); the organic solvent A is at least one selected from the group consisting of dimethyl sulfoxide (DMSO), benzyl alcohol, and butyldiglycol; and the co-solvent is at least one selected from the group consisting of ethylene glycol, triethanol amine, and ethanolamine (MEA). 18. The composition of claim 17 , wherein water is present in an amount of less than 0.5 wt %. 19. A composition consisting of: (a) an amine selected from the group consisting of tetramethylammonium hydroxide, benzyl-trimethylammonium hydroxide, tetraethylammonium hydroxide and tetrabutylammonium hydroxide, and a combination thereof; (b) an organic solvent A selected from the group consisting of dimethyl sulfoxide (DMSO), dimethyl sulfone (DMSO 2 ), γ-butyrolactone (BLO)(GBL), ethyl methyl ketone, 2-pentanone, 3-pentanone, 2-hexanone, isobutyl methyl ketone, 1-propanol, 2-propanol, butyl alcohol, pentanol, 1-hexanol, 1-heptanol, 1-octanol, ethyldiglycol (EDG), butyldiglycol (BDG), benzyl alcohol, benzaldehyde, tridecane, dodecane, undecane, decane, N,N-Dimethylethanolamine, di-n-propylamine, tri-n-propylamine, isobutylamine, sec-butylamine, cyclohexylamine, methylamiline, o-toluidine, m-toluidine, o-chloroaniline, m-chloroaniline, octylamine, N,N-diethylhydroxylamine, quinoline, N,N-dimethylethanolamine, and N,N-dimethylformamide, and a combination thereof; (c) a co-solvent selected from the group consisting of an isopropyl alcohol, an isobutyl alcohol, a sec-butyl alcohol, an isopentyl alcohol, a tert-pentyl alcohol, ethylene glycol (EG), propylene glycol, 1,2-propanediol, 1,3-propanediol, 1,2,3-propanetriol, 1-amino-2-propanol, isopropyl acetate, ethyl acetoacetate, triethanol amine, ethanolamine (MEA), formamide, dimethylacetamide (DMAC), 2-(methylamino_ethanol (NMEA), and N-ethyldiisopropylamine, and a combination thereof; and (d) less than 1 wt % water. 20. The composition of claim 1 , wherein said optional additives are present and are selected from the group consisting of a chelating agent, a surfactant and a mixture thereof. 21. The composition of claim 20 , wherein said additive is a chelating agent selected from the group consisting of ethylenediaminetetraacetic acid, diethylenetriaminepentaacetic acid, 2,4-pentanedione and a mixture thereof. 22. The composition of claim 20 , wherein said additive is a surfactant selected from the group consisting of a non-ionic alkoxylated alcohol, a nonyl-phenol, a nonyl-ethoxylate and a mixture thereof.

Assignees

Inventors

Classifications

  • H10P50/287Primary

    by chemical means · CPC title

  • G03F7/425Primary

    containing mineral alkaline compounds; containing organic basic compounds, e.g. quaternary ammonium compounds; containing heterocyclic basic compounds containing nitrogen · CPC title

  • Chemistry & Metallurgy · mapped topic

  • Electricity · mapped topic

  • of insulating materials · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US9484218B2 cover?
The present invention relates to a substantially water-free photoresist stripping composition. Particularly, the present invention relates to a substantially water-free photoresist stripping composition useful in removing the photoresist after ion-implant process, comprising: (a) an amine, (b) an organic solvent A, and (c) a co-solvent, wherein the composition is substantially water-free (<3 wt…
Who is the assignee on this patent?
Chen Chienshin, Shen Meichin, Chan Chiahao, and 2 more
What technology area does this patent fall under?
Primary CPC classification H10P50/287. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Nov 01 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).