Dielectric, capacitor, electrical circuit, circuit board, and apparatus
US-2024047137-A1 · Feb 8, 2024 · US
US9455087B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9455087-B2 |
| Application number | US-201514833614-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 24, 2015 |
| Priority date | Sep 12, 2014 |
| Publication date | Sep 27, 2016 |
| Grant date | Sep 27, 2016 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A dielectric film contains as a main component a dielectric composition represented by the general formula (Ba 1-x Ca x ) z (Ti 1-y Zr y )O 3 wherein 0.001≦x≦0.400, 0.001≦y≦0.400, and 0.900≦z<0.995. In an X-ray diffraction pattern of the dielectric composition, the dielectric composition has the relation 0.00°≦2θ c −2θ t <0.20° between (001) plane diffraction peak position 2θ t of a tetragonal structure represented by the general formula and (100) plane diffraction peak position 2θ c of a cubic structure represented by the general formula.
Opening claim text (preview).
What is claimed is: 1. A dielectric film comprising: a dielectric composition as a main component, the dielectric composition being represented by the general formula (Ba 1-x Ca x ) z (Ti 1-y Zr y )O 3 wherein 0.001≦x≦0.400, 0.001≦y≦0.400, and 0.900≦z<0.995, and sub-components V 2 O 5 and at least one or more of MnO and CuO; wherein in an X-ray diffraction pattern of the dielectric composition, the dielectric composition has the relation 0.00°≦2θ c -2θ t <0.20° between (001) plane diffraction peak position 2θ t of a tetragonal structure represented by the general formula and (100) plane diffraction peak position 2θ c of a cubic structure represented by the general formula. 2. The dielectric film according to claim 1 , wherein x and y of the general formula are within the ranges of 0.001≦x≦0.100 and 0.001≦y≦0.100, respectively. 3. The dielectric film according to claim 1 , wherein a total content of MnO and CuO as the sub-components is 0.010 mol to 1.000 mol relative to 100 mol of the main component in the dielectric film, and a content of V 2 O 5 is 0.050 mol to 1.000 mol. 4. A dielectric element comprising: the dielectric film according to claim 1 ; and an electrode. 5. The dielectric film according to claim 2 , wherein a total content of MnO and CuO as the sub-components is 0.010 mol to 1.000 mol relative to 100 mol of the main component in the dielectric film, and a content of V 2 O 5 is 0.050 mol to 1.000 mol. 6. A dielectric element comprising: the dielectric film according to claim 2 ; and an electrode. 7. A dielectric element comprising: the dielectric film according to claim 3 ; and an electrode. 8. A dielectric element comprising: the dielectric film according to claim 5 ; and an electrode.
Metal-oxide dielectrics {(H01G4/085 takes precedence)} · CPC title
based on alkaline earth titanates · CPC title
using combinations of dielectrics from more than one of groups H01G4/02 - H01G4/06 (H01G4/12 takes precedence) · CPC title
Thin- or thick-film capacitors {(thin- or thick-film circuits; capacitors without a potential-jump or surface barrier specially adapted for integrated circuits, details thereof, multistep manufacturing processes therefor)} · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.