Fourier transform infrared spectrophotometer

Patent metadata

Field	Value
Publication number	US-9459150-B2
Application number	US-201314770849-A
Country	US
Kind code	B2
Filing date	Feb 28, 2013
Priority date	Feb 28, 2013
Publication date	Oct 4, 2016
Grant date	Oct 4, 2016

Abstract

A Fourier transform infrared spectrophotometer that is free from an effect of interference condition change resulting from an accessory being mounted and has a high measurement accuracy is provided. A Fourier transform infrared spectrophotometer according to the present invention is a Fourier transform infrared spectrophotometer including a common base on which a sample chamber 2 and an interference optical system are mounted, where an accessory 20 can be detachably in the sample chamber, the Fourier transform infrared spectrophotometer including: accessory information reading means 22 for reading accessory information provided to the accessory 20 when the accessory 20 is mounted in the sample chamber 2 ; and setting condition changing means (controller 30 ) for changing a setting condition for the interference optical system based on the accessory information read by the accessory information reading means 22 , the setting condition varying depending on, e.g., a difference in weight between respective accessories 20.

First claim

The invention claimed is:

1. A Fourier transform infrared spectrophotometer comprising:
a) a sample chamber,
b) an accessory detachably installed in the sample chamber to which accessory information representing a type of the accessory is provided,
c) an interference optical system,
d) a common base on which the sample chamber and the interference optical system are mounted;
e) an accessory information reader for reading the accessory information when the accessory is mounted in the sample chamber; and
f) a setting condition changer having a parameter table for changing a setting condition for the interference optical system depending on the accessory based on the accessory information read by the accessory information reader.

2. The Fourier transform infrared spectrophotometer according to claim 1 , wherein the setting condition is a parameter for adjusting a direction of a fixed mirror relative to a moving mirror in the interference optical system in which infrared light is divided into two light beams, one of the light beams is reflected by the fixed mirror and the other light beam is reflected by the moving mirror, and the two reflected light beams are then made to interfere with each other.

3. The Fourier transform infrared spectrophotometer according to claim 2 , wherein the setting condition is a parameter for setting a luminance of a light source of infrared light to be cast to the sample.

4. The Fourier transform infrared spectrophotometer according to claim 1 , wherein the setting condition is a parameter for setting a luminance of a light source of infrared light to be cast to the sample.

Assignees

• Shimadzu Corp

Inventors

• Fukuda Hisato

Classifications

• G01N2021/3595

  using FTIR · CPC title

• G01N21/35

  using infrared light (G01N21/39 takes precedence) · CPC title

• G01J3/4535 Primary

  Devices with moving mirror (G01J3/4532 takes precedence) · CPC title

• G01J3/0289

  Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking · CPC title

• G01J3/0275

  making use of sensor-related data, e.g. for identification of sensor parts or optical elements · CPC title